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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Scanning Electron Microscopes
SEM
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Differential Scanning Calorimetry
Nano DSC
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Scanning Acoustic Microscope
Echo
The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Scanning Probe Workstations
BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in: Corrosion and coatings, Biology, including biosensors and biotechnology, Batteries, fuel cells and photovoltaics, Materials, Catalysis
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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3D Multibeam Scanning Sonar
ProScan™
Teledyne BlueView's 3D Multibeam Scanning Sonar user interface software. ProScan connects to the sonar and pan/tilt unit, configures each scan, generates full 3D point clouds, and optionally streams output to third party hydrographic software for fusion with other sensors. Data is recorded in multiple file formats: .son (raw acoustic data file for ProScan reprocessing), .txt (plain text record of all point locations and positional data) and .xyzi (industry standard xyzi data for 3D point cloud viewers, registration software, etc.). In playback mode, users can review and reprocess scans to modify sound speed, intensity threshold, multidetect and range settings as needed. ProScan coupled with Teledyne PDS MotionScan, pitch, roll heading and position sensors provides the capability to scan areas to collect 3D point clouds while correcting for motion.
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Scanning Electro-chemical Microscope
920D
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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RAPID SCANNING AUTOCORRELATOR/CROSSCORRELATOR
FR-103HP
The FR-103HP is a compact NL crystal autocorrelator, suitable for moderate and high power lasers (Pav>5mW). It is available with a scan range >60ps (suitable for pulsewidths within 10fs-15ps) and covers a wide range of wavelengths with easily interchangeable plug-in detector modules. The standard FR-103HP provides ‘real-time’ pulsewidth monitoring capability for rep rates down to 1kHz.
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Laser Scanning FLIM Microscopes
DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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3 GHz RF/IF Sentinel Intelligent Signal Scanning Portable Recorder
Talon RTR 2613
The Talon® RTR 2613 combines Pentek’s Sentinel Intelligent Signal Scanning software with real-time recording in a lightweight, portable and rugged package. The RTR 2613 provides SIGINT engineers the ability to scan the 3 GHz spectrum for signals of interest and monitor or record bandwidths up to 40 MHz wide once a signal band of interest is detected. The RTR 2613 recorder is a grab-and-go recorder suitable for test & measurement, mobile military, security and government intelligence (SIGINT, COMINT and ELINT) applications.
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Scanning XPS Microprobe
PHI VersaProbe III
The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Scanning Probes
3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Spectro UV-Vis Double Beam PC Scanning Spectrophotometer
UVD-2950
Spectro UV-Vis Double PC is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing. Precise with high accuracy of measurement and stability are also provided by the powerful built in software and large LCD screen, which can display the screen menu and other functions. It can also be linked to a computer and a printer to show Photometric and Spectral data in the PC monitor.
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Scanning Auger Nanoprobe
PHI 710
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Talon 26.5 GHz Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTR 2654
- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 800 MHz to 26.5 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- 4U chassis with front panel removable SSDs- Storage capabilities to 245 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Laser Scanning Oil Film Detector
LO-300
LO-300 provides early warning by on-line detection of oil leakage with a laser and a security camera (option)LO-300 uses a laser to scan water surface or the ground to detect an oil film with high sensitivity.LO-300 with camera unit (option) enables to record the video when LO-300 detects the alarm and stores the image captured before and after alarm signal.
