Electron Microscope Analyzer

QUANTAX EDS for SEM - Bruker microCT (SKYSCAN)

Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.

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Electron Microscope Analyzers

Bruker microCT

Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.

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Electron Microscope Analyzer

QUANTAX EBSD - Bruker microCT

QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM

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Electron Microscope Analyzer

QUANTAX EDS for TEM - Bruker microCT

Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type

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Electron Microscope Analyzer

QUANTAX FlatQUAD - Bruker microCT

QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.

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Electron Microscope Analyzer

QUANTAX WDS - Bruker microCT

The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.

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Electron Microscope Analyzer

QUANTAX Micro-XRF - Bruker microCT

Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).

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