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Showing results: 391 - 405 of 451 items found.

  • Magnetic Field Cancelling System

    MR-3 - Stefan Mayer Instruments

    3-axis magnetic field cancelling system for electron microscopes (SEM and TEM), electron and ion beam experiments, nanotechnology, biomagnetic investigations, etc. High reliability through rugged analog design. No tedious programming, no chrashs. More than 1000 MR-3 systems sold worldwide.

  • Versatile Test Stand

    VTS-2100 - Applied Scientific Instrumentation

    *Base is a Breadboard on 25 mm centers tapped for M6 screws with threaded holes for risers for TE/TI-2000, TE-300, IX-71/81, DMI, and MS-2000 stages.*Base feet provide vibration isolation.*Z riser is adjustable on pillar blocks.*Z motion from LS-50, LS-100, or LS-150 linear stage.*Z illumination can use LED, LED and a Condenser (from below), or fiber illumination (from above).*Observation is with a Modular Infinity Microscope.

  • Light Source

    pE-300white - CoolLED Ltd.

    CoolLED's pE-300white offers intense, broad-spectrum LED illumination for imaging most common fluorescent stains. The pE-300white Light Source can be fitted directly to the microscope or specified with a liquid light guide. The system is a mercury-free alternative that is safer, more controllable, and repeatable than conventional high-pressure gas discharge illuminators. Spectral coverage is from the UV (DAPI excitation) to the Red region (Cy5 excitation). The system is perfect for hospital and regular research laboratory environments.

  • Failure Analysis

    MicroINSPECT 300FA - Microtronic, Inc.

    The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.

  • Osmometer

    LD-LOSM-A10 - Labodam

    OsmometerLD-LOSM-A10is colorful LCD touch display with sample size 50 μl to 100 μl and measuring range up to 0 to 3000 mOsmol /kg H2O at ambient temperature 10 to 30°C. Features with on-screen display of molar concentration, freezing point, and osmolarity. At very low testing time it provides fast and accurate osmolality test results. Applicable in General medicine, Routine and research, Forensic medicine, Electron microscope.

  • Optical Filter Sets

    Idex Health and Science

    Our filter sets support a great range of fluorophores for microscopes and imaging systems. Patented design techniques drive some of the most spectrally sophisticated optical filters on the market. High transmission, steep edges, precise spectral edge placement, and optimized blocking combine for more reliable measurements. A wide selection of individual bandpass filters and dichroic beam-splitters support unique applications, and world-class manufacturing and cutting-edge metrology ensure consistent performance that always meets specifications.

  • Easycheck Fiber Endface Inspector

    CA3002 - UC Instruments, Corp.

    The integrated style design makes the size compact and operation easy. You are no longer to worry about so many cables between monitor and microscope, greatly saving the time for operation and worktable space, thus creating more productivity. Easycheck have a series different model according to different application, it has photo capture function; for transceiver checking; X、Y adjustable; image auto analysis and judgement, etc. The user can choose the desired model per the requirement.

  • X-ray Microscopy

    ZEISS Xradia Versa - Carl Zeiss AG

    Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.

  • Advanced Stand-Alone AFM

    SmartSPM - HORIBA, Ltd.

    The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).

  • Probe Card Analyzers

    PB1500 - Integrated Technology Corp.

    The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.

  • Laser Scanning and Emission Tools

    InfraScan™ ES400 - Checkpoint Technologies, LLC.

    The InfraScanTM ES400 family provides the groundbreaking combination of Checkpoint Technologies, world leading laser scanning microscope and its best in class emission system into a single tool. This combination tool allows Checkpoint customers to configure the tool with either laser scanning only, emission only or the combination of the two. Best of all, the upgrade path to a complete combination tool is easy for future expansion at the customer's site. Lastly, the ES400 can be fitted with Checkpoint's proprietary industry leading Solid Immersion Lens objective.

  • Powerful, Fully Integrated Workstation for Emission Microscopy

    PEM-1000 - Korima, Inc.

    The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.

  • Smart G-Scope

    Dou Yee Enterprises (S) Pte Ltd

    Auto focus digital microscope & telescopeReal fast auto focus by using liquid lensInfinity(x10) ~ Contact (x250) hole area auto focus by changing mode switchAuto focus & manual focus functionChangeable various End caps to support 3pi coner end capHigh luminance OLED displayInfrared wireless controlSupport Android & Windows (XP, Win 7, Win 8)Various image filters & digital zoom functionSpecial design for portablility (aluminum case) No battery neededProvide software for Android and PC

  • White Light LED Illumination System

    pE-300lite - CoolLED Ltd.

    CoolLED's pE-300liteis a simple white light LED illumination system that offers intense, broad-spectrum LED illumination for imaging most common fluorescent stains. The pE-300lite Light Source can be fitted directly to the microscope or specified with a liquid light guide. The system is a mercury-free alternative that is safer, more controllable, and repeatable than conventional high-pressure gas discharge illuminators. Spectral coverage is from the UV (DAPI excitation) to the Red region (Cy5 excitation). The system is perfect for hospital and regular research laboratory environments and is affordable within consumables budgets.

  • Automated Semiconductor Wafer Optical Inspection and Metrology

    SITEview Software - Microtronic, Inc.

    Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.

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