Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Auto Load 4 Moving Probe Tester
AL Series F4H4033AL
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Medium and High Volume Production Model with Auto Loader. Max. Test Area 15.7 x 13" (400x330mm). Max. Transferable Panel Size 16.5 x 13.4" (420x340mm). Number of Probes 2 Upper, 2 Under. in. Pad Pitch *4 0.00236" (60µm). Min. Pad Size *5 0.00118" (30µm).
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Product
InfiniiMax II Series Probe Amplifier, 10 GHz
1168B
Amplifier
Provides a large common mode range and a large offset range for measuring differential and single-ended signals.
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Product
PANELMAP
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PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
RF Helmholtz Coil
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The Beehive Electronics 135A RF Helmholtz coil generates a well-controlled, uniform magnetic field. It can be used to calibrate magnetic field probes, such as the Beehive 100 series, or for testing the susceptibility of other devices to magnetic fields. The Helmholtz coil comes supplied with a fixture that makes it easy to calibrate Beehive 100 series probes.
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Product
Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-F180-2
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Current Probes
XQ13
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Beijing GFUVE Electronics Co.,Ltd.
The model XQ13 ac micro amp clamp on current probe is suitable for 10A-100A cable online measurement, it belongs to high performance current sensor field.
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Product
Probes With Integral Connectors
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Used when quick and easy removal and installation are important requirements at the measuring device. Available in quick-connect, terminal block, m8, m12, and other popular connector styles.
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Product
Standard 1.55 (44.00) - 3.20 (91.00) General Purpose Probe
HPA-50D
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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Product
Probes
71 Series
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American Probe & Technologies, Inc.
10 mil (0.010") shank sizesAvailable in straight and bent shapes
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Non Replaceable General Purpose Probe
MEP-20B
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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Product
Irradiance Probe
LPUVB01
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The LPUVB01 probe measures irradiance (W/m2) defined as the ratio between the radiant flux (W) passing through a surface and the surface area (m2) in the UVB (280 nm …315 nm) spectral range.
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Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Product
Ultra High 1.77 (50.00) - 10.00 (183.00) Bead Probe
BTP-25F-10
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1I-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25V-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4H-2
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
TEM Cells
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Transverse Electro Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz., EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc.
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Product
Web Sensor
T7511
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Web Sensor with relative humidity and temperature probe on the cable. Built-in atmospheric pressure sensor.High precision capacitive polymer sensor ensures excellent long term calibration stability and ultimate accuracy. Dual line LCD is an advantage. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio and specific enthalpy.
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Product
PORTABLE COORDINATE MEASURING MACHINE
CMM
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The HandyPROBE arm-free probing system generates high-accuracy measurements (accuracy of up to 22 µm), and outperforms traditional portable CMMs on the shop floor. The HandyPROBE portable CMM is currently used on the production lines of major players from the automotive, aerospace and manufacturing industries.
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Product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72I8-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
AC / DC Voltage And DC Polarity Tester
1861
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Peaceful Thriving Enterprise Co Ltd
*With cETL Approval.*Built-in LED and neon lamp indicator.*Neon lamp for 120V-230V-400V AC.*LED Display for 12V-50V and polarity.*Long lead connects tester body and probe.
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Product
High Voltage Isolator for Logic Analyzers
LX-08
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The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.
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Product
Portable Wafer Probe Station
PS-5026B
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High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1UN-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Low Current Probe 80A
695
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Great tool for accurate measurement of low current. Use with your graphing meter or lab scope to view current waveforms on fuel injectors, fuel pumps, primary ignition coils and more. Also works very well with digital multimeters. Resolution of 10 milliamps is low enough for most parasitic drain testing. In addition, the clamp opening of 1/2 inch is large enough to clamp over most negative battery cables for those parasitic drain tests.
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Product
Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40L-013
High Frequency Probe
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Product
Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
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* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Product
Multi-Contact Wedge
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The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1P-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02





























