Probing
See Also: Probers, Probing Stations, Nano Probes
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Measuring Arms
Among the highly ergonomic and portable scanning and probing solutions that QFP offers are the KREON arms , a range of tools capable of operating on different working volumes (approximately from 2 meters with the ACE 6-20 model to 4.5 meters with the ACE 6-45 model) applicable in different sectors.
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Wafer Sort
TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. State of the art Electroglas probers Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experience on Bipolar, CMOS, GaAs, & SiGe Overhead sort or cable harness sort Microsite testing capability
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72H-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25A-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Probes & OEM Modules
Measure and monitor humidity, dew point, carbon dioxide, moisture in oil, temperature, pressure, and vaporized hydrogen peroxide.
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Metallic Probe Inductive Proximity Sensor
Shanghai Pubang Sensor Co.,Ltd.
1. All-in-one stainless steel housing design, strong anti-shock function2. Magnetic field interference, high switching frequency, wide temperature range3. Protection class IP67 (IEC)
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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CC05120X, 120 MHz, 5 Arms Current Oscilloscope Probe
786847-01
The CC05120X, or Hioki CT6701, is a clamp-on current probe that offers a wide DC to 120 MHz bandwidth and 5 Arms of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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K Thermocouple Penetration Probe
TP776
“K” Type thermocouple penetration probe. Tolerance according to IEC 60584-2 standard.
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Cryogenic Probe Station
FWPX
Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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NI-9230, 3-Channel, 12.8 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module
783824-02
3-Channel, 12.8 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module - The NI‑9230 can measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes. The NI‑9230 is also compatible with smart TEDS sensors. The NI‑9230 incorporates software-selectable AC/DC coupling, IEPE open/short detection, and IEPE signal conditioning. The input channels simultaneously measure signals. Each channel also has built-in anti-aliasing filters that automatically adjust to your sample rate. When used with NI software, this module provides processing functionality for condition monitoring such as frequency analysis and order tracking.
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Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)
CMK-02
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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NI-9232, 3-Channel, 102.4 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module
782000-01
3-Channel, 102.4 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module - The NI‑9232 can measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes. The NI‑9232 is also compatible with smart TEDS sensors. The NI‑9232 incorporates software-selectable AC/DC coupling, IEPE open/short detection, and IEPE signal conditioning. The input channels simultaneously measure signals. Each channel also has built-in anti-aliasing filters that automatically adjust to your sample rate. When used with NI software, this module provides processing functionality for condition monitoring such as frequency analysis and order tracking.
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Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3L5-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Line Automation Equipment
5000 Series In-line Handler
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
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Flexible Implantable Microprobe
IT-18
IT-18 Flexible Implantable Microprobe - Implantable in semi-solids and tissue with 18 gauge needle (supplied). Also for immersion in various solutions and rectal temperatures of small animals. Totally sheathed in chemical resistant Teflon™. Quited rugged. Maximum Temperature 150°C . Isolated. Probe diameter .050" (14 gauge represents the needle gauge that the probe can be inserted through). Time constant 0.3 seconds.
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IC Test Probes
C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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RH Temp External Probe
An external Relative Humidity and Temperature Probe for tight or remote locations. Every RH reading is temperature compensated for accurate readings. For environmental susceptibility, see Data Logger specification. Maximum extension is 30m (100').
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Solar Cell Testers
Solar Cell Testers are integrated systems incorporating Solar Simulator and I-V Measurement systems. PET offers Standard and Advance IV Measurement software. PET Cell Testers are capable of measuring a diverse range of solar cell parameters such as Isc,Voc, Imax,Vmax, Pmax, FF, Rsh, Rs and η cell conversion efficiency, complete light and dark I-V curves. All that needs to be done to test a cell is to load the cell, make electrical probes contact and press “Measure” icon on the I-V Measurement System software. The software will automatically open the Solar Simulator shutter, perform the test and close the shutter after the test is complete. The design is modular in nature and can be easily upgraded. Some options can added at a later time.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1T1-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Thermapen
Super-Fast ®
The Super-Fast ® Thermapen has been a favorite among restaurant chains, health inspectors and quality managers worldwide. Hundreds of thousands are in use. The clever fold-away probe and the simple pocket design replace more costly and bulky handheld thermometers while using the same professional thermocouple technology. This new generation Thermapen introduces a robust, splash-proof design with molded-in seals to protect the thermometer from wet hands and kitchen splashes.
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Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™
Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
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Alternate 0.99 (28.00) - 6.00 (170.00) Long Travel Bead Probe
BPLT-25F-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I40-16
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25L36-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Switch Probes
A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
