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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
10 Gb/s SFP/SFP+ Evaluation Board
EV-SFP-171
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The purpose of this SFP+ evaluation board is to provide the designer with a convenient means for evaluating SFP+ fiber optic transceiver such as 10 Gb/s(up to 16 Gb/s) SFP/SFP+ transceiver compliant with ANSI Fibre Channel FC‐PI‐5 for high speed electrical and optical specifications. This board provides SMA connectors for high speed TX and RX signals. The low speed control signals such as Tx_Fault, Rx_LOS and Rate_Selects can be controlled by using on board switches and test points. A connector for 2 wire serial interface to the module is also provided.
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Product
Voyager Intermittent Fault Detector
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The Voyager includes a spread spectrum TDR so that the fault can be located. Once an intermittent is detected, the TDR is immediately connected to the failed test point and used to determine the distance to the fault.
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Product
TRUE Z-AXIS CAM ACTIVATED TEST FIXTURE KITS
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The Cam Press is designed to provide precise, bed-of-nails contact, in a production test environment. Durable aluminum and steel construction and precision bearings insure accuracy and repeatability sufficient to contact test points as close as 10-mils center-to-center.
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Product
Voltage Indicators
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*Measures voltage from 100V to 138kV line‑to‑line.*Can be used individually as voltage indicators or together for phasing operations up to 100 ft (30 m) apart.*Two LED displays are automatically synchronized during phasing operations.*Clear in-phase and out-of-phase indication.*Versatile for overhead and underground applications.*Capacitive Test Point and Peak Hold modes
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Product
Mechanical Fixtures Available w/ESD Plates & ESD Pressure Pins
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H+W Test Products has developed a series of inexpensive mechanical test fixtures. These fixtures are designed for testing low volume runs of printed circuit boards or prototype applications requiring approximately 150 test points.
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Product
25 Pin Breakout Interface
VSI-Breakout-25
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The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Product
Basic Contact Probe F07505B120G280
1010962
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F07505B120G280 (item number 1010962) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 05 (Concave stepped), F07505B120G280 combines ICT/FCT use with a geometry intended for pins and wire-wrap posts with a guided, smooth contacting action. F07505B120G280 combines a pitch of 1.9 mm / 75 mil with tip style 05 (Concave stepped) and a tip diameter of 1.2 mm. For F07505B120G280, spring force is 280 cN at a nominal travel of 4.3 mm. The electrical rating of F07505B120G280 combines 4 A continuous current with 20 mΩ typical contact resistance. The plunger in F07505B120G280 is made of beryllium copper and is gold-plated.
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Product
Time Domain Replication (Road Load Simulation)
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The powerful graphical editor makes it easy to review and compile your field sample data for use in the test lab. The point editor, filters, velocity and displacement compensation ensure the test feasibility is evaluated at an early stage. The continuous closed-loop controller then replicates the test files with very high levels of precision. The control algorithms use a continuous coherence averaging technique to ensure a stable proactive control loop that will not only provide accurate replication but will also respond to changes in test item dynamics.
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Product
Hipot Tester
NX Hipot+
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50 to 1500VDC Hipot Testing, 50 to 1000VAC (optional), Expandable to 1024 test points, 5Mohm to 1Gohm Insulation Resistance, Simple 4-button user interface, Tests for continuity and shorts, Tests a variety of components, Precision resistance measurements, Continuous high speed scanning for real time complete status information of harness assembly progress, Keyed security access and control, Built for rough industrial environments, 2 serial ports for connection to printers and scanners, Standalone operation, Uses a high capacity memory card, Available from 64 to 1024 test points, Networkable
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Product
Breakout Box
T1000-15
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T1000-15 breakout box with dual 15 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 30 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity. Ideal for continuity measurements, isolation testing, and signal capture.
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Product
Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
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The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Product
Miniature Surface Mount Test Points
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Compatible with vacuum and mechanical pick and place assembly systems
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Product
Debug Fixture
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With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
Tensile Strength Machine
UI-1100
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Tensile Strength Machine, also known as Tensile Strength Tester, Universal Testing Machine (UTM), is used to do tensile, peel, shear, bend, and other tests of materials. Universal Testing Machine can do plenty tests like sole/upper bond test ISO 20344, velcro strength test (peel and shear strength) ISO 22776,zipper strength test ASTM D2061, rubber tensile test, 3 point bending test and etc.
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Product
Basic Contact Probe F05079B050G150
1166650
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F05079B050G150 (item number 1166650) belongs to the Basic Contact Probe range for precise, repeatable contacting of electronic test points. F05079B050G150 belongs to the basic probe range for ICT/FCT, where tip geometry, spring force and surface finish are matched to the target test point. F05079B050G150 combines a pitch of 1.27 mm / 50 mil with tip style 79 (6-point crown flattened) and a tip diameter of 0.5 mm. F05079B050G150 operates with 150 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F05079B050G150 is 3 A.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Stand Alone Low Voltage Tester
Model 256/PC
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Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Custom Test System Solutions
Test System
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
