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Low Voltage Cable Tester
1100R+
The 1100R+ bench top cable tester packs impressive capabilities into a package that is small, affordable, and intuitive. The large display and sensible button interface make cable testing quick and easy. Test Point Range: 128-1024, Test Voltage: 5VDC 6mA max current.
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MTA Wiring Analyzer
2650
DIT-MCO's newest test solution, the Model 2650, incorporates modularity so that the system conforms to your testing needs. The modular switching units can rack-and-stack in a cabinet providing concentrated test points or can be distributed around the Unit Under Test (UUT) eliminating long, cumbersome adapter cables. Or you may reconfigure the system at any time when your needs or the UUT changes.
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Diagnostics & Testing Equipment
Parker offers an array of diagnostic and test solutions for measuring hydraulic and pneumatic data and for troubleshooting operational problems. These include analog and digital flow and pressure meters and viscometers as well as associated devices such as sensors, vacuum and pressure controllers, quick couplings, and test point connectors.
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Testability analysis
Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Terminals And Test Points
Today's high tech electronics require space saving, low cost methods for connecting and testing circuitry. Our complete line of Quick Fit terminals, Screw Terminals, Solder Lugs and Test Points and Jumpers are designed to meet the interconnect and testing challenges for electronic and electrical component termination points.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Specialized Extender Card Testing IP Modules
IP-Debug-Bus
IP-Debug-Bus is a specialized extender card which is optimized for testing IP Modules. The bus signals are all accessible via test points. The testpoints include multiple ground locations and .025 sq. posts for ease of connection to your logic analyzer or scope. The testpoints are labeled for easy identification
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48" Stacking Banana Plug Test Leads
146-P
These test leads feature stacking banana plug jacks, with extended 48" length. These are great for establishing connections to diagnostic test points, while allowing the connection to be tapped with other instruments...2 way connections. These feature high flexibility wire and standard 4mm size banana jacks. You will receive one red test lead and one black test lead. These test leads are compatible with Electronic Specialties 146 and 147 test lead kits.
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Fixture and Software for Open/Leak Inspection
In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC-READ provides specialized software for test point selection and log analysis.
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Optical Node
Sichuan Jiuzhou Electronic Technology Co.,Ltd
* Philips CGD914 amplifier module that employs both GaAs and Si dies.* 4 outputs, output level ≥100dBμV when optical input at -1dBm.* Plug-in fixed attenuator, fixed equalizer.* Optical power indication for -7 ~ 0dBm.* FP laser or DFB laser for return path.* RF test point for forward path and return path.* Optional SNMP responser unit supporting JIUZHOU HFC Net Managing software.* AC 60V or AC 220V power supply.* Aluminum die-casting housing.
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Testers for Aerospace and Railway
Testers for the realization of a network with base unit and distributed test point units (TPUs).
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High Voltage Differential Probes
A high voltage differential probe is used for measuring the voltage difference between two test points where neither test point is at ground. High voltage differential probes from Tektronix can be used for signals up to 6000 V. These probes are the best choice for making non-ground referenced, floating or isolated measurements in large part due to their common mode rejection capability. These products are designed, manufactured, and serviced by Tektronix.
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Silver Plated Test Points
The fabricators of SMT printed circuit boards may take advantage of the convenience of field testing with the unique loop design of Components Corporation's TP-107 and TP-108 series of surface mounted, printed circuit test points is now available in silver-plate for outstanding reliability. All products are RoHS and REACH compliant.
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Multiplexers
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
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Test Sets For Transformer Industries
Contemporary Test Sets For Transformer Industries are developed to recognize the potentially disastrous current transformer errors. They prevent the primary current from overpowering insulation and short circuits. They are used for developing a testing and maintenance plan for addressing the errors before any failure to save money and time. With these powerful test sets, they are sure to perform saturation testing to test the knee point of a signal by comparing primary and secondary windings.
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Drive-Thru Feature, GTE 10.00p
K8218B
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
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SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-34
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Phasing Voltmeter/Sensor (2 in 1)
STB Electrical Test Equipment, Inc
STB unit replaces 3 separate units manufactured by competitors - line phasing, capacitance phasing and line to ground Versatile, lightweight and easy to useEach portable meter has a single rangeMeter usage: Voltage detection and phasing at capacitance test points or voltage detection and phasing on bare energized conductors (overhead & underground)Probes can be separated to be used as a voltage sensor or capacitance sensorFive position selector.
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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CAM/TRAC Test Kits
Series 43
The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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3-Axis Motion Simulators
When a device under test needs to be stimulated with simultaneous movements around three axes, then a product from the ACUTRONIC three-axis motion simulator range is the right choice. Independent motion simulation in three axes makes them very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Tensile Strength Machine
UI-1100
Tensile Strength Machine, also known as Tensile Strength Tester, Universal Testing Machine (UTM), is used to do tensile, peel, shear, bend, and other tests of materials. Universal Testing Machine can do plenty tests like sole/upper bond test ISO 20344, velcro strength test (peel and shear strength) ISO 22776,zipper strength test ASTM D2061, rubber tensile test, 3 point bending test and etc.
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Stand Alone Low Voltage Tester
Model 64×2
Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
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PCB Test Points
Test Socket 2mm. Plug 2mm. Measuring Socket 2mm . 2 Pin Test Socket 2mm. Miniature Test Socket 2mm
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Hipot Tester
NX Hipot+
50 to 1500VDC Hipot Testing, 50 to 1000VAC (optional), Expandable to 1024 test points, 5Mohm to 1Gohm Insulation Resistance, Simple 4-button user interface, Tests for continuity and shorts, Tests a variety of components, Precision resistance measurements, Continuous high speed scanning for real time complete status information of harness assembly progress, Keyed security access and control, Built for rough industrial environments, 2 serial ports for connection to printers and scanners, Standalone operation, Uses a high capacity memory card, Available from 64 to 1024 test points, Networkable
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DIOS (Digital I/O Scan Module)
JT 2122/MPV
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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Automotive Production Board Test
Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.
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100 Pin Breakout Interface
VSI-Breakout-100
The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-33
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
