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Mapping
See Also: Wafer Mapping, Survey
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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VDV MapMaster 3.0 Cable Tester
#T130
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The VDV MapMaster 3.0 combines continuity testing, mapping, generating tones and length measurement functions into a single easy-to-use unit for installation, troubleshooting, and maintenance for telco, network, or coax cable.
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Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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Package Leak Detectors
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Package leak detectors ensure that seal integrity problems are identified. This is a vital part of Modified Atmosphere Packaging (MAP) quality control, since compromising the protective atmosphere will cause a reduction in the shelf-life of MAP products.
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Half-Cell Corrosion Mapping
XCell
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Giatec XCell™ is a smart tablet-based NDT probe for fast, accurate and efficient detection and on-site analysis of corrosion in reinforced concrete structures. Giatec XCell™ meets all the requirements of the ASTM C876 standard specification.
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Product
Spectroscopy Applications
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Anadis Instruments Benelux b.v.
Spectroscopy has become a powerful tool leading to a broad range of applications, as can be seen in the map below. From the lesser known FT-IR analysis of lipid structures in skin (of interest when applying medicines to the skin as well as in studying the effects of skin aging) to the widely used measurement of additives and the octane number (RON, MON) in fuels. Using spectroscopic techniques has many advantages. The technique is non-destructive; almost any sample can be studied in virtually any state. The techniques are applicable off-line, in-line, at-line or on-line. Identification als well as quantification is possible. Check the map with applications, it will be regularly updated and expanded.
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Product
Terrameter LS 2
ABEM
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Now Guideline Geo is introducing a new unique IP feature using 100 % duty cycle. This means twice as fast data collection and double the signal to noise ratio compared to the conventional IP method (50%) using the same settings.Resistivity/IP surveying is a versatile geophysical method suitable for a broad range of applications and environments such as groundwater prospecting, mineral exploration, geological mapping and geotechnical investigations. Depending on the application used, system designs can vary. ABEM Terrameter LS 2 has been made available in many different configurations to perfectly match your requirements.
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Geospatial services
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Siradel develops advanced solutions that turn data into powerful decision-making tools with our innovative approach that combines advanced mapping, AI-driven analysis, and 3D modeling.From in-depth analysis to strategic planning and optimization, we help you visualize, interpret, and maximize the value of your data—empowering smarter, more efficient project execution.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Easy3DMatch
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Align a scanned 3D object with another scan or with a reference meshCompute the local distances between 3D scans and a golden sample or reference meshDetect anomalies such as misplaced features, geometric distortions, gaps, bumps,...Compatible with all 3D sensors that produce point clouds, depth maps or height maps
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Infrared Cameras
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Nowadays, temperature measurement is closely linked to this new type of equipment, capable of fully mapping any kind of surface. HT offers a wide range of Infrared Cameras for any kind of requirement and use.
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Product
ADVANCE | Drop Shape
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ADVANCE is an example of how even the most complex measuring tasks, such as determining the surface free energy (SFE) of a solid, can be represented on a clear and easy to use interface. With just a few intuitive editing steps you can prepare software-controlled contact angle measurements utilizing every degree of automation up to complete SFE measurement, position mapping, or tilting experiments. Using our Liquid Needle dosing technique, ADVANCE even accesses the SFE of a surface within just one second.
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Product
Solar Cell Systems
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he Solar Cell Scan is a multifunctionalexperimental platform,which is based on the measurement of Quantum Efficiency (QE) . The system employs a turnkey integrated design, which can carry out QE, Reflectivity and Mapping testing functions automatically. There are also modular and customdesigned accessories to adapt to different solar cell samples.
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Product
Epi Thickness & Composition System
Element
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The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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Product
SSD
M.2 SSD (MLC)
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Innodisk M.2 (S42) 3ME4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Vector Data
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L3Harris Geospatial Solutions, Inc
Need digital vector maps? We have a large selection of maps available for purchase that include vector line, polygon, and point data sets for all areas of the world. These include U.S. Land Use / Land Clutter data, Garmin Digital Vector Maps, AW3D Data Sets, major world linear and point features as well as access to detailed international city mapping. We’ll work as your unbiased broker to deliver the right mapping data or create a fully customized product to meet your needs.
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RF Near Field Scanner
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The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Magnetic Susceptibility Meter for Multi-Layer Survey
MULTI KAPPA
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Multi Kappa instrument serves for fast field survey allowing both spot measurement and mapping by means of several probes. Together with GF Instruments traditional pocket magnetic susceptibility meters cover wide range of demands for accurate susceptibility measurement on ground surface, outcrops and samples of rock and soil. geological survey, archaeology, agriculture and forestry, raw material prospecting, mineralogy, sedimentology, detection of metallic objects, UXO survey.
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Product
Inline Planer Moisture System
MC Pro 2500
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Maximize grade recovery with SCSFP’s highly accurate lineal planer meter. A full moisture map of each piece ensures you are properly tracking moisture content at the planer. The system easily couples with lineal auto graders for moisture content handoff. Integration via ProTrac software, with barcode or manual tracking, provides advanced kiln analysis and drying reports.
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Wireless Protocol Emulation
MAPS
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Message Automation & Protocol Simulation (MAPS™) is a protocol simulation and conformance test tool that supports a variety of protocols such as SIP, MEGACO, MGCP, SS7, ISDN, GSM, MAP, CAS, LTE, UMTS, SS7 SIGTRAN, ISDN SIGTRAN, SIP I, GSM AoIP, Diameter and others. This message automation tool covers solutions for both protocol simulation and protocol analysis. Along with automation capability, the application gives users the unlimited ability to edit messages and control scenarios.
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USB Reusable Temperature and Humidity Data Logger
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This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
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Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Cable Tester
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The MapMaster™ mini detects faults and locations of RJ45 network cables. Good terminations, causes of faults and locations of cables are displayed on an LCD display. A set of five mapping remotes is included for locating cables terminated in wall jacks or patch panels. A built-in tone generator with 4 different tone combinations can be used with a tone probe to detect where a cable is routed and the location of the end of the cable.
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*TestTools for Lab & Feild
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Analyzer designed to be used on the field to generate maps including measurements of the field quality of service, enabling identification of reception issues and efficient troubleshooting.
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WDXRF Spectrometer
S8 TIGER Series 2
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Thanks to HighSense technology the S8 TIGER Series 2 WDXRF spectrometer delivers for all elements accuracy and precision for industrial quality and process control. With high resolving WDXRF technology and optimal detection of light, medium and heavy elements based on the new HighSense beam path, the XRF2 mapping tool of the S8 TIGER Series delivers best sensitivity, smallest spot size, and highest resolution for small spot applications. Ergonomic and failsafe operation are vital for efficiency and best analytical data. Simple, intuitive start of samples are guaranteed with the multilingual TouchControl interface.
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Product
RANGER-ULTRA
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The RANGER-ULTRA is an airborne laser scanner with an impressive combination of weight, range, accuracy and pulse rate. It is equipped with a unique forward and rear looking FOV designed to minimize laser shadowing and provide geometry on complex vertical structures on a single pass. With its wide field of view of 100 degrees and an extremely fast pulse repetition rate of up to 1.8 MHz, the RANGER-ULTRA is perfectly suited for high point density corridor mapping applications such as power line, railway track and pipeline inspection.
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High-Definition Distributed Fiber Optic Sensing
ODiSI
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Luna’s ODiSI system provides the world’s highest resolution distributed fiber optic sensing solution for strain and temperature measurement. Using low-profile optical fiber as sensors, the ODiSI system maps strain and temperature fields with sub-millimeter spatial resolution, providing unprecedented detail and data insight.
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Product
Field Portable NIR Spectrometers For Mineral Identification And Analysis In Mining Exploration
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With Spectral Evolution field portable NIR spectrometers and EZ-ID mineral identification software, geologists can measure and identify minerals within seconds and cover more ground than by using traditional methods. They can identify different mineral phases, create mineral alteration maps and more accurately identify mineral pathfinders for vectoring to ore deposits. Spectral Evolution's field portable, battery-operated oreXpress, oreXplorer and oreXpert ultra-high resolution NIR spectrometers are designed for mineral identification in mining exploration. The oreXpress, oreXplorer and oreXpert provide quick payback with faster, more accurate mineral identification in exploration for gold, silver, diamonds, iron, nickel, copper, uranium, aluminum - in the field, core shack, or in the lab, and provide:
