Showing recent results 1 - 15 of 155 products found.
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Vivax-Metrotech Corp
It represents a comprehensive approach to surveying and mapping underground utilities. It is fully integrated with the Trimble® Access surveying environment, and operates seamlessly with Trimble® GNSS receivers, may be used with Trimble® Total Stations and is available from many Trimble® dealers
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GRIP™ SYSTEM FOR R&D - Tekscan, Inc.
Tactile pressure sensing system that quantifies forces applied by the human hand while grasping objects.
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NIP PRESSURE MEASUREMENT SYSTEM - Tekscan, Inc.
A completely wireless system for measuring nip pressure between rollers in real-time
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TIRESCAN - Tekscan, Inc.
Complete pressure imaging system for conducting tire tread analysis.
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HIGH SPEED I-SCAN® SYSTEM - Tekscan, Inc.
Tactile pressure and force measurement system capable of measuring
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WIPER - Tekscan, Inc.
Evaluate wiper blade force profiles and interface pressure distribution.
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CONFORMAT® SYSTEM FOR R&D - Tekscan, Inc.
Tactile pressure measurement system utilizing a fully conforming array pressure sensor.
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BPMS - Tekscan, Inc.
Measure pressure distribution between the human body and support surfaces such as seats, mattresses
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M-DW1 - Panasonic Electric Works Corporation
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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eBee Plus - senseFly SA
eBee Plus system includes: long-flying fixed-wing airframe; photogrammetry-optimised RGB sensor; next-gen flight & data management software . The eBee Plus can map more square kilometres per flight. The eBee Plus includes built-in RTK/PPK functionality that can be activated either out of the box or later when required. The eBee Plus offers a camera to suit every application, including the senseFly S.O.D.A. (supplied), the first camera designed for photogrammetric drone mapping.
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RPMBlue-FS - Nanometrics Incorporated
The RPMBlue-FS is a photoluminescence mapping tool that can be fitted with a robotic wafer handler if needed. This tool has a very flexible configuration with a full specification spectrometer that can cover wavelengths from the deep UV to 2 microns or more. With room to fit up to four laser excitation sources and two array detectors while handling wafer sizes from 2" to 6", this high-speed room temperature PL mapper can meet the needs of almost all compound semiconductor users.
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XCell - Giatec Scientific Inc.
Giatec XCell™ is a smart tablet-based NDT probe for fast, accurate and efficient detection and on-site analysis of corrosion in reinforced concrete structures. Giatec XCell™ meets all the requirements of the ASTM C876 standard specification.
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Model 1510E-RP - Lehighton Electronics, Inc.
*Characterization of all compound semiconductor materials**EPI, Annealed Ion-Implants on Semi-insulating and some doped substrates*Silicon wafers**bulk Si, EPI, annealed ion-implants, and POCl3 doping uniformity on high resistivity substrates*Thin film metallization**Contact factory for details*Measurement Capabilities**Sample thickness range of 450 to 800 microns**Normal coil gap (>/= .035”/.889mm)**Robotic handling of 2” (50mm) to 8” (200mm) wafers
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Model 1510E-RS - Lehighton Electronics, Inc.
*Sample thickness range of 450 to 800 microns*Normal coil gap (≥ 0.035”/ .889 mm)*Robotic handling of 2” (50 mm) to 8” (200 mm) wafers
