Showing results: 4771 - 4785 of 7331 items found.
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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HDM Series -
Park Systems Corp.
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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MicroCam™ -
NOVACAM Technologies, Inc.
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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ZEISS ROTOS -
Carl Zeiss AG
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Dektak® -
Bruker Nano Surfaces
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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413 Series -
Frontier Semiconductor, Inc,
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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7062 -
Elcometer Limited
In protective coating applications there is a requirement to measure surface roughness. With 31 surface parameter settings available the Elcometer 7062 surface roughness tester can display all parameters that comply to National & International Standards.These values include peak-to-valley profile measurement in combination with an assessment of the frequency of peaks within the sample area.The Elcometer 7062 surface roughess tester is a light weight and portable measuring solution for the range of surface roughness measurements required for compliance to International Standards.The unit is also suitable for assessing surface roughness conditions in a wide range of general industrial applications; particularly where the sample is too large to bring to the laboratory.
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Auto SE -
HORIBA, Ltd.
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Filmetrics, Inc.
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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µsurf -
NanoFocus, Inc.
The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
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Park Systems Corp.
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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Carl Zeiss AG
The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both. The contact-free linear drive makes these machines highly efficient and low-maintenance.
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MPT1000 -
QES Mechatronic Sdn Bhd
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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InfiniteFocusSL -
Alicona Imaging GmbH
With the InfiniteFocusSL you are able to measure form and roughness of your components with only one system. In addition, color images with high contrast and depth of focus are achieved. The robust frame and the intelligent illumination technology provide fast and high-resolution measurement in the laboratory and a production near environment. The measurement system is particularly attractive due to its cost effectiveness, measurement speed and usability. The long working distance in combination with the above average measurement field allows a wide range of applications. Measurements are achieved within seconds, and features, such as a coaxial laser for quick and easy focusing, enhance its usability.
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VideoCheck® HA -
Werth Inc.
Fixed bridge CMM for highest precision and flexibilityIntegrated Werth Zoom® provides advanced capabilities for automatic measurement even for workpieces with minimal contrastIntegration of additional sensor units to a multisensor system guarantees higher flexibility and measuring speedModular structure guarantees customized solutions for individual applicationsOptional integration of a high precision air bearing rotary / rotary tilt axis