Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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SIRIUS Waterproof
SIRIUS Waterproof - Rugged and Modular Data Acquisition SystemExtremely rugged (IP67 degree of protection) and fully isolated rugged data acquisition system for the most demanding testing in harsh environments. High-precision, high-dynamic, and high-bandwidth for all types of analog signals from IEPE to strain gages.
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2-CH MIL-STD-1553A/B Bus Simulator Module
1553 WA73A-455
The WA73A-455 MIL-STD-1553A/B Bus Simulator Module allows a system controller in an ATE system to communicate with and test devices that conform to the MIL-STD1553A/B data bus used in military aircraft and communications systems. Each of the WA73A-455's two channels operate as two separate and independent channels with their own VXIbus logical address, interrupts, and complete set of controls and indicators. As a result, each channel of the WA73A-455 is truly an independent instrument, and, therefore, individually programmable.
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EOS Tester
KT-200SG
This test instrument stands for the EMI(Electro Magnetic Immunity) ability test to the electric devices, electronic circuit boards & electric equipments. Recently this instrument is widly used in many companies in Korea & other countries to test the immunity to thier products-power supply, drive PCBs, communication systems, LCD display panels whether they are safe or not against the impulse & noise.All for the purpose, of this object, it generates 4 ~ 5 kinds of different impulse test waveforms.Output test voltage level : 5 ~ 200 V ImpulseOutput voltage polarity : Positive, NegativeType of waveforms
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Combined Map Display Unit & Interface Unit Tester (COMED)
MS 1117
This system is used to test COMED (Combined Map Electronic Display) IFU cards. This ATE checks the LRU Status and card status and identify faulty component in the individual UUT. On fault, this suggests the possible component failure as diagnostic report, for repairing the cards.
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PXI High Density Precision Resistor Module, 6-Channel, 3.5Ω to 102kΩ
40-298-040
The 40-298-040 is a high density programmable resistor module with 6 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Unclamped Inductive Load Tester
ITC75100
The ITC75100 is an enhanced unclamped inductive load (UIL) test system that builds on the success of ITC’s industry leading ITC55 series of testers by adding additional test and measurement capability.
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Rugged Field Test Set
MTS-207
The MTS-207 is a state-of-the-art portable PXI platform for field testing and data acquisition systems. Its proven architecture has been deployed worldwide on multiple programs including the MTS-206 Maverick Missile system flight line tester, the MTS-209 Common Armament Test Set, the AN/TSM-205B Hellfire System test Set, and many more. It combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flightline qualified enclosure. The MTS-207 is ideal for test and data acquisition applications requiring operation under harsh environmental conditions including flightline, back-shop, or airborne applications.
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Vibration Testers
Lansmont’s Vibration Test Systems are simple to operate safely and can perform a wide range of vibration tests in accordance with government, industry and corporate specifications.
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Battery Pack Drop Tester
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Battery Pack Drop Tester Relevant standards requirement:Test object: battery pack and systemTest procedure: The test object is most likely to fall in the direction of actual maintenance or installation. If it is not possible to determine the most likely fall direction, fall in the Z-axis direction, and the battery pack will fall from the height of 1 m to the concrete floor and observe for 2 hours.Accept standard: The battery pack or system has no electrolyte leakage, fire nor explosion.
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Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulat...show more -
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AXIe Chassis and Controllers
AXIe is a new open standard for high-performance, modular instrumentation, and incorporates the best features of other modular formats including VXIbus, LXI and PXI. Keysight has designed a new line of scalable chassis in this new format. Along with controller options, these new AXIe chassis will form the basis of a high-performance, AXIe-based test system.
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PCIE/NVME Interposers
SerialTek’s PCIe Gen3 Slot (AIC) Interposers with SI-Fi technology are specially designed test adapters that are physically placed in between the PCIe slot and a PCIe endpoint to intercept and relay a copy of the high-speed signaling and discrete data lines to the PCIe Analysis system in real-time.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Dual Bus 36-Channel 2A PCI Fault Insertion Switch
50-190-202
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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High Temperature, Low Strain Capacitive Extensometers (1200 C or 1600 C)
Model 3648
Jinan Testing Equipment IE Corporation
These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) ...show more -
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NI-9228, ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-01
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Chamber/Pyroelectric Task
Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization respo...show more -
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LFA-3000 Light Flicker Analyzer
Hangzhou Everfine Photo-E-Info Co., LTD
LFA-3000 can simulate flickering measurement and analysis under various voltage fluctuation conditions, and the system has built-in standard voltage waveform database, one operation can complete the test and analysis of IEC 61547-1, convenient and fast. Meet the lighting product design, quality inspection and application of flickering test analysis needs.
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Boundary Scan Products
Acculogic offers a powerful suite of PC-based hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE1149.1 and IEEE1149.6 standards. Acculogic’s comprehensive line of Boundary Scan Test tools can be effectively used in the entire product life cycle, starting with design verification and validation and continuing into pilot production and manufacturing. Use of these tools in field service and repair depots can help further to reduce test cost and cycle time.
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MIMO Vibration Controller
Spider-80M
The Spider-80M platform is based on the efficient Spider-80Xi architecture and is dedicated to MIMO VCS control and MIMO structural testing applications. Each Spider-80M chassis features 8 outputs capable of carrying out 6-degree of freedom MIMO testing. One Spider-80M chassis and multiple Spider-80Xi chassis can chain together to form a very large system with up to 504 input channels.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Flexible Temperature Testing & Thermal Cycling
TA-5000B Series
MPI Thermal manufactures a variety of compact temperature chamber solutions for electronics and material test and thermal conditioning. An array of standard and custom design high-performance Clamshell styles and other configurations and custom dimensions and sizes are available. MPI ThermalAir Systems compact chamber thermal products are available to meet your test application needs.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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3U PXI-E System Controller
PX32101
LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equi...show more -
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LED Optical Aging Test Instrument
LEDLM-80PL
LEDLM-80PL LED Lumen Maintenance and Aging Life Test System is designed according to standards of IES-LM-80, IES-LM-82, TM-21 and GB2312-80, and the software is developed base on Arrhenius model. LED has the features of long life, but with the different working condition and drive current, its life will be different, but generally the life will be around 50K hours. Differ from the traditional lightsource, LED light will decay gradually rather than extinguish instantly, so in the standard of LM-80, it introduces L70, L50 and etc.
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I3070 In-Circuit Test System Software
Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
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Automated Inline In-Circuit Test Solutions
Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.
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Mini Rack 60*60*60cm
OTP2 module no.001
The rack serves as the basic structure for your individually designed test system. Various OTP² modules can be installed in the 60 x 60 x 60 cm rack in order to implement a wide variety of test requirements.
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Pilot V4
The Pilot V4 Next series is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs.
