I3070 In-Circuit Test System Software

I3070 In-Circuit Test System Software

Keysight Technologies

Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.

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Silicon Nails Feature Development And Runtime, GTE 10.00p

K8228B - Keysight Technologies

The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.

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DGN Advanced Reporting Feature, GTE 10.00p

K8223B - Keysight Technologies

The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.

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PLD ISP Feature, GTE 10.00p

K8220B - Keysight Technologies

The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.

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Flash ISP Feature, GTE 10.00p

K8219B - Keysight Technologies

The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.

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Drive-Thru Feature, GTE 10.00p

K8218B - Keysight Technologies

The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.

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Cover Extend Feature, GTE 10.00p

K8217B - Keysight Technologies

Cover-Extend Technology (CET) extends the measurement capability of VTEP or nanoVTEP into powered testing by using the Boundary Scan output cell to test the connectors and socket signal pins. This capability extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.

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Advanced Throughput Multiplier Feature, GTE 10.00p

K8215B - Keysight Technologies

The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.

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Silicon Nails Feature, GTE 10.00p

K8214B - Keysight Technologies

Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.

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1149.6 Boundary Scan Feature, GTE 10.00p

K8213B - Keysight Technologies

Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.

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1149.1 Boundary Scan Feature, GTE 10.00p

K8212B - Keysight Technologies

Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.

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Silicon Nails Feature Development And Runtime, GTE 10.00p

K8228A - Keysight Technologies

The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.

Product Home Contact/Sales Company Catalog Share Add To List
PLD ISP Feature, GTE 10.00p

K8220A - Keysight Technologies

The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.

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Flash ISP Feature, GTE 10.00p

K8219A - Keysight Technologies

The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.

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Drive-Thru Feature, GTE 10.00p

K8218A - Keysight Technologies

The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.

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Cover Extend Feature, GTE 10.00p

K8217A - Keysight Technologies

Cover-Extend Technology (CET) extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.

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Advanced Throughput Multiplier Feature, GTE 10.00p

K8215A - Keysight Technologies

The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.

Product Home Contact/Sales Company Catalog Share Add To List
Silicon Nails Feature, GTE 10.00p

K8214A - Keysight Technologies

Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.

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1149.6 Boundary Scan Feature, GTE 10.00p

K8213A - Keysight Technologies

Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.

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1149.1 Boundary Scan Feature, GTE 10.00p

K8212A - Keysight Technologies

Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.

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Software Update For TestHead, GTE 10.00p

K8225A - Keysight Technologies

Software Update for testhead is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.

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Software Update For Test Development, GTE 10.00p

K8224A - Keysight Technologies

Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.

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DGN Advanced Reporting Feature, GTE 10.00p

K8223A - Keysight Technologies

The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.

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