Probing
See Also: Probers, Probing Stations, Nano Probes
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Fine Pitch Spring Probes
For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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Meter With Dissolved Oxygen/ATC Probe
DO 700
Economical, user-friendly and accurate, the Eutech DO 700 is your ideal choice for routine applications in laboratories, productions plants and schools.
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Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-H150-2
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1H-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Probing Solutions
High Power Pulse Instruments GmbH
Probing Solutions and Probe Arms by HPPI GmbH
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Featured Accessories
Get the most out of your AE products. Our product accessories can make an excellent AE product even better. From software to probes, find the right accessory to enhance and transform your application processes or analysis.
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CMM probes, Software and Retrofits
The 5-axis measurement product range represents the biggest step-change in measurement capability ever introduced, delivering unprecedented speed and measurement flexibility, whilst avoiding the speed versus accuracy compromises inherent in conventional techniques. Whether the REVO scanning or the PH20 touch-trigger, Renishaw's 5-axis systems boost measurement throughput, minimise lead times and give manufacturers a more comprehensive appreciation of the quality of their products.
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Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40G
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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AC Current Probe 10 mV/A, 600A, 12 Hz LF Bandwidth, 30MHz HF Bandwidth, 1m cable
T3RC0600-HF
AC Current Probe 10 mV/A, 600A, 12 Hz LF Bandwidth, 30MHz HF Bandwidth, 1m cable.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 230gf
K100-I126230-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 230gf, Steel with Gold Plating.
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Enhanced Time Domain Analysis With TDR
S96011B
Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Circuit Tester
69105
Tests circuits rated from 80 to 600 volts AC/DC.High-visibility neon lamp indicator.High-impact, sealed 5-11/16'' (144 mm) probes on long 24'' (610 mm) leads for convenience in testing motors, fuses, relays, switches, etc.Resistor between each probe and lead.Reliable electronic components.
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Needle Microprobe
MT-26/4HT
Fast-response 26 gauge needle probe, (needle length is 4 cm) for instant readings in tissue, semisolids, liquids. Also for very small specimens, powders and materials. Needle tip is sealed to ensure only stainless steel contacts specimen. Max. temp. 200°C. 5 ft. lead. Smallest microprobes give fastest reading. Short probes are easier to insert and last longer. Type #'s indicate needle gauge and needle length in cm.
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PRO 3-in-1 Low Range pH, EC, TDS Combo Meter
MW801
This Milwaukee 3-in-1 Low Range combo meter allows you to measure pH, EC (conductivity) and TDS with a single meter and one single probe.
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ITA, ICon XL, 2 Module, Extra-Large Backshell, EMI
410123232
The iCon XL offers an extra-large u-shaped cable clamp that can hold cable bundles with an oblong bushing effective diameter of 1.95" and offers a cable bend radius of 1". A slide-off backshell allows easy access to wiring for maintenance and probing. The iCon XL also offers EMI shielding.
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EPA General Purpose Probes
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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PCB Test Fixture Kits And Customized Fixtures
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Compressed Air Temperature and Humidity Regulator
H3021P
Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T30-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74C-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Standard 1.63 (46.00) - 4.50 (128.00) Battery Probe
CP-059-19
Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 40Recommended Travel (mm): 1.02Mechanical Life (no of cyles): 100,000Overall Length (mil): 276Overall Length (mm): 7.01
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T30-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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DVB-T/T2 Compact Monitoring Probe
EdgeProbe Nano DVB-T/T2
With its small, compact and easy to handle design, the EdgeProbe Nano DVB-T/T2 is the ideal tool for field technicians to transport in order to validate and monitor 24/7 all points of a DTV network.EdgeProbe Nano is able to monitor DVB-T and DVB-T2 signals through its RF input (144 x 137 mm compact format).Combined with a Network Monitoring System or not, the EdgeProbe Nano provides a powerful broadcast network alert & diagnosis tool allowing DTV network operators to monitor global trends and anticipate potential failures.
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CC15010X, 10 MHz, 150 A Current Oscilloscope Probe
786849-01
The CC15010X, or Hioki 3274, is a clamp-on current probe that offers a wide DC to 10 MHz bandwidth and 150 A of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Wafer/Chip/Package Semi-automated ESD Tester
400SW
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
