Showing results: 421 - 435 of 451 items found.
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900-392 -
Phase II Plus
The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
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P200L or P300L -
The Micromanipulator Company
The Micromanipulator P300L 300mm semiautomatic probe station comes standard with features such as single-point ground and integrated thermal chuck plumbing. Built for reliability as well as precision, the P300L features leadscrew – leadnut stage and platen drives, a stainless steel platen with removable front wedge and high stability microscope bridge that supports all high resolution long-working distance microscopes.The P300L ‘s versatile controller supports USB and GPIB communications (configured with proper options). The stage X-Y and platen (Z) are motorized / programmable. Microscope motorized / programmable control is also an option. The system may be controlled via scripts and all popular parametric test analytical prober drivers. An indexing script with user GUI and a Labview VI is provided allowing use of the system right out of the box.Micromanipulator strives to ensure our semiautomatic systems are flexible so that applications like Magnetic sensitivity testing, Probe cards, mmW, Wafer & Board level testing. Once you have developed your testing plan we also have great relationships so we can move you into a fully automatic probe station if needed.Joystick control allows for easy and quick operation when programmability is not required. The joystick intuitively operates the station stage, platen, and microscope for systems so configured.The P300L may be configured with a local dry / shielded / dark environment “Top Hat” for low level or low temperature, frost free probing. Three temperature ranges are supported:Ambient (room temperature) to 300C0C to 300C-55C to 300CThe P300L is the station of choice for a high performance, full capability and cost-effective 300 mm semi-automatic probe station.
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Mighty Light -
Spectrolight, Inc.
The Mighty Light is a compact white light source that is ideal for microscopy, spectroscopy, machine vision, and spectral imaging applications. The Mighty Light integrates a tungsten halogen bulb and power supply with a control board that delivers uniquely low-noise output. A series of pre-aligned bolt-on accessories allow the broadband output to be coupled into a fiber or fiber bundle, homogenized and collimated, directly coupled into a microscope, or integrated with our unique Wavelength Selector devices to create a tunable, monochromatic beam.
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InfraScan™ 400TDM -
Checkpoint Technologies, LLC.
The InfraScanTM 400TDM is the newest evolution of Checkpoint's pioneering top-down laser scanning and emission tools. This tool is specifically designed to accommodate any commercially available probe station, up to 300 mm wafers. The combination of Checkpoint Technologies, world leading laser scanning microscope and its best in class emission system into a single tool, gives users the most sensitive and easy to use system on the market. The TDM can be configured with up to 3 lasers and a choice of InGaAs, MCT or Si CCD emission cameras.
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LabRAM Odyssey -
HORIBA, Ltd.
Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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LIGHTiX -
Unity Semiconductor SAS
Next generation macro inspection system (AOI).• All-side wafer inspection: Front, back and edge inspection.• 100% defect images without throughput impact.• Integrated high-end microscope review.• True Color Inspection (TCI) technology.• Advanced CD, 2D/3D, OVL and EBR metrology.• Automatic defect classification• Best in class cost of ownership for high resolution AOI• High-speed patterned wafer inspection• High defect sensitivity• ISO Class 1 certified• Tool – to – tool matching
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MicroImage Video Systems
Video Inspection Systems with?or without measurement capabilities are an excellent way to evaluate and test small items or items in?difficult to access locations. Many options are available in addition to the measurement capability. Video Inspection is used for a variety of purposes including the ability to see? and measure items that are much smaller than the eye can see or that hand tools can measure. Video systems can also reduce the eye and/or back strain associated with production environments where an operator must look in a microscope all day.
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PInano -
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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PSA300 -
HORIBA, Ltd.
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Qualitest International Inc.
Using a carbide ball penetrator, and applying loads of up to 3,000 kgf, Brinell hardness tester following ASTM E-10 are widely used on castings and forgings. This method requires optical reading of the diameter of ball indentation, and using a chart to convert the average measurement to Brinell hardness value. We offer low cost handheld Brinell scopes as well as a popular line of Automatic Brinell Microscopes for high frequency of testing. . Qualitest also offers Automatic In-line hardness testers for high volume testing.
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ECOPIA
Ecopia's LED tester is good to measure both electrical(I-V curve) and optical(Spectra, Light intensity) properties of LED chip, LED lamp, SMD type at the same time.It also makes it possible to see LED sample's construction , seeing through microscope. LED tester main body flow input current ,and emitted light from the LED sample is focused on lens of microscope.From this process, our LED tester can provide repeatable tested results and minimize error values and improve convenience of how to use.
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EDS (SEM) Applications -
Amptek Inc.
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
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Sinowon Innovation Metrology Manufacture Ltd.
◆ Perfect Accuracy——±3% HV, ±1.5HR, ±3%HB.◆ Microscopic Indentation—— Only high-power microscope can observe the indentation.◆ Quick Measurement——Result in 2 seconds.◆ Large LCD Display——Directly display measurement result, times count, maximum, minimal, average and deviation.◆ Friendly Operation——Operate well after short training.◆ Promised Warranty——2-Year warranty for main unit (Excludes Probe).◆ Mass Storage——Save 1000 groups measurement data.◆ Simple Calibration——Save 20 groups calibration data for invoking, improve calibration efficiency.
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SEM -
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Agilent Technologies
Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
