Showing results: 4681 - 4695 of 7331 items found.
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Duma Optronics LTD
Many new generation lasers, having a spectrum which is out of the sensitivity response of typical camera detectors require different technologies to be ex-amined. Tomographic knife-edge technology offers a feasible solution. Multiple knife-edges scanning from different directions provide beam profiles depen-dent on scanning angle. By reconstruction techniques used in tomography, an image-like profile can be reconstructed and analyzed. Various detectors are used to provide a wide spectral range measurement capability
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Duma Optronics LTD
A complete line of laser beam positioning, measuring accurately down to fractions of a micron, wherein lower resolution allows measurements over wide areas up to 100 mm.
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Duma Optronics LTD
A complete line of laser beam analysis solutions, based on our line of Beam Profiling, combined with our proprietary technology of air-cooled beam sampling, enabling measurements of powers of over 4 kWatts.
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PXD731x/70xx -
VX Instruments GmbH
Digitize high-resolution waveforms with the fully isolated PXD Series digitizers. Minimize interference and measure "in-circuit" within circuits. Measurement errors are reduced by a high input impedance.
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PXS(e)840x -
VX Instruments GmbH
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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PX773x -
VX Instruments GmbH
The PX773x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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PXS840x -
VX Instruments GmbH
The PXS(e)840x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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JFW Industries
In circuits are used to lower voltage, dissipate power, and to improve impedance matching. In measuring signals, attenuator pads or adapters are used to lower the amplitude of the signal a known amount to enable measurements, or to protect the measuring device from signal levels that might damage it.
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DAQ -
ADLINK Technology Inc.
From entry-level to high-end, data acquisition to digital input/output, ADLINK provides a diversity of modular instruments with market-leading price/performance ratio, for bigger and better measurement and automation systems. Now high-speed digitizer, switching, simultaneous data acquisition, high-density multi-function data acquisition, analog output, digital multimeter, and arbitrary waveform generator categories are all available.
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Supracon AG
In the measurement setup of SQUID electronics (detector variant), the dc SQUID amplifies the small amplitude signals of the detector with a large bandwidth so that they can be further processed with conventional AD converters.
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UVP-365 -
SAN-EI ELECTRIC CO.,LTD.
This is the standard measurement instrument to measure absolute UV vaiue. All SAN-EI's UV light source fixtures are measured by this meter.
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UVM-MP -
SAN-EI ELECTRIC CO.,LTD.
Measurement of maximum of 6 points is possible. By use of thee sensor amplifier box, distance between the light receiving inlet and the controller can be extended to 10 meters. Measurement start signals can be independently output by remote control. This is useful for the light source fixtures integrating shutter mechanism.
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TAC1000 -
Rhesca Co., Ltd.
For the measurement of tackiness (instantaneous adhesive strength) of various pastes and adhesive tapes, it is possible to quantitatively evaluate the data, which until now had large errors due to individual differences. First, press the measuring probe, which is controlled (approach speed, pressure force, pressure time, separation speed) against the sample, and measure the adhesive force in the process of separating. Measured data can be processed by a computer. With double temperature control (patented), the sample piece is preheated from the back side with a hot plate and the heated probe penetrates the measurement surface, making it possible to keep the set temperature and the temperature of the test surface to be evaluated constant. Since the pressurization time can be as short as 10msec, it is possible to measure the tackiness caused by momentary contact.