Showing results: 436 - 450 of 451 items found.
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PerkinElmer Inc.
Get the sensitivity and throughput you need to image more samples and analyze more parameters with high content screening. Our high content screening instruments help you answer the most complex biological questions. With powerful yet simple imaging and analysis capabilities for a wide range of applications -- from basic research to assay development and screening -- these powerful high content screening microscope systems produce the highest possible image quality to take your research further, in less time than ever before, especially when combined with PerkinElmer's robotic systems and advanced data analytics.
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DP74 -
Olympus Corp.
The DP74 color camera for fluorescence not only advances the speed and ease with which you can obtain detailed, accurate images but also introduces for the first time the concept of Intelligent Imaging. With Intelligent Imaging, the camera analyzes the live image and automatically applies its technology to reduce processing time and produce quality images of even dim and challenging samples. Furthermore the camera can follow your stage movements to create in real-time a panoramic image with mapped zoom-outs, a great time saver for documenting your sample. The DP74’s wide field of view and unsurpassed live speed provide an on-screen experience closely matching the traditional ocular view, thanks to its expertly calibrated colors. Maximize your investment return on a shared laboratory instrument with the camera’s top resolution of 20.7 megapixels and the capability to work with brightfield and fluorescent samples alike. These features are compatible with any microscope, whether manual or motorized, making the DP74 a perfect solution for a smarter and faster imaging workflow.
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Instec, Inc.
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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MicroContact AG
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
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NGS 3500Z -
RMS Vision Systems Inc
This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.
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MDS-5000D -
Wuxi Tianmu Instrument Technology Co., Ltd.
1) the Integrated T -shaped Mirror Design, PROVIDING Superior Stability 2) Low-position Front Operation, Ergonomic requirements . 3) 6V / 30W Adjustable Halogen LAMP, PROVIDING Ample Bright Lighting System . 4) 3/8 splitting of Tube The trinocular , Observation and photography can be carried out simultaneous 5) Low-position mechanical moving platform to quickly locate the image 6) Professional flat-field metallographic objective lens, providing good resolution and clear image 7) Polarization Detecting partial inserts, related polarized light observation mode 8 )Five-hole rotary disc type color filter, easy to operate and switch 9) Adjustable field of view diaphragm and aperture diaphragm, providing good contrast metallographic analysis software system CCD camera will The optical image from the microscope is converted into a video signal, and the Sample image under the microscope is input into the computer through the image acquisition card / digital camera, and the digital image is processed and measured by the software, and finally the image and the measurement result are printed. Back up images and measurement data. General system:General image processing functions: image acquisition, data backup, depth of field expansion, grain boundary reconstruction, image stitching, image calculation, filtering, Image annotation, image segmentation and processing, accurate printing. Professional analysis system: 1. Rating: based on inspection Standards, more than 200 software functional modules in more than 100 categories.
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Klocke Nanotechnik
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
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Hinds Instruments, Inc.
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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FIB -
JEOL Ltd.
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Hyper Vision HPV-X2 -
Shimadzu Corp.
Medical science and engineering have made dramatic progress thanks to visualization technology. Examples include the invention of microscopes capable of enlarged observations of phenomena occurring in the microscopic domain, invisible to the human eye, X-ray inspection systems, which enable the observation of images utilizing light at imperceptible wavelengths, and infrared cameras. Our eyes are incapable of capturing phenomena occurring at times shorter than 50 to 100 ms. As a result, high-speed video cameras have become necessary in order to record phenomena occurring at intervals that cannot be seen with the human eye, and then replay them at a slower rate so that they can be visualized. As the standard tool for visualizing ultra high-speed domains, the Hyper Vision high-speed video camera contributes to our understanding of ultra high-speed phenomena in a variety of fields.
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AEP Technology
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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AMS Technologies AG
Any type of fiber optic interconnection requires its interfaces to be free of dust and scratches in order to reach the lowest transmission loss. Small, handheld and battery powered inspection tools are available from AMS Technologies for inspection of fiber optic connectors in the field as well as high resolution type microscopes suitable for use in a production environment for qualifying the endface preparation. Additional S/W tools can support the user in making a quick decision if a certain defect is acceptable or if the surface fault disqualifies it for further use. Small and lightweight test equipment for measurement of the transmitted power in an optical fiber is needed wherever technicians handle optical fibers. Our product portfolio comprises light sources for various wavelengths, power meters for the visible and infrared and integrated solutions for sources and meters as well as optical time domain reflectometers (OTDR) coupled with visible wavelength light sources for easy fault detection within a fiber optic link.
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InSight X3 -
Spectra-Physics
Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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DCS-120 -
Becker & Hickl GmbH
*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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DCS-120 MP -
Becker & Hickl GmbH
*Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software
