Showing results: 3076 - 3090 of 5277 items found.
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FIT448 -
Matco Tools
This set includes everything to test the following: Bosch AFC, MPC, Digijet/Digifant- (except CIS- use our FIT447) Chrysler Corporation Ford Motor Company General Motors (except TBI- use our FIT446) Japanese Fuel Injection Systems Others using Bendi. The 2-1/2" gauge has a dual scale dial with ranges from 0-100psi and 0-7 bar.
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PE43508 -
pSemi Corp.
The PE43508 is a 50Ω, HaRP™ technology-enhanced, 6-bit RF digital step attenuator (DSA) that supports a wide frequency range from 9k to 50 GHz. It supports 1.8V control voltage and optional VSS_EXT bypass mode to improve spurious performance, making this device ideal for test and measurement, point-to-point communication systems, and very small aperture terminals (VSAT).
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Maury Microwave Corporation
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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Optronis GmbH
Whether it’s needed in the laboratory, at external sites or for crash tests, you can expect high performance every time, every place and everywhere from Optronis’ slow motion cameras of CamRecord-CR and CamRecord-Sprinter series. The systems are particularly easy to operate. The high level of light sensitivity of these cameras gives you a clear view of your subject, even in poor light conditions.
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CP-4 -
Bruker Nano Surfaces
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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TS-1650 -
Testek Solutions
Testek’s NextGen TS-1650, LRM & CATE series provides economical and high speed, certified correct testing of a wide range of aircraft avionics and control components. The Testek ATE family are universal, automatic test systems, one of which is best for your application. UTC Aerospace formerly known as Hamilton Sundstrand approves and recommends Testek’s TS-1650, LRM & CATE series.
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C60 -
Cypher Instruments
The C60 investigates the opaque world of analog networks. The unit operates in two test modes. It can measure the frequency response of a two port system producing a gain/loss and phase graph. It can also measure the reactive response of a two terminal network producing an impedance/admittance and phase graph. Electronic, electrical, electro-acoustic and other networks can be tested with sine wave excitation and the results displayed on a PC.
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LXinstruments GmbH
An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.
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GTB1684 -
Guide Technology, Inc.
The GTB1684 is a light weight, high quality14.5Gbps, 4-Channel BERT system. It is the idealchoice for high speed serial bus testing.Accurate testing at today’s high speed seriallinks requires the test tool to generate veryclean signals with the lowest jitter possible. TheGTB1684’s fast rise time, low noise and lowjitter are evident in the high fidelity output eyeon all four channels.
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Keysight Technologies
PCI Express® technology is implemented broadly in systems requiringhigh-speed data transfer, such as video or graphics.Keysight's PCIe protocol solutions provide a complete PCIe 5.0 test path with a PCIe protocol analyzer and a PCIe exerciser. The integrated design boosts signal integrity and provides outstanding verstaility.Keysight's protocol solutions enable faster, more confident testing of PCIe designs, now and in the future.
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N4392A -
Keysight Technologies
The new Keysight N4392A is an ultra-compact, portable fully integrated optical modulation analyzer with a 15'' laptop-size screen. It is optimized for daily R&D work and designed for the most affordable performance verification in manufacturing and component test for 40/100G components, modules and systems. It is the first optical modulation analyzer that provides built-in performance verification and recalibration, extending the factory recalibration cycles significantly.
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ITE -
JGB Consulting, Inc.
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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BurnIn64 -
7Byte Computers
Burnin64 is a burn-in tool designed for AMD64 architecture to test the major components of computer under Windows For 64-bit Extended Systems(x86-64 platform) environment. It is specifically designed to test CPU(s), Motherboard, Memory and Hard drive(s) with the new features of x86-64 architecture in mind.
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TCT-2690PRO -
Tenma
LAN/length cable tester quickly and accurately tests network, telecommunication, cable and security systems for a variety of issues. Tests for open or short circuits, jumpers, cross or split pairs, continuity and wiring of cable patterns, cable identification and length measurement using included remote ID.
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Astronics Corporation
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.