Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Flight Line Armament Test System
SST
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The Stores System Tester (SST) is a ruggedized flight line armament test system that enables real-time diagnostic analysis. U.S forces need to perform alternate mission equipment (AME) troubleshooting and diagnostic analysis on the flight line. BAE Systems' SST provides this capability in a one-person portable package.
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Low Voltage Test System
CKT T1
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The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Product
EMI Receiver System
EMI-9KC/EMI-9KB
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EMI-9KB is an automatic EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KB fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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Power Meter
P-Series
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The N8262A is a compact and slim LXI-compliant P-Series modular power meter. The N8262A helps you to reduce your test system size and enables LAN-based automated power measurements. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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Product
PXI Avionics Databus Modules
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Avionics interface modules from Avionics Interface Technologies, offered through Keysight, enable connectivity between your PXI test systems solution to DUT’s with aviation industry standard buses. These modules are capable of simulation, monitoring, record and play back of bus traffic enabling test and verification of avionics equipment data communication capabilities. The available interface modules support industry standard avionics based buses such as MIL-STD 1553, ARINC 429, and ARINC 664p7, and Fibre Channel.
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Product
PXIe-2540, 350 MHz, 8x9 PXI RF Matrix Switch Module
780587-40
Matrix Switch Module
PXIe, 350 MHz, 8x9 PXI RF Matrix Switch Module—The PXIe‑2540 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXIe‑2540 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers.
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Product
Pneumatic Vertical Shock Response Spectrum Test System
KRD14 series
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KRD14 series pneumatic shock response spectrum tester is used to measure and determine the shock resistance of electrical and electronic products or packaging, and to evaluate the reliability and structural integrity of the test product in a shock environment. The shock response spectrum is the total result of a series of single-degree-of-freedom linear systems with different natural frequencies subjected to the same shock excitation response. When a product is subjected to an impact, the maximum value of its impact response means that the product has a maximum stress. Therefore, the shock response spectrum tester can better simulate the shock wave and shock energy suffered in the real environment.
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Product
PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-252-114
Programmable Resistor Module
The 40-252-114 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
3U Intel® Core™ i7-2715QE 2.1 GHz Quad-Core Processor-based PXI Controller
PXI-3980
Embedded Controller
The ADLINK PXI-3980 PXI embedded controller, based on the second generation Intel® Core™ i7 processor is specifically designed for hybrid PXI based testing systems, delivering a rugged yet stable platform for a wide variety of testing and measurement applications.
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Product
PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-252-053
Programmable Resistor Module
The 40-252-053 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
JIS/ASTM Standard-Compliant Plastic Bending Test System
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Testing of Plastic in Accordance with JIS, ISO and ASTM Standards Can Be Performed
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Product
PCI Precision Resistor Card 3-Channel, 3Ω To 1.51MΩ
50-297-150
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Pump Testing Panels
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Aarohi Embedded Systems Pvt. Ltd
AAROHI Pump Testing Panels - full load, semi/fully-automatic pump test systems
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Product
PXI Express Gen3 Controller
PXIe-3988
Controller
The ADLINK PXIe-3988 PXI Express embedded controller, based on the 9th gen Intel® Xeon® E processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications. By utilizing the Intel® Xeon® E-2276ME processor (6 cores, 12 threads) with up to 64 GB of 2666 MHz DDR4 memory, the PXIe-3988 easily performs execution of numerous independent tasks simultaneously in a multi-tasking environment.
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Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 5.82MΩ
40-298-052
Programmable Resistor Module
The 40-298-052 is a high density programmable resistor module with 6 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Shock Test Systems
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Accurately measure the fragility of products and evaluate how they respond to specific shock inputs.
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Product
PXIe-6545, 200 MHz, 32-Channel PXI Digital Waveform Instrument
780993-02
Digital Waveform
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Product
Primary Injection Test System
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HAOMAI Electric Test Equipment Co., Ltd.
Primary injection testing is suitable for testing over-current trip relays attached to a circuit breaker.
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Product
PCI Precision Resistor Card 4-Channel, 2Ω To 102kΩ
50-297-134
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Automatic Hysteresis Graph Test System
DX-4DMT
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X-4DMT automatic hysteresigraph system accords with the standard permanent magnet test system, GB3217-92, used to measure the major and minor hysteresis loops, demagnetization curves, recoil hysteresis loops and initial magnetization curves in different temperature of ferrite, AlNiCo, SmCo, NdFeB and quenched material, and gives the magnetic parameter, Br, Hcb, Hcj, (BH)max, Hk and so on, and could meet different requirements on test function, precision, power capability, reliability, efficiency, price, local environment from laboratory to enterprise's production line.
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Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Spectroradiometer
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Designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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Temperature Chamber
MTC-20
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Improve your temperature dependent testing with the Compact Bench Top Temperature Chamber, seamlessly integrated with a Maccor Automated Test System. Its compact design allows for easy placement on any benchtop. For increased capacity, you can install up to 4 chambers into a standard 19” industrial rack cabinet.
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Product
Test Development Solution
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Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Micro Ohm Meter 200A
Micro Centurion II
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Raytech Digital Micro ohm meter, Micro-Centurion II, was designed for high degree of accuracy to measure very low resistances. This technology was then packed into a portable test system to be used by apparatus manufacturers, rebuild shops, and electrical maintenance crews. This intelligent system has an easy to use operation screen, which allows quick selection of the current level and resistance level to be measured.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
MCB Thermal Trip Calibration Test Bench (IEC 60898 Cl 9.10.1.2, Annex I.1, IS)
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The test system is designed and customized to carry out 2.55*Intest as per Table 7 (test c) of IEC 60898 (also mentioned for routine testing of MCBs. The test is done at dc current to exactly analyze and correct the bimetallic properties of the MCB as far as thermal tripping is concerned. The unit comes with a pneumatically operated test fixture with in-built dc stepper motor that is controlled by a micro controller / PC to calibrate the breaker into a narrow tripping band programmed by the user.
