Showing results: 4081 - 4095 of 7331 items found.
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Partica Centrifuge CN-300 -
HORIBA, Ltd.
With a measurement range of 10 nm - 40 μm, the Partica CENTRIFUGE CN-300 applies centrifugal force of up to 30,000g and uses temperature control to produce accurate measurement results for a variety of samples.Developed based on customer feedback and improving upon existing and new HORIBA technologies, the result is an analyzer that provides safe and reliable operation while also being easy to use.
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PG-350 P-AMS -
HORIBA, Ltd.
For situations when you can only take measurements in the field, but you want the same precision that you get in the laboratory: HORIBA presents the Portable Automated Measuring System - PG-350 P-AMS.The HORIBA PG-350 P-AMS offers the same accuracy and reliability of laboratorymeasurements in a portable and durable unit, that is light and has a faster response time.With a shortened warm up time, a high visibility touch screen, high accuracy in measuring crucial components in the field and the durability to facilitate mobile measurement, the HORIBA PG-350 P-AMS is the analyzer system of the future.
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PM-960 -
HORIBA, Ltd.
A measurement device for continuous measurement of the concentration of peracetic acid used for sterilization in food and beverage processing. The device uses no reagents and is maintenance-free.
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Smart SE -
HORIBA, Ltd.
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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SmartSPM -
HORIBA, Ltd.
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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VA-5000 / VA-5000WM Series -
HORIBA, Ltd.
The Multi-Component Gas Analyzer VA-5000 Series is an all-round analyzer that satisfies measurement needs as required for environmental monitoring, energy development support, quality controls, and continuous emission monitoring, etc. The VA-5000 Analyzer can be configured with up to 4 detector modules within a single case. Many combinations of detector modules with a wide selection of ranges allows this series of analyzers to be used for a variety of applications. The VS-5000 Sample Gas Conditioning Systems are designed to support the VA-5000 Analyzers by proving the optimal sample conditions for measurement. We also have wall mounted type analyzer (VA-5000WM) that enables to install in a limitted installation space.
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VG-200S -
HORIBA, Ltd.
Absolute pressure measurement is crucial for most of vacuum processes in various industries including Semiconductor, FPD, HDD, PV and Coating. A capacitance manometer determines the total pressure from the deformation of the diaphragm that occurs when a pressure difference is applied to both side of the diaphragm.
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DSO6082BE -
TOMSAD
The oscilloscope has a very wide range of time base, so that allows you to work as a logger voltage, where one measurement is made even 1 hour. Digital Oscilloscope Hantek with software that has many useful features ranging from auto measurement and ending with thespectrum analysis.
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infraTest Prüftechnik GmbH
The device consists of a sturdy frame with step motor drive, which moves the water box with the Scherbüchsenunterteil. For the measurement of shear force, shear path and settlement electronic transducers are provided. The device control with measurement data acquisition takes place via PC with software PROPRESS.
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infraTest Prüftechnik GmbH
Consisting of 2 incremental displacement transducers 25 x 0.01 mm (measurement of volume change over path) with interface for connecting the displacement transducers with RS 232 C interface for PC, complete with Windows software with real-time display of uplift over time including trial database and option for log output.
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infraTest Prüftechnik GmbH
Sturdy sheet steel housing with safety door and electrically driven base with built-on sample mold. The compaction takes place via a rolling segment with force / path-controlled drive device from above. The sample mold and the rolling segment are equipped with software controlled heating. The measurement of force and displacement is done by electronic sensors. The entire compaction process is controlled with Windows software and PC via preselected sequence programs.
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Studio Platform -
Akrometrix, llc
Akrometrix Studio is an advanced set of integrated software modules that work together to run all Akrometrix equipment. The Studio software suite takes users from profile creation, through warpage measurement, temperature profiling, analysis of warpage data, and reporting seamlessly. Studio software users will have nearly the same experience in working with different Akrometrix measurement technologies and different Akrometrix measurement tools.
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PS200S -
Akrometrix, llc
The TherMoir PS200S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoir PS200S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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TableTop Shadow Moiré (TTSM) -
Akrometrix, llc
Measure warpage of substrates up to 300mm x 310 mm (a 300mm wafer or two JEDEC trays) with the entire measurement taking less than two seconds. Whether individual parts or a JEDEC tray of multiple parts, the TTSM provides an ultra-fast and highly accurate measurement at room temperature that is suited for tabletop use.
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Part Tracking -
Akrometrix, llc
Part Tracking technology is a software application included in Akrometrix Surface Measurement that increases system throughput while reducing user to user and system to system measurement variation. Part Tracking uses edge recognition technology to locate a part in space and automatically crop/rotate the sample for processing of the found surface area.
