Dynamic Test System

The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.

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Topics

System Test
Test Systems
Test
Systems
PC Test
Control Systems
Control
Mainframes
Measurement
Parallel