Radar Test
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Product
Radar Test System
UTP 5065
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Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
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Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Monolithic Microwave Integrated Circuit (MMIC) Amplifiers & Switches
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Microsemi's portfolio of MMIC products targets a broad range of applications including those in electronic warfare, radars, instrumentation (test and measurement) and microwave communications. The portfolio comprises broadband amplifiers (both power and low-noise), amplifier modules, prescalers, attenuators and switches spanning DC to 65GHz based on high-performance process technologies. Microsemi offers 18 distributed amplifier products including industry-leading DC-65GHz MMICs. Microsemi's prescalers combine higher frequency operation, the flexibility to divide by a large number of ratios and very good residual phase noise.
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Product
Sub-systems
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Our self-contained, in-house components design and fabrication capacities ensure the breadth of sub-assemblies offered from rapid prototyping and proof of concept to full production. Ducommun has produced many high performance millimeterwave band sub-assemblies for commercial and military system applications. Among them, the K and Ka band directional Doppler Radar front ends are in production. Several hundreds of sets have been delivered. In addition, Ducommun has delivered Ka through W band engineering prototypes for plasma detection system, automotive Radar, speed Radar, automatic test set, radio telescope, missile terminal guidance, telecommunication system etc. applications.
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Product
PXI Vector Signal Analyzer
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PXI Vector Signal Analyzers feature a wide frequency range, real-time signal analysis, and advanced signal processing. PXI Vector Signal Analyzers can perform measurements for a broad range of wireless technologies such as GSM, EDGE, WCDMA, LTE-Advance Pro, 5G, Wireless LAN, and Bluetooth. Select models also feature a LabVIEW-programmable FPGA that you can customize for advanced measurement applications. PXI Vector Signal Analyzers are ideal for microwave test, wireless test, RADAR test, spectral monitoring, software-defined radio (SDR), radio monitoring, interference detection, signal intelligence, and other applications.
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Product
Radar Altimieter Test Panel for ALT-50/55
TA-55
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Radar altimeter panel designed after the ALT-50A test fixture. (Ref. Fig. 5-1). Panel allows testing of the indicator or R/T independently or together. An internal power supply is provided to support stand alone testing of the indicator. This panel contains a 4 digit DVM and comes with enclosure. This panel will allow by the book testing.
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Product
Microwave Power Amplifiers
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Spanawave/Giga-tronics Microwave Power Amplifiers deliver outstanding performance and exceptional value. These ultra-broadband amplifiers have excellent pulse performance and modulated signal fidelity, ideal for testing in wireless communications, defense EW and radar testing and general purpose microwave laboratory applications. Have the power you need to overcome cable and switching losses, or to drive higher power mixers, detectors and very high power amplifiers.
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Product
Doppler Radar Target Simulators
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Automotive radar sensors play a vital role in the current development of autonomous driving. Their ability to detect objects even under adverse conditions makes them indispensable for environment-sensing tasks in autonomous vehicles. As their functional operation must be validated in-place, a fully integrated test system is required. Radar Target Simulators (RTS) are capable of executing end-of-line, over-the-air validation tests by looping back a received and afterward modified radar signal and have been incorporated into existing Vehicle-in-the-Loop (ViL) test beds before. However, the currently available ViL test beds and the RTS systems that they consist of lack the ability to generate authentic radar echoes with respect to their complexity. The paper at hand reviews the current development stage of the research as well as commercial ViL and RTS systems. Furthermore, the concept and implementation of a new test setup for the rapid prototyping and validation of ADAS functions is presented. This represents the first-ever integrated radar validation test system to comprise multiple angle-resolved radar target channels, each capable of generating multiple radar echoes. A measurement campaign that supports this claim has been conducted.
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Product
Antenna Test Chamber for Automotive Radar
ATS1500C
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The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Product
Arbitrary Waveform Generators
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Helps you to generate with confidence waveforms of almost any imaginable shape: complex signals like digital modulations, RF stimuli for functional and performance tests, radar simulation, optical communication and electronic warfare can be created through an easy to use interface.
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Product
Radar Target Repeater
Series 8000
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The Eastern OptX Series 8000 Radar Target Repeater is a portable, variable delay and propagation loss system designed for radar testing and alignment. The repeater may be remotely programmed in the field for dynamic operation. When connected to a user specified antenna the repeater can provide delays of up to 500 usec with a fixed delay, multiple discrete delays, or a progressive variable delay with amplitude control The Series 8000 features ultra wide bandwidth, low loss, high isolation, low noise figure, and high dynamic range.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-03
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Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-02
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Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Component Test Systems
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These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
OLED Lifetime Test System
58131
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The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Test Platforms
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Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Benchtop Automated Functional Test
midUTS
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Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
SMD Array Type LCR Test Fixture
16034H
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The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
In-Circuit Test System
TestStation LX
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TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
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Stopper kit includedYAVCANCON2 for fixture identification not included
