Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
-
Product
High Power DC Electronic Load(1250V)
34300E Series(5KW~40KW)
-
34300E Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
-
Product
DC Electronic Loads
-
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
NGI DC Electronic Loads
-
Product
Electronical Load Board 3U VME64x (air cooled)
056-921
-
The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
-
Product
Electronic Ballast Automatic Test Equipment
ATE-1
-
Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
-
Product
Area Scan Sensors
-
The ams family of pipelined global shutter sensors features high frame rates for a wide range of demanding professional and industrial applications. Their resolutions range from VGA up to 50Mpixels. Rolling shutter image sensors feature high 71Mpixel resolution for use in demanding industrial applications.
-
Product
ELM Electronic Load Module
-
Circuit breakers are often overlooked during maintenance of electrical systems in aircraft, or often only verified for open and closed states. To test the true functional purpose of a circuit breaker it requires the application of current in excess of the rated trip value and then measure the time for the breaker to actually trip. This is the only way to verify that a circuit breaker will react as designed if an electrical failure occurs.
-
Product
LED DC Electronic Load Simulator
3340G Series(150W~300W)
-
Each 3340G Series module has its own control and display panel, LED/CC/CR/CV/CP/ Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently,also can be controlled intranet via RS232、Ethernet、USB and GPIB interface.
-
Product
Electronic Pressure Switch (select Pressure Switch)
PSW
-
multi-rotation trimmer and operation display are built in, making setting easy.
-
Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
-
Product
Microscope Photomultiplier Photometers
-
HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
-
Product
Acoustic Microscope
AMI P300
-
The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
-
Product
Raman Microscopes
-
Edinburgh Instruments has been providing high performance instrumentation in the Molecular Spectroscopy market for almost 50 years. Our Raman microscopes continue our commitment to offering the highest quality and sensitivity instruments. For further information on our Raman Microscopes, simply contact our sales team, sales@edinst.com, who will be delighted to help.
-
Product
Electronic Kits & Modules
-
This kit contains everything you need to build, the microcontroller will be programmed with the latest firmware before shipping.
-
Product
DC Electronic Loads
LSG Series
-
*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
-
Product
Electron Backscatter Diffraction (EBSD) Camera
Velocity™
-
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
-
Product
Radar Scan Conversion Package
SoftScan
-
Curtiss-Wright Defense Solutions
This embedded computing radar product portfolio provides ultra-high radar scan-conversion performance using unique graphics processor unit (GPU)-accelerated algorithms. Utilizing the power and performance of today's modern COTS graphics offerings, SoftScan provides unrivalled scan conversion performance with minimal CPU utilization.
-
Product
250 Watt Electronic Load Module
N3303A
Load Module
The Keysight N3303A is a 250 W (0-10A, 0-240V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3303A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3303A can also digitize waveforms.
-
Product
Your Automated Microscope For Live Cell Imaging
ZEISS Celldiscoverer 7
-
Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
-
Product
Programmable DC Electronic Load
-
Programmable DC electronic load is a device that precisely regulates the load voltage and current dissipation power consumption of electrical energy. There are several important parameters to consider when choosing programmable DC electronic load, including maximum power, maximum current, maximum voltage, current slope, and so on. Each indicator is related to the needs and applications we actually test.
-
Product
Electronic Speed Controller
AFI-ESC1220
-
The AFI-ESC1220 is an Electronic Speed Controller designed to drive BLDC motors. It meets the industrial requirements of high power and high voltage application for electronic vehicles, airplanes, boats and medium duty industrial machinery. It is rated at 24KW.
-
Product
Inverted Raman Microscope
XploRA INV
-
The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
-
Product
Boundary Scan Test
-
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
-
Product
Differential Scanning Calorimeters
MicroCal DSC Range
-
The "Gold Standard" for structural stability analysis of biotherapeutics, biological macromolecules and polymers in solution. Are microcalorimeters are powerful tools which enable characterization of the thermal stability of proteins and other biomolecules, primarily for biopharmaceutical development and manufacture. They are used for general stability studies, for biosimilarity and batch-to-batch comparability assessment, and for the optimization of purification and manufacturing conditions. MicroCal PEAQ-DSC systems are simple to use, requiring little assay development, and no labelling or immobilization.
-
Product
Precision Electronic Auto Collimator
TriAngle®
-
The new Electronic Autocollimator series of TRIOPTICS integrates a high resolution CCDsensor and is compatible with all TRIOPTICS objective tubes. The compatibility with objective tubes of different focal lengths leads to a variable measuring range and accuracy performance. In this way the TriAngle® series responds optimally to different customer requirements and can cover a large range of applications.
-
Product
Fabry-Perot Based Scanning Filter
-
This new type Fabry-Perot Based Scanning Filter (FPSF) is based on Optoplex proprietary fiber optical Fabry-Perot Etalon technology. It offers F-P based scanning filter with central wavelength at 1060nm, 1310nm, 1550nm or other customized wavelength. It can be tuned manually or automatically by scanning over a wide spectral range from 10nm to 100nm with bandwidth from 0.05nm to 1.0nm. FPSF features less than 3dB insertion loss and as high as 1kHz scanning frequency. Its unique high reliability and low insertion loss design presents the most cost-effective solution for OEM application from telecommunication to fiber sensing interrogation.
-
Product
Electronic Calibration Module, DC To 9 GHz, 2-Port
N7552A
-
Reduce your calibration time by half with a smaller, lighter 2-port module that supports 3.5 mm or type-N 50 Ω connectors
-
Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
-
Product
Stereo Zoom Trinocular Microscope
SPZV-50E
-
SPZV-50E Stereo Zoom Trinocular Microscope 6.7x to 50x, max 200x with optional lenses on stand PLED with 60 eco friendly LED lights with dimmer. Attach any C or C/S mount camera to the trinocular port to view images on a monitor. Focus mount has coarse and fine focusing for precise control. Large 200 x 284mm base. Compact footprint helps save bench space. ESD Safe coating protects sensitive components from electrostatic discharge.
-
Product
Inspection Microscope
Z-NIR
-
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.





























