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Avionics Data Bus Tester
CORVUS-300
CORVUS-300 is an all-in-one avionics data bus tester combining Bus Monitoring, Time-Domain Reflectometer and Wire Mapping capabilities. Its modularity allows the addition of a Vector Network Analyzer or a Spectrum Analyzer based on testing requirements. CORVUS-300 is stock-listed, NSN 6625-01-703-0413, and managed by AFSC/PZAAC.
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Professional Mapping Drone
eBee Plus
eBee Plus system includes: long-flying fixed-wing airframe; photogrammetry-optimised RGB sensor; next-gen flight & data management software . The eBee Plus can map more square kilometres per flight. The eBee Plus includes built-in RTK/PPK functionality that can be activated either out of the box or later when required. The eBee Plus offers a camera to suit every application, including the senseFly S.O.D.A. (supplied), the first camera designed for photogrammetric drone mapping.
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Pressure and Force Measurement Systems for R&D, Testing, and Quality Assurance
Tekscan is the leading manufacturer of tactile pressure sensors and measurement systems. Our pressure mapping systems are used by product designers and test engineers throughout the research, design, testing, and manufacturing cycle to verify and enhance product performance. The informative data allows companies to save money in design, design verification, reengineering, and machine set-up costs.
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Semiconductor Technology, Micro Scriber + Meters For Contact Angle And Surface Tension
SURFTENS WH 300
Optik Elektronik Gerätetechnik GmbH
The leading equipment for professional use in 200 and 300 mm wafer processing in semiconductor technology. SURFTENS WH 300 is equipped with a 3 axis wafer robot, wafer scanner, loadport for 200 and/or 300 mm wafers, fan filter unit, notching system. Suitable for any cleanroom class it features the automatic mapping of contact angles on wafers for up to 25 wafers.New: with SECS/GEM Interface!
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Vison Inspection System
High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Photoluminescence Mapping System
VS6845A
Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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Motion Control Components
- Control of versatile robotic structures, including "yaw", "pitch" and "roll" motion capabilities- S-curve velocity profiling, based on polynomial splines and Bernstein-Bezier curves- Continuous path control in multi-segment smooth trajectories- Synchronization of multiple axes- Trajectory control with user defined velocity profiles- Kinematical modeling of open and closed loop mechanisms- Singularity consistent path planning and singularity avoidance- Optimal PID filter tuning- Automatic adjus...show more -
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LAN Cable Tester PRO
PK-168 NextPRO S2
PK-168 is capable of wire mapping by pin & pair up to 600 meters,PK-168P: Remote unit come with PoE detector. It detects presence of PoE and displays type of PoE either end-span A or mid-span B or ultra power over 4 pairs and either 802.3af (PoE) or 802.3at (PoE+) is present.
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Sorter
IV-200I
IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Wafer & Die Inspection
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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PORTABLE PRESSURE MAPPING
I-SCAN® HANDHELD SYSTEM
Handheld pressure measurement system for collecting tactile pressure data.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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USB Reusable Temperature and Humidity Data Logger
This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports ar...show more -
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Semi-automatic 150mm Probe Station
CM460
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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Real-time Ocean Data Solutions
Saildrone is the world leader in providing ocean data solutions with uncrewed surface vehicles, offering unrivaled payload, range, and reliability. Saildrone vehicles have sailed almost 1,000,000 nautical miles and spent almost 25,000 days at sea collecting data that provides unprecedented intelligence for climate, mapping, and maritime security applications.
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Wafer Mapping Sensor
M-DW1
Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Fast Portable Spectral Sensors
Turbo FT
This compact field and industrial instrument is used for both ground based and airborne applications requiring high speed spectrometry, and utilizes our patented Turbo FT technology. Applications in remote sensing for geological mapping, airborne chemical agent detection, and online process control systems. Our rugged and compact design allows you to "Take It There".
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Chamber Simulator System
BroadSim Anechoic
Built on our proven BroadSim platform, BroadSim Anechoic allows users to accurately simulate real-world GNSS environments in their Anechoic Chambers. BroadSim Anechoic has 32 individual RF outputs enabling the system to drive 16 dual-frequency antennas. Revolutionary features like automatic antenna mapping, automatic time delay calibration, and automatic power loss calibration are what make BroadSim Anechoic the most advanced Anechoic Chamber simulator on the market today.
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Epi Thickness & Composition System
Element
The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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Digital Broadcast Analyzer
Spectrum Analyzer: 9 kHz 4 GHzInterference Analyzer with Interference MappingHigh Accuracy Power Meter, 2-port Transmission MeasurementsCoverage Mapping, Channel Scanner, GPS, AM/FM/PM Analyzer3GPP, 3GPP2, WiMAX, signal analyzersTracking Generator: 500 kHz 4 GHzDigital TV ISDB-T, DVB-T/H analyzersCPRI RF MeasurementsField-proven design: Three-hour battery life, rugged, compact, lightweight, daylight viewable displayIntuitive menu-driven touchscreen user interfacePIM Alert (a downloadable easyTest script)Standard three-year warranty (battery one-year warranty)
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Measurement Services
API offers on-site dimensional inspection, 3D scanning, machine tool and robot error mapping and calibration, laser tracker calibration/verification.
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Multibeam Echosounder - Deep Water
HydroSweep MD/50
The HydroSweep MD/50 is a high resolution multibeam echosounder ideally suited for seabed mapping in mid and shallow water based on a sonar frequency range between 52 kHz to 62 kHz. Beside bathymetric depth information from 5 m to more than 2000 m, sidescan data and backscatter data for seabed classification can be acquired.
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Gravity Meter
CG-6 Autograv™
The CG-6 Autograv™ is the next generation land gravity meter combining a modern, intuitive user interface with our renowned quartz sensor technology housed in a rugged yet lightweight enclosure. The new CG-6 offers fast, reliable and precise gravity measurements and includes an array of mapping and post processing functionality with our new Lynx LG software conveniently installed on the tablet computer, provided as a standard feature.
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FTIR Microscopes & Imaging Systems
Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Coaxial Cable Tester
6106
Peaceful Thriving Enterprise Co Ltd
This device is designed to test the connection of F type coaxial cable. The testing includes continuity and cable mapping. The tester includes 4 mapping terminals with different color and a F type adapter, which are very helpful for cable identification.
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Inertia lnavigation for Civil Engineering
Exail's Attitude and Heading Reference Systems (AHRS) and Inertial Navigation Systems (INS), incorporate Fiber-Optic Gyroscopes for reliable performance in civil engineering. Suited for tunneling, mining, construction, railway, and mobile mapping, these systems excel in challenging environments like GNSS-denied areas, ensuring undisturbed navigation, accurate georeferencing, and precise pointing amid obstacles such as buildings, trees, tunnels, and mines.
