Product

Changeable Cassette

230350/1 – CMK-01

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Columbia Elektronik AB

230350/1 – CMK-01 - Columbia Elektronik AB

Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.

Product

The Ultimate Circuit Tester Kit

28640

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Lisle Corp.

28640 - Lisle Corp.

The tester kit tests low voltage up to 28 volts. Also finds electrical shorts, checks polarity, detects battery drain, and checks circuits from a distance. Heavy-duty coil cord extends over 8 feet. Detachable, spring-loaded hook pulls the center of the wire into the probe every time. Attach alligator clip to the probe when a clip-on connection is needed.

Product

Wafer Testing

Trio Vertical

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Nidec SV Probe Pte. Ltd.

Trio Vertical - Nidec SV Probe Pte. Ltd.

SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.

Product

Heavy Duty Circuit Tester with 12' Retractable Wire & Battery Clip

27300

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S & G Tool Aid Corp

27300 - S & G Tool Aid Corp

Features an extra long wire that stretches up to 12 feet for use, then automatically retracts. Quickly and easily check electrical circuits and accessories on 6 and 12 volt systems. Great for use on cars, trucks, boats, trailers, motorcycles, airplanes and snowmobiles. Heavy duty ground clip with insulator. 3 1/4" standard length probe

Product

Constant Distance SECM

VS-STYLUS

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Ametek Scientific Instruments

VS-STYLUS - Ametek Scientific Instruments

In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:

Product

Eddy-Current Sensors

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Lion Precision

Lion Precision

Eddy-Current sensors are noncontact devices capable of high-resolution measurement of the position and/or change of position of any conductive target. Eddy-Current sensors are also called inductive sensors, but generally "eddy current" refers to precision displacement instruments (or nondestructive testing probes) and "inductive" refers to inexpensive proximity switches. High resolution and tolerance of dirty environments make eddy-current sensors indispensable in today's modern industrial operations.

Product

Meter w/ pH Electrode, Conductivity/ATC Probe, Integral Electrode Holder

PC 700

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Eutech Instruments

PC 700 - Eutech Instruments

The multi-parameter Eutech PC 700 measures pH, ORP, conductivity and temperature with a single meter. User-friendly with advanced features and a large custom-size display – perfect for research work on a budget!

Product

Bench-Top Macroscopic Raman Spectrometer

Modular Raman Microscope

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HORIBA, Ltd.

Modular Raman Microscope - HORIBA, Ltd.

HORIBA’s modular Raman spectrometers allow the user to have a flexible Raman system to handle high performance spectroscopy at a price to fit most budgets. The modular microscope can also be used with a range of sampling options, including remote probes. A Raman spectrum recorded with a fiber-coupled Raman microscope of acetaminophen is shown below.

Product

Lab Assistant

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SemiProbe

SemiProbe

The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.

Product

Compressed Air RH+T Transmitter

T3419P-2

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COMET SYSTEM, s.r.o.

T3419P-2 - COMET SYSTEM, s.r.o.

Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.

Product

Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 1000 Units, Max UUT 450x330MM (wxd)

CMK-07

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Columbia Elektronik AB

CMK-07 - Columbia Elektronik AB

Linear click system with ball bearings, using gas springs. 10 mm ESD-proof top cover with aluminum reinforcement bars. Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.

Product

Mini Back Probes/Wire Piercers

618

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Electronic Specialties Inc.

618 - Electronic Specialties Inc.

*Great for backprobing weather pack style connectors used with numerous automotive sensors *Also very handy for piercing and tapping readings on smaller gauge wires - using the included probe adapters *Works with most Test Lead Kits in the field - with standard 4mm banana plug test lead *Set includes four probes - red, black, green, yellow Test probes 21 mm length

Product

Rectal Probe For Small Animals

RET-4

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Physitemp Instruments

RET-4 - Physitemp Instruments

The RET-4 Rectal Probe for very small animals (mice). Flexible polyurethane sheath with smooth rounded tip.

Product

Full Wafer Test System

FOX-1P

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Aehr Test Systems

FOX-1P - Aehr Test Systems

Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.

Product

Dilution-Extractive System

ML675

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Teledyne Monitor Labs

ML675 - Teledyne Monitor Labs

The Teledyne ML®675 dilution-extractive system can be used in 40CFR75, 40CFR60, 40CFR63, and process control applications. In this system, sample is prepared for analysis by diluting stack gas with clean, dry instrument air at the probe location. Since no moisture is removed with dilution, measurements for SO2, NOx, CO, THC and CO2 are made on a wet basis.

Product

Wafer Chucks

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American Probe & Technologies, Inc.

American Probe & Technologies, Inc.

High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,