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Product
8 SE Or 4 Diff. Input Channels, 4 Analog Output Channels, PCI Express
APCIE-3121-8-4
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Input range:?± 10 V, 0-10 V software programmable0-5 V, ± 5 V, 0-2 V, ± 2 V, 0-1 V, ± 1 V (gain)0-20 mA (option) ? software-programmable amplifier:PGA x1, x2, x5, x10 ? Conversion triggered through software,scan, timer, external event ? Onboard FIFO buffering for 256 analog values ? Data exchange through 16-bit I/Oor 32-bit memory (PCI DMA) ? Sequence RAM ? Overvoltage protection ? input filter: 160 kHz
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Product
Area Scan Camera
Genie Nano-CXP
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Introducing Genie Nano-CXP, a camera designed for full-throttle performance. Genie Nano-CXP builds on Nano's proven, industry leading reputation and leverages a CoaXPress 6Gbps interface to deliver the maximum throughput from leading edge high resolution CMOS image sensors.
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Product
Software
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Besides the primary WITE32 Test Environment package at the heart of our spinstand-based test systems, Guzik offers a variety of software options to provide additional measurement accuracy and analysis. Control and Automation software enhances various electro-mechanical capabilities of the test system (such as servo accuracy), and the available suite of Analysis software tools provides deep insight into the drive component under evaluation. Adjacent Track Interference, 3D Pulse Profile, Media Scanning and Bit Error Rate are examples of some of the optional additions. Some software tools require the WDM5000 Waveform Digitizer to be part of the overall test system.
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Product
OBD2 Auto Repair Intelligent Scanner
Scan 1
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Automotive Diagnostics and Publishing
The Scan 1 OBD2 scanner auto repair diagnostic tool is a unique software PC based scan tool, with built-in troubleshooter, PID Analyzer, DTC code videos, PID red-flag feature, advanced graphing, information and more. The PC based scanner software is bundled with all sorts of auto diagnostic and repair help. This OBD2 scan tool and your own oscilloscope makes for a complete auto repair shop solution. If you don't have an oscilloscope, then the Scope 1 is also available.
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Product
Nanopositioning Stage & Controller
PInano
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Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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Product
Individual UPC Bar Code Standards
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The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
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Product
Boundary Scan Test (BST)
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In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Product
Barcode Readers & Scanners
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High-performance, easy-to-use code readers for reliable high-speed scanning, decoding and communication.
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Product
Double Monochromator
Gemini 180
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The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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Product
Resonant Frequency Testing
E-Meter MK II™
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Determines resonant frequencies of the three modes of vibration. Material characteristics such as Youngs Modulus of Elasticity, Modulus of Rigidity, Poissons Ratio and Damping Constant can be calculated. Frequencies are automatically scanned in one of four ranges. The system can determine flexural resonance of concrete under accelerated freezing and thawing cycles and aggressive environments.
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Product
High Performance Data Acquisition
CPCI-AD8
Data Acquisition Module
The CPCI-AD8/16 module provides a 3U high performance data acquisition subsystem. There are (8) eight or (16) sixteen 100/200 KSPS ADC’s for maximum performance. The Local DSP can be used to simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface.Instrumentation amplifiers provide over-voltage protection and gain on a per channel basis. The CPCI-AD8/16 can also accept external scan and trigger signals from a front panel connector.
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Product
Isothermal Microcalorimetry
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Isothermal Microcalorimetry is an extremely sensitive technique complementary to TA Instruments differential scanning calorimeters. TAM is a microcalorimeter system represented by TAM IV, TAM IV-48 and TAM Air.
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Product
Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Product
Benchtop XRD System
BTX
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The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Product
Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228A
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The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Product
Ultrasonic Flaw Detector
ECHO
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Product
Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm
OSA202C
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Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.
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Product
Long-Range Perimeter Surveillance Radar
Ranger® R3
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The Ranger® R3 is a high-resolution radar that accurately detects personnel and vehicles at a range of up to 2,800 meters in virtually any climate, weather, or lighting condition to provide 24/7 security. Able to scan 360° every second to monitor more than 24 square kilometers (9.6 square miles), it can be integrated in an overlapping array with a variety of other radar and EO/IR units to conform to terrain profiles and protect larger areas such as borders.
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Product
Ultra High-Speed, Multi-Camera, High-Performance Image Processing System
XG-8000 series
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Offering a lineup of up to 21 megapixel area cameras and 8K line scan cameras, the XG Series contains powerful vision system technology providing flexibility and power to solve a wide range of applications. No experience required to select lighing! - newly-developed, revolutionary Lumitrax function. Powerful Vision Software. Flexible Multi-Camera Hardware.
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Product
Network Testing Software
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Get the most out of your PCTEL® scanning receivers with SeeHawk® Touch and Collect network testing software and the SeeHawk™ Central cloud reporting and automation platform. Our intuitive interface makes it easy to conduct drive testing, walk testing, troubleshooting, commissioning, and reporting for cellular, WiFi, and critical communications networks indoors and out. With SeeHawk Central, you’ll also get instant online data access, workflow automation, and report sharing tools for grid-based in-building testing.
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Product
Manual Vision Measuring Machine with Probe
SVM II P
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Product development, 2D scanning, quality inspection, such as watch, electronic connector, hardware, stamping, quality inspection, such as watch, electronic connector, hardware, stamping, spring and circuit board, etc.
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Product
1149.1 Boundary Scan Feature, GTE 10.00p
K8212A
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Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
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Product
3D Inspection Service
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The reference data may come in the form of a table, with values at specific points or features, a cad model, or 3d scan. 3D inspection services may require datum measurements, where the part to be inspected is located in a fixture that is specifically designed to orient the part by an ordered method. In some cases, the part may have features that are designed specifically to be referenced by datums, if no functional feature of the part provides a clear reference.
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Product
Brinell Optical Systems
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Newage Testing Instruments, Inc.
Newage offers optical solutions for your hardness testing include the popular B.O.S.S. Brinell Optical Scanning System, HiLight optical scope and pocket optical scope.
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Product
Microscopy
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Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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Product
Boundary Scan Trainer Kit
QE49
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Qmax Test Technologies Pvt. Ltd.
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Product
STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
