Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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Product
Analytical Software for Microscopy
SPIP
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SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
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Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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Product
Electronic Calibration Module, DC To 6.5 GHz, 2-Port
N7551A
Electronic Calibration Module
Reduce your calibration time by half with a smaller, lighter 2-port module that supports 3.5 mm or type-N 50 Ω connectors
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Digital Color Camera for Microscopy
LC30
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The LC30 is a 3.1 megapixel digital color camera for microscopy that combines versatility with performance. The LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications. The Olympus LC30 color camera for microscopy combines versatility with performance. With up to 37 frames per second (fps), faithful color reproduction, full integration into Olympus imaging platforms, and an excellent cost-performance ratio, the LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications.. The sensitivity and frame rate of the 3.1-megapixel CMOS chip can be increased using various binning modes, resulting in easy observation and focusing. The LC30 camera can be quickly and easily mounted on all microscopes equipped with a standard C-mount adaptor, and requires only a single USB 2.0 cable for high-speed data transfer and power supply. Its complete integration into the OLYMPUS Stream imaging platforms helps ensure the seamless interaction of microscope, camera, and additional devices, delivering intuitive and efficient operation.
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 26.5 GHz, 4-ports
N4433D
Electronic Calibration Module
The Keysight N4433D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4433D is a precision 4-ports ECal module that supports selection of 3.5 mm connector and can be mixed up to 26.5 GHz. Select either female-female, male-male, or female-male connectors.
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Scanning Instruments
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X-Rite scanning solutions automate press-side color control and are ideal for printers and converters who want to benefit from fast, accurate color. These systems not only remove the possibility of human error, they speed up make-ready and generate predictable and repeatable color results.
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Product
X-ray Microscopy
ZEISS Xradia Ultra
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Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
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Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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General Microscopy
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Nano-scale precision motion and stability are cornerstones of research grade microscopes for high resolution imaging. Mad City Labs provides nanopositioning systems, micropositoining systems, and stabilization systems that assist users with developing and adapting instrumentation for their own application requirements. Contact our sales and engineering team to discuss the right products for your application.
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Product
Line Scan Camera
Linea
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Introducing Linea, a CMOS line scan camera that can help you improve your imaging and lower your costs. Linea starts with an advanced CMOS sensor with high quantum efficiency and low noise for better images. Linea is also packed with advanced features to make your machine vision job almost effortless.
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Product
Boundary Scan
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Boundary Scan is a powerful test method for digital circuit components. The hardware and software components we use for the boundary scan implementation come from Göpel electronic
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Product
Boundary Scan
TurboBSD
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TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
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Active Scanning Technology
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ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
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Microscopy and Nanotechnology Labs
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Integrated Dynamics Engineering
IDE, with the most vibration isolation and EMI cancellation systems in use today, is no stranger to nanotechnology. For over twenty years, IDE has been addressing the special needs of research environments with advanced isolation solutions. IDE’s influence and global reach can be seen in the most cutting edge labs pushing physical boundaries to extremes in advanced materials, surface science, microbiology and more.
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Differential Scanning Calorimeter
DSC-60 Plus Series
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DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
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Product
Flip-Flop Electronics
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Analog Devices supplies a range of D type and T type flip flop products. Members of this portfolio can support data transmission rates up to 43 Gbps and clock frequencies as high as 43 GHz. All of our flip flop products are RoHS compliant and available in 3 × 3 or 4 × 4 SMT packages.
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Product
Line Scan Camera
Linea ML
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The Linea ML brings leading edge CMOS technology that is faster than ever, with affordable multiline architecture that enables the newest, most powerful inspection techniques including HDR, color and multispectral analysis, and multi-field imaging (single-pass bright/darkfield). With a native fiber optic interface for easy, low-cost long cabling, the Linea ML opens new horizons in inspection.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Electronic Loads
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Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
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Electronic Loads
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high performance electronic load is the successor to the highly respected PLZ-4W series, whilst still retaining the same high specification and build quality. Advances include a high visibility color display, low voltage operation from a minimum of 1 V to a maximum of 150 V. Programmable profiles of voltage/current can be applied (using the new ARB function, as used in LED/solar testing) in addition to the inherited 6 modes of operation: Constant Current, Constant Resistance, Constant Voltage, Constant Power, Constant Current + Constant Voltage, Constant Resistance + Constant Voltage.
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Product
SQUID Electronics
XXF-1
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It is designed to satisfy the needs of nearly all low-Tc SQUID applications. Additional integrated current sources provide e.g. bias current and calibration pulses for TES applications. These current sources together with an additional switchable feedback path make two-stage SQUID operation very convenient.
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Stroke-to-Raster Scan Conversion
VSC/900
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The Model VSC/900 provides scan conversion and mixing for any video input signals. The unit's capabilities include conversion of any input to any output format up to 2K x 2K. In addition to operating with VESA, HD and SD signals, the unit provides conversion and mixing of stroke (vector) video signals.
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Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Xineos Scanning
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Teledyne DALSA's leadership in CMOS innovation lets our Xineos scanning products deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Electronic Calibration Module (ECal), 50 GHz, 2.4 Mm, 2-port
N4693D
Electronic Calibration Module
The Keysight N4693D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy, and accurate. The N4693D is a precision 2-port ECal module that supports 2.4 mm connectors up to 50 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4693D is included for securing your ECal module and accessories.
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Electronic Units
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Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
