Mapping
See Also: Wafer Mapping, Survey
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NEXTest 7
PK-2030/2032/2033/2036/2037/2038
NEXTest 7 is an advanced and unique tester in the market. It's designed to check and troubleshoot the pin connections of Display port & HDMI prior to installation on equipment. By using advanced technology to verify the integrity (20 pins + shield) of both display port and HDMI cables, especially for HDTV installation and DIY termination in the field, solving your cable testing need, unlink all of the other testers verify 9 circuits only. It checks for opens, shorts, miswires and intermittent faults in all conductors plus shield continuity, most tester only test for opens. It displays cable map results of both TX (near end) and RX (far end) on the main unit, either on testing before or after installation cables. User can easily read and determine the actual 21 pins configuration on main unit. It employs both auto and manual scanning of 21 wires. Tone Generator mode transmits two selectable tones on each pin for use with Net Probe (PR-06P) optional, enables one to quickly locate a cable. It's capable of testing up to 8 cables and locations at one time. NEXTest 7 especially features a self-learning mode to memorize cable pin out for testing large quantity standard or custom cables for PASS/FAIL a snap, makes testing quick and more efficient.
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Measurement Services
API offers on-site dimensional inspection, 3D scanning, machine tool and robot error mapping and calibration, laser tracker calibration/verification.
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Wafer & Die Inspection
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Digital Map Systems
Elbit Systems of America’s Global Digital Map Unit is built on a proven design that accommodates multiple data formats and provides unmatched situational awareness to aircrews. The GDMU displays detailed map, flight plan, and threat information to aircrews. Each system performs interactive functions with the mission computers and generates digital video map data for head down displays.
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Die Sorter Handler
4605-HTR
4605-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by film frame test handler or prober. 4605-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.
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Inspector
Inspector BLE
*Inspector BLE works with smart phones and computers across all the platforms.*Log and Map Data*Share Data with RadResponder, Safecast, the World, or create your own Private Network
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Rotating Machinery Analysis
The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Turnkey Solution for Unattended Noise Monitoring
NoiseScout
NoiseScout provides a comprehensive but easy-to-use 24/7 noise monitoring solution. Noise levels are recorded on-site by the XL2 Sound Level Meter and are available online for monitoring and download. NoiseScout is aimed at both short term noise assessments and long term monitoring applications. During acquisition, automated email alerts allow noise issues to be addressed before a non-compliance condition arises. NoiseScout displays the noise levels measured by the XL2 Sound Level Meter live in your web browser. The measurement data recorded out in the field is presented online in charts and dashboards. Multiple noise level meters can be monitored simultaneously within the map view, thus providing localized geographic visualization for all noise levels at a glance. Identified users can access all their projects, control their monitors or create basic view modes, allowing stakeholders to oversee their noise level data.
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Geospatial Data & Imagery
L3Harris Geospatial Solutions, Inc
Since 1951, we have provided customers with cutting-edge geospatial data and imagery products. Through the years, we have earned a reputation as an unbiased consultant who identifies the right data to solve customer’s problems and meet specific project requirements. Our highly-skilled staff of photogrammetrists, programmers, and imagery scientists draw upon their vast experience as well as access to a multitude of data types from the top vendors around the world. We offer the most robust selection of geospatial products worldwide including high-resolution, commercial satellite imagery, aerial maps, digital elevation model (DEM) data, topographic maps, and more.
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Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Multisite Probe Card
T300 ButtonTile™
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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In-Circuit Emulator
DS-XA
* Emulates XA Derivatives * 2MByte Code and Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 30MHz @ 5V * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software for Windows NT and 95 or Later * 3.3V And 5V Emulation Support * Support for ROMless and ROM Microcontrollers * PLCC Emulation headers
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6U OpenVPX PMC/XMC rear transition module.
EnsembleSeries™ RTM60P
*High-density connector and breakout cable to access to RS-232/RS-422 serial and 10/100/1000BASE-T Ethernet interfaces*Four 9-pin serial interfaces and four RJ45 Ethernet interfaces via the breakout cable*Standard VITA 57 FMC connectors that map to the PMC and XMC user I/O connections from the HCD6220 or HCD6410
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Semi-automatic 150mm Probe Station
CM460
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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FTIR Microscopes & Imaging Systems
Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Terrameter LS 2
ABEM
Now Guideline Geo is introducing a new unique IP feature using 100 % duty cycle. This means twice as fast data collection and double the signal to noise ratio compared to the conventional IP method (50%) using the same settings.Resistivity/IP surveying is a versatile geophysical method suitable for a broad range of applications and environments such as groundwater prospecting, mineral exploration, geological mapping and geotechnical investigations. Depending on the application used, system designs can vary. ABEM Terrameter LS 2 has been made available in many different configurations to perfectly match your requirements.
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SCOUT-M2X
The SCOUT-M2X is the ideal combination of performance, flexibility and affordability. It brings a new level of precision and accuracy to the long trusted SCOUT lineup of multi-channel mapping scanners.
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GPGPU Board
GRA115Q
The GRA115Q is a rugged 3U VPX graphics output and high-performance computing GPGPU board based on the NVIDIA Turing™ architecture. It is an ideal solution for graphics/display processing applications such as situational awareness, and moving map applications as well as general purpose graphics processing unit (GPGPU) applications such as radar and video surveillance/analysis.
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NEON Squad Tracker
Accurate location information is critical for enabling improved navigation, situational awareness, targeting, and mapping. GPS-may be denied in triple canopy, urban canyons or indoor and subterranean environments, and can be easily jammed or spoofed. NEON Squad Tracker uses a suite of patented algorithms to opportunistically fuse inertial sensor data, GPS (including resilient GPS sources), warfighter waypoint check-in), and ultrawideband shared constraints and "dropped beacons", along with position location information from third party systems sources (psueodolite, satellite, etc.) to deliver reliable GPS-denied location. Features:Sensor fusion for dismount personnelFlexible 3rd party constraint processingIntegrates with resilient PNT sourcesWarfighter map/waypoint check-inUWB ranging and constraint sharingOperation indoor, underground, and outdoorsAPI delivers warfighter location, motion, gait
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Advanced 4-CH Encoder Card with High-speed Triggering Function
PCI-8124-C
PCI-8124-C is a 4-CH trigger board which is suitable for advanced line scan application which need high line rates. PCI-8124-C has internal FIFO to realize the high speed position compare and trigger pulse output. For this application, ADLINK proposes you can use PCI-8134 and PCI-8124-C together to gain the advantage of motion control and high speed trigger function. For position compare, PCI-8124-C provides two method: linear function or variable interval. PCI-8124-C also provides the variety of mapping function between comparator and trigger output. The comparator condition can be associated with latch signal, TTL input and EA/EB signal.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Field Portable NIR Spectrometers For Mineral Identification And Analysis In Mining Exploration
With Spectral Evolution field portable NIR spectrometers and EZ-ID mineral identification software, geologists can measure and identify minerals within seconds and cover more ground than by using traditional methods. They can identify different mineral phases, create mineral alteration maps and more accurately identify mineral pathfinders for vectoring to ore deposits. Spectral Evolution's field portable, battery-operated oreXpress, oreXplorer and oreXpert ultra-high resolution NIR spectrometers are designed for mineral identification in mining exploration. The oreXpress, oreXplorer and oreXpert provide quick payback with faster, more accurate mineral identification in exploration for gold, silver, diamonds, iron, nickel, copper, uranium, aluminum - in the field, core shack, or in the lab, and provide:
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Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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PCMCIA Card
DAS-429PCMCIA/RT10
Both cards contain 68 Kbytes of true dual-port RAM, for data blocks, control registers and Look-up table, mapped within the Common Memory space. The card also contains a FLASH-based Card Information Structure (CIS) within the Attribute Memory space.The cards comply with the Personal Computer Memory Card International Association (PCMCIA Release 2.1) standard, including Plug and Play. The card's small size and suitability for PCMCIA compatible notebook computers with Type II and Type III slots make it a complete solution for developing and testing ARINC-429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The cards are supplied with C drivers, including source code, Mystic Windows software and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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Werklicht® Video
*Projects measurement results on components, *In the form of false color or deviation maps or individual point readings *Adjusts the projection automatically to the position of the part. *Uses measurement data from conventional optical and tactile measurement devices. Is therefore an instrument for effectively communicating quality.
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Calibrators
TES Electrical Electronic Corp.
Unique mapping function let you calibrate temperature. iCal is a multifunction calibrator and an arbitrary function generator.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
