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High-Speed Data Acquisition System
TMX-18
With the TMX-18, there's no need to fumble with awkward buttons or knobs and complicated configurations! The TMX-18 features a high resolution, 17" touch screen display, as well as pre-defined set up options, making test setup a breeze! With the TMX-18, you will be up and running in no time!
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Broadcast Control and Monitoring System
Cerebrum
As a complete Broadcast Control System (BCS), Cerebrum gives you control over your most critical broadcast operations. Accessible via one application, the system’s powerful and highly customizable interfaces allow you to control, configure and monitor any broadcast environment the way you want. Cerebrum is designed to be robust in both small to large infrastructures and adapted for SDI and IP, offering you a scalable solution that is ready for today’s and tomorrow’s operations.
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Manual & Automatic Inspection systems
Manual and Automatic inspection systems mounted on vehicles such as motortruck, van, railway testing wagons etc. Operation is either on the move or during a stop. Ideal for inspecting transmission and distribution lines and for electric transportation.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type L, Ø1.50mm, 305gf
K100-L150305-SKAU
K100 Series, Pitch 100mil, Tip Style L, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Application Specific LC System
Reducing Sugar Analysis System
The Nexera reducing sugar analysis system uses Shimadzu’s unique post-column boric acid-arginine fluorescence derivatization method. Unlike the refractive index detectors and evaporative light scattering detectors (ELSD) commonly used for sugar analysis, this system reduces the effects of impurities and offers both high sensitivity and a wide dynamic range. As a result, sugars contained in samples can be analyzed simultaneously, without dilution even when there are significant concentration differences.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Customaizable Uninterrupted Power System
CT Series
The rugged CT Series is designed for applications in extreme temperature environments, such as offshore drilling rigs, refineries and shipboard use. An added benefit is that the CT Series can double as an electronic power conditioner/frequency converter as well. All CT systems utilize Power Factor Correction, and RS232 and SNMP protocols are supported.
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Electrodynamic Vibration Generator System
LVD-100KG
• Vibration table size: 500*500mm (Other size can be designed) • Vibration: 0~5mm (Adjustable range P-P). Vibration waveform: sine wave (half wave and full wave). Acceleration speed: 0~20g (Adjustable) • Maximum test load Capacity: 100kg • Accuracy: Frequency can be displayed to 0.01 Hz. Precision 0.1 Hz. • Sweep Frequency function (1~600Hz): (Upper frequency, Lower frequency, Time range) It can set real standard arbitrarily to sweep frequency back and forth • Programmable Function (1~600Hz): It can set each segment in 15 segments arbitrarily (frequency/amplitude/time/acceleration), and it can be recycled • Frequency doubling function (1~600Hz): 15 segments multiplied-increase: 1)Low to high frequency 2)High to low frequency 3)Low to high and then to low frequency, it can be recycled • Logarithmic function (1~600Hz), 3 modes of logarithm/can be recycled: 1)Lower to upper frequency 2)Upper to lower frequency 3)Lower to upper and then to lower frequency • Measuring instrument: To display amplitude, acceleration speed and the maximum acceleration speed.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 155gf
K100-C150155-SKAU
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Miniature Humidity and Temperature Data Logger
MicroRHTemp
The MicroRHTemp is a battery powered, stand alone humidity and temperature data logger that can fit in the tightest places. It is even small enough to fit into most pill bottles. It features an LED alarm indicator that alerts when user-chosen temperature limits are exceeded.
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DC Systems
DC system modules provide analysis capabilities for engineers to design and maintain direct current electrical networks.
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Yield Management Systems And Solutions
Cantrell•Gainco's yield management systems are designed to give you the best tools to know exactly what’s happening on your processing line so that corrective actions can be taken in real-time – not hours or days later.
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Automatic System Function Tester
3260
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Laser Diode Characterization Systems
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Time & Frequency System
TM-4M
The TM-4M Time & Frequency System features a larger, easier to use form-factor. It was designed for mobile applications that require uninterruptible power, and for applications that require multiple front panel connections. The six BNC jacks on the front panel are user-assignable to output any signal the user chooses.
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External Double Way Temperature Datalogger
VA602-TK-TJ
Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD
Two tunnel data logger with voltage current temperature (thermocouple) K.J.PT type, with USB, up to 16000 data record point.
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Reflex Reflector Measurement Systems
Photometric Solutions International Pty Ltd
The measurement setup involves using a projector to illuminate the test item, and then measuring the luminous intensity of the light reflected from the test item. The ratio of the luminous intensity emitted by the reflector (in candelas) to the illuminance on the reflector (in lux) is the coefficient of luminous intensity or CIL (cd/lx).
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Health Physics Systems
Detection and quantification of radioactive material within the body is a key factor in determining internal personnel contamination and dose assessment. These measurements can be made on body fluid samples using lab instrumentation or through direct measurement of personnel. The measurement of body fluids is generally less attractive due to the bio-hazards and lack of immediate results unless non-gamma emitting nuclide measurements are required. The direct measurement of personnel for gamma emitting radioactive material provides rapid results, can determine where the material may be located within the body, and does not require mobility of the material through body fluids for detection.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Ceramics and Glass Inspection Systems
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Automatic Power Control system
The Automatic Power Control system cuts the incoming power supply to a traction unit for short periods. This is required where power supplied from one part of a power distribution system in separated from another by a neutral section. Its fitment prevents damage to the power distribution system or the vehicle.
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Vacuum Handling Systems
RECIF Technologies history started in 1982 offering its first wafer handling solution: Vacuum handling Systems.Based on this historical technical mastery, Recif Technologies provides today a full range of single wafer manual vacuum handling solutions adapted to our customers’ and current Semiconductor industry’s’ requirements.
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Automatic Transformer Test System
TH2829LX
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Universal II Level System
The Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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DUV Lithography Systems
ASML's deep ultraviolet (DUV) lithography systems dive deep into the UV spectrum to print the tiny features that form the basis of the microchip.
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Pin-Pointing System
Protrac®
BAUR Prüf- und Messtechnik GmbH
Fast and precise cable fault pin-pointing with protrac The BAUR protrac pin-pointing system is used for the precise pin-pointing ofcable and cable sheath faults. Combining acoustic and electromagnetic faultpin-pointing with sheath fault location in one system, it is ideal for universal application.* Unique operating convenience thanks to wireless Bluetooth® connections* Precise 3D user guidance to the fault* Excellent acoustic quality and range* Saves time thanks to use of cable route data and the pre-located fault position from the BAUR Fault Location App
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Dynamic Component Test Systems
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
