Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
CP-2XX-12 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 128Full Travel (mm): 3.25Recommended Travel (mil): 118.1Recommended Travel (mm): 3.00Overall Length (mil): 472Overall Length (mm): 12.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Hand-held Thermohygrometer
DHM1000
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High-precision measurement, temperature 0.3,humidity 3%RH Dew point calculation, the value can be queried instantly Ultra-low power consumption, 2 AAA battery lasts 200 days Telescopic probe, effectively protect sensor High resolution LCD display with backlight Small size, light weight, easy to carry
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1L18-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
Standard 1.32 (37.40) - 4.50 (128.00) Battery Probe
CP-2LB-6
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 69Full Travel (mm): 1.75Recommended Travel (mil): 59Recommended Travel (mm): 1.50Overall Length (mil): 236Overall Length (mm): 6.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25T-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
BMP-1-S Board Marker Probe
BMP-1-S
ICT/FCT Probe
Current Rating (Amps): .05Voltage Rating (VDC): 15Recommended Duty Cycle: 1 sec. On (min.), 5 sec. OffTest Center (mil): 1,000Test Center (mm): 25.40Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Rec. Mounting Hole Size (mil): 468Rec. Mounting Hole Size (mm): 11.89Recommended Drill Size: 15/32 (in) or 11.90 mm
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Product
Cantilever Probe Card
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MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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Product
Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Product
Changeable Cassette
230352/1 – CMK-03
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Leak Detectors
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High sensitivity setting locates R134A leaks to 3gm/yearFlexible gooseneck probeEasy one handed operationAudible & visual indicatorsRubber sleeve protects detector & probe
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Product
FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Product
Ultrasonic Thickness Gauge
38DL PLUS
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The 38DL PLUS is an innovative instrument that signals a new era in ultrasonic thickness gauging. Ideally suited for almost every ultrasonic thickness application, this handheld thickness gauge is fully compatible with a full line of dual and single element transducers. The versatile 38DL PLUS can be used in applications ranging from wall thinning measurements of internally corroded pipes with dual element probes to very precise thickness measurements of thin or multilayer materials with single element transducers.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T1-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
T3RC Rogowski Coil Current Probes
T3RC Series
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Teledyne Test Tools Rogowski Current probes offer a broad range of products covering a wide frequency span and current measurement ranges for maximum application coverage whilst being easy to use in difficult to reach parts of the circuit.
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2C40
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35 Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25L36-2
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Compressed Air RH+T+Tdp Sensor
T0211P-2
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Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-H180-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Analog Laser Power Probes
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Laser power measurements should be quick and easy. They should not involve time consuming set-up and alignment problems. Ideally, the measurements should also be able to be made at any point in an optical system where losses are likely to occur. Unfortunately, most laser power meters have sacrificed ease of use to gain continuous power readings.
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Product
Multi-probe for Ammonium and/or Nitrate
S470
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S470 is a complete family of Ion selective electrodes (ISE) probes suitable for monitoring the performance of the ammonium ion (as NH4+ or NH4–N) and nitrate ion (as NO3– or NO3–N) in a liquid matrix.
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Product
AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Product
Probe Positioners (Probe Manipulators)
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PacketMicro offers a broad ranges of probe positioners to allow designers to guide standard oscilloscope/TDR/RF/microwave probes onto the small geometries of fine-pitch interconnects, SMD packages, MCMs, hybrids and ICs.
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Product
Loop-Powered Transmitters and Drivers
4-20mA
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Loop-Powered Transmitters convert the output from proximity probes, seismic sensors, into a 4-20mA DC current, which is proportional to the input being measured. The transmitter converts the displacement or vibration signal to DC voltage and/or current for a DCS or PLC system. They control a 4-20mA current loop for a specified vibration range (ex. 0-5 mils peak-to-peak). The transmitters have a two-wire hook-up, powered solely by the loop current and have a power supply range of 15 to 36 volts.
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Product
Static Soil Tester
GEO-probe
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The complex is implemented on the basis of a portable computer and the CompactRIO control and measuring system. The software for recording and displaying measured signals and control of measuring equipment is developed on LabVIEW. The second modification of the measuring system includes, developed by our company, a miniature digital measuring module of a strain gage with a built-in ADC and inclinometer and a USB interface for connecting the digital measuring module of the probe to the computer.





























