Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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Fluorescence Microscopy Solutions
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology.
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250 Watt Electronic Load Module
N3307A
Load Module
The Keysight N3307A is a 250 W (0-30A, 0-150V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3307A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3307A can also digitize waveforms.
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Industrial Electronic Endoscope
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Xiamen IDEA Electronic Technology Co., Ltd.
1.Railway Electronic Industrial Endoscope testing.2.Large screen color screen to restore the true image. 3.Industrial endoscope.
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Scanning Thermal Microscopy Module
VertiSense™
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SThM module for thermal conductivity contrast and a temperature contrast imaging. Supports Contact, Tapping™ and Peak Force Tapping modes. Plug-in module, compatible with most commercial AFMs. Real temperature measurements up to 700° C. Ultra-low noise, high speed amplifier. Innovative probe design.
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Active Scanning Technology
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ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Electronic Resistance Store
MEMS2-4L
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The mezzanine serves as an electronic store of resistance to direct current, the value of which is set by software, through two isolated channels.
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Fast Lambda Scan Software License
N7700102C
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Enables fast swept-wavelength multichannel measurements with the PAS LS engine and PAS FSIL engine.
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Scanning Auger Nanoprobe
PHI 710
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The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Electronic Pressure Comparator
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Huaxin Instrument (Beijing) Co., Ltd
When it comes to simultaneous pressure calibration for several pressure measuring instruments, electronic pressure comparator is always a great choice for most of people. The comparison calibrator features 5 pressure ports which allow simultaneous connection of 4 pressure gauges under test, making calibration more efficient and time saving. It also comes with an external air source for easy and precise pressure generation and servo valve for stable pressure control.
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DC Programmable Electronic Load
ELCH300
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- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR/OV/OC/- OP/OT protection- Communication: USB/RS232/GPIB
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Area Scan Cameras
ace Series
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Enjoy a new class of digital cameras that will help you to be even more successful and efficient at what you do. High quality and performance levels combined with a low starting list price of only 199 and a small 29 mm x 29 mm housing make Basler ace cameras one of the world's best-selling cameras with thousands of satisfied customers. It is available with several resolutions and speeds and with sensors from all leading manufacturers so that you can easily find the right ace camera model for your application. Choose from the most popular and standard proven data interfaces in the vision market: With the ace Gigabit Ethernet models, you benefit from our GigE market leadership, easy multi-camera setups and 100-meter cable length. Camera Link is the interface for high image data transfer. And with USB 3.0 there is an interface technology which is easy to use and real-time capable.
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Nanoscale Microscopy Standards
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The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
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Laser Scanning Microscopes
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A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
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Electronic Test & Measurement Equipment
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We are known worldwide for the M.O.L.E. Temperature Profiler. The Mole is used in the Electronic, Paint, Food, and the Industrial marketplace. The Mole is a stand alone, 6 channel, temperature profiler that it is used in many harsh processes that require the temperature measuring instrument to be inside the heating chamber or "ride along" with the parts or process being measured over time such as Solder Reflow Ovens and Wave SolderMachines.
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Area Scan Camera
Genie Nano-CL
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Introducing Genie Nano, a CMOS area scan camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, and an unmatched feature set--all at an incredible price.
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Automotive Electronic Stethoscope
77109
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Helps to identify engine and chassis noise. Maintain all health and safety precautions whilst using on running engine. Helps to identify engine and chassis noise. Powered by a 9volt battery (not supplied). Complete with headphones and volume control. CE certificated.
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Electronic Product Testers
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Infinity Machine International Inc.
Electronic Product Testers by Infinity Machine International Inc. - for applications such as connectors insert and extract testing machine, touch screen torsion, abrupt pull tester for power wire and headphone cable, double station electronic product cable tester, cord flexing rotary bending fatigue tester, button click electronic product tester simulation, and more.
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Digital Electronic Tensile Test Machine
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Shenzhen Chuangxin Instruments Co., Ltd.
The Tensile Testing Machine is widely applied to test the tensile, tear, peel, and bend of all kinds of materials, such as metal, cable and etc, it’s used to test the tensile, tear, peel, compressive strength and bending of the material. It conforms to the standard of GB, ISO7500/1, JJG475-88, ASTME4, DIN5122, JISB7721/B7733, EN1002-2, BS1610, and CNS9471/9470.
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Electronic Load Mainframe GPIB
3300 Series
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A 4 Channels 1200W Mainframe which accepts up to four Load Module.
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Electron Probe Microanalyzer
JXA-8530FPlus
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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1149.1 Boundary Scan Feature, GTE 10.00p
K8212A
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Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
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Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Three Phase Electronic Meter DTS999
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Bofa Instrument & Equipment Co., Ltd
DTS999 series Single Phase energy Meter are new and high-tech products adopting special large-scale IC, latest micro-electronic technology and SMT production crafts. It is designed for rough working condition and components selection as foundation, so it can ensure the long-term stable operation. DTS999 series Electronic Single Phase Watt-hour Meter features long life, high accuracy, high reliability, high allowable overload, little power consumption, small size & light weight, etc.
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Electronic Ballast Tester
WT4000
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• Measure parameter: 1) Input: Vrms, Lrms, W, PF, Hz, Phasic angle, total harmonic and 0-39 component of harmonic. 2) Output: Lamp voltage, Lamp current, Filament current, Guided cathodic current, Lamp power, crest factor and oscillatory frequency, single high frequency analysis. • Startup: Startup lamp voltage, lamp current, filament current, guided cathodic current curve and parameter, preheating time; • Simultaneously display on 8 windows for input and output parameters, convenient for comparison and analysis; • Test preheat energy, filament preheat time. And the parameters changes from 0 to 5s of filament voltage, filament current and filament power; • Up to 1MHz lrms test content to every EB; • Analysis symmetry of high Frequency curve of lout; • 12-bit high-speed A/D, sampling rate up to 10MHz, can easily analyse signal curve of output; • Finish an input and output testing at the same time within 1 minute; • Portable, can test, display, print without computer. Test report include data and curve, comply with international standard; • Communication port for PC, run under Windows98 or Windows2000, English Version available.
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Modular Pulse Processing Electronics
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CAEN provides a complete and ever increasing set of instrumentation, from Preamplifiers to Data Acquisition to Triggering Electronics and Logic Functions. Most of the instrumentation is available in the most popular standard form factors and bus protocols, such as VME, NIM, CAMAC and Desktop.The Desktop is the stand alone form factor of the CAEN products. It provides the same performances of the other form factors and take the advantage of an easier and portable use, requiring no crates.
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DC Electronic Load
EE30141A
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The EE30141A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control. attach the electronic load block to a heat- sink and your up and running. used them with D to A's, A to D's, Pots, PLC's to control the current. These Electronic Loads can be used for both Discharge & Charging Batteries & Devices
