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Portable Meter Test Kit
UTEC 430
The UTEC 430 is the first Portable Meter Test Kit to support both the Radian Dytronic (RD) and the installed base of Radian Metronic (RM) reference standards. The ability to support both reference standards makes the 430 the ideal budgetary solution for traditional on-site meter testing using Phantom Load current sourcing. Do not let its compactness fool you, the UTEC 430 has three 30 Amp current output elements for performing single-phase or three-phase meter testing. When each element is combined using the optional open link cable harness, the UTEC 430 can source up to 90 Amps.
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NVIDIA® Jetson Xavier™ SOM-Based Platform for Rapid Development of ROS and AI Applications
ROScube Pico NPN
The ROScube Pico Series is an integrated development board powered by an NVIDIA® Jetson Xavier™ NX and Nano system-on- module (SOM) platform designed for rapid development and deployment of ROS and AI applications. The straightforward design allows users to quickly get started on development using open-source ROS libraries and packages. In addition to NVIDIA JetPack SDK, the ROScube Pico NX/Nano supports the full complement of resources provided by ADLINK’s Neuron SDK, Neuron IDE, and Neuron Library. The ROScube Pico NX/Nano is especially suited for robotic applications that demand cost-effective deployment without compromising AI computing capability.
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Quad Optical Loss Test Set
KI27624-INGAAS-APC
A Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Single Parameter Test Kits
The single parameter test kits make it easy to determine specific parameters on site or in the laboratory. Different platforms offer a range of options - from easy-to-use, inexpensive drop count titration to high-precision digital titrator kits. Hach test kits include everything you need to get started with your determinations right away. This includes the necessary equipment and a complete set of reagents, all in a sturdy Hach transport case.
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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STDF Test Data Analysis Tool
DataView
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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UAT Test Management
User Acceptance Testing is the final stage of the Software Development Life Cycle, which is conducted by the users. User Acceptance Testing is extremely important to determine whether the project is working fine as per the end user's point of view. The UAT test management process has to be done in an organized manner to reap maximum benefits from the process.
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Test Companions
Test lead kits that include our Test Companion carrying cases for conveniently storing your test accessories.
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Electrodynamic Shock Test System
FS SERIES
The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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Optical Component Test
Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with Luna’s suite of component analyzers and testers.
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Reach-In Conditioning Test Chamber
Weiber Conditioning Test Chamber Manufacturers offers an ideal apparatus for conditioning materials at non-ambient temperatures. Now researchers, engineers, and technicians have a simple and cost effective method to condition samples prior to testing. Laboratory Conditioning Chamber is designed for the conditioning of samples prior to testing, provides conditions from 20% to 98% RH ± 2 and 0°C to 94°C ± 0.5°C.Conditioning Test Chambers offers ideal humidity and temperature conditions required fo...show more -
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SMD LED Aging Test Machine
CX-6100
Shenzhen Chuangxin Instruments Co., Ltd.
Designed to measure the aging-life and color comparisons of 50pcs 5050 SMD LED and 100pcs 3528 SMD LED.• 150 separate constant current supply• Aging functions: constant current, impact pulse, on-off mode• Range of forward voltage(VF): 5.0V• Range of forward current(IF):1) constant current: 0-100.0mA2) Impact pulse: 0-200.0mA• Range of impact pulse frequency: 10-9999Hz; Duty ratio: 1%-99%
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In-Circuit Testing and Test Engineering
5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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Logic Test Handler
M620
- Maximized Productivity- Handles various device size- Short conversion time- Easy mantenance- Minimized footprint
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O.E.M. Specific Test Charts
O.E.M. Specific Test Charts by Applied Image - IMATEST SFRPlus Chart, ISA ColorGauge Targets, ISA Device Level Target, ISA Object-Level Target Family, ISA Spatial Frequency Response Target
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Motor Stator Test System
Chroma 1920
Chroma Systems Solutions, Inc.
For electrical safety and quality testing functions of motor stator coils
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Travelling Wave Fault Location Test Kit
PH Series
PH series travelling waveform fault locating relay/equipment test set is a new device to meet the needs of testing and verification for travelling wave fault location equipment and protection relay with TWFL function.
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Sensors Test Cells
Integrated MEMS
The best technical performance, cost optimization, one-shot factory integration.A single unit integrates the modules for the handling, contacting and complete testing of MEMS devices, including the physical stimulus for functional test, and the tri-temp thermal conditioning.
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MIL-STD-1553 A / B Test And Simulation PMC Module
PMC-1553
*Dual redundant*1, 2 or 4 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O (up to 30V)*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems*Heat sink and / or protective coating available*Optional input / output for front panel
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Application Performance Management
Enterprise-class testing and monitoring platform for websites, applications and APIs. Internationally distributed load testing and monitoring agents can regularly and programmatically check your targeted websites. web applications, API services, authentication services, certificates, DNS services, and more for performance and service-level compliance.
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Relay Test Set
Cambridge Instruments & Engineering Co.
“CIE” Relay Test Set is ideal for Testing Protective relay, over current relay, earth fault relay by secondary injection method with help of digital timer.
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In-Circuit Test Programming Services
Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Electric Power System Characteristics Test
This test is also known as the power supply line voltage and frequency variations test. A few of the measured characteristics are: voltage and frequency modulation, voltage spike, and voltage transient recovery.
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Automated Fibre Loss Test Set
LTS-1500
The LTS-1500 is a small, rugged automated fiber optic loss test set that characterises singlemode fiber links at wavelengths of 1310, 1490 and 1550 nm. It is comprised of a sensitive InGaAs based optical power meter calibrated at six wavelengths with better than -75 dBm noise level plus a stabilised laser light source with up to three selectable wavelengths.
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CAM/GATE Test Kits
Series 45
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operati...show more -
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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EFI Test Light-GM SCPI
3414
Peaceful Thriving Enterprise Co Ltd
*Simply for testing: Disconnect the fuel injectors, plug in a Noid.*Quickly determines if the electrical signal present at the fuel injectors.*Light and crank the engine, a flashing Noid light indicates normal pulsing voltage.
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Laser Diode Life Test
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
