Mapping
See Also: Wafer Mapping, Survey
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Product
Software
Gate Oxide Integrity Option
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Materials Development Corporation
Oxide integrity of MOS devices can be evaluated by various techniques such as Time Dependent DielectricBreakdown, Charge to Breakdown, or ramped voltage. When used with a prober, map distribution of breakdown fields. Output the data using histograms, cumulativefailure, or Weibull plots.
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Product
SAM Software
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PVA TePla Analytical Systems GmbH
The high performance of our systems derives not least from their interaction with our specially developed software. This enables the comprehensive and precise mapping and analysis of all SAM data software.
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Product
Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Product
Stylus Profilometry
Dektak®
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Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Product
Wireless Network Penetration Testing
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LGMS wireless network penetration testing uses automated and manual penetration techniques to locate and map authorized and unauthorized wireless access points, review corporate access point configuration and then discover weaknesses that could allow an attacker to penetrate those networks. Potential internal and external threats are documented, and a recommended action plan is developed to address any security risks.
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Product
RANGER-LR 22 LITE
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The RANGER-LR22 LITE is the new lighter, long-range system configuration of our RANGER Series. Designed for the most demanding mapping applications, the RANGER-LR22 LITE is the ultimate combination of high density, long-range LiDAR with a powerful 1,550 nm laser and up to 15 returns that penetrate dense vegetation at high speeds and altitudes in large scan regions.
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Product
kSA Scanning Pyro
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For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
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Product
Fast Portable Spectral Sensors
Turbo FT
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This compact field and industrial instrument is used for both ground based and airborne applications requiring high speed spectrometry, and utilizes our patented Turbo FT technology. Applications in remote sensing for geological mapping, airborne chemical agent detection, and online process control systems. Our rugged and compact design allows you to "Take It There".
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Microprocessor Development System
DS-M8
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# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Product
Channel Emulator
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Qosmotec Software Solutions GmbH
Knowledge about channel models is not necessary to run tests with the QPER Channel Emulator. It applies the visualised virtual drive test concept, which is also used in the handover tester, to a fully fledged channel emulator: The tester outlines the network layout on the screen and defines a drive test route on the map. While running a simulated drive test, all channel effects are automatically calculated by QPER and applied to the channel emulation hardware.
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Product
Epi Thickness & Composition System
Element
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The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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Product
4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
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The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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Product
FTIR Microscopes & Imaging Systems
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Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Product
On-line MAP Gas Analyzers
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Our online MAP gas analyzers continuously extract and monitor packaging gas from the Modified Atmosphere Packaging line to ensure that the equipment and gas mixing system deliver a desirable protective atmosphere which meets the requirements for prolonged shelf-life products within the food & beverage and pharmaceutical industries.
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Product
Real-time Ocean Data Solutions
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Saildrone is the world leader in providing ocean data solutions with uncrewed surface vehicles, offering unrivaled payload, range, and reliability. Saildrone vehicles have sailed almost 1,000,000 nautical miles and spent almost 25,000 days at sea collecting data that provides unprecedented intelligence for climate, mapping, and maritime security applications.
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Product
NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
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Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Product
Vine-Shoot Diagnostics
FA-WOOD™
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FORCE-A offers a service for vine-shoot mapping. This spatial heterogeneity analysis is a support tool for crop management (pruning, fertilization, grass management) for the practice of a sustainable viticulture.
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Product
Werklicht® Video
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*Projects measurement results on components, *In the form of false color or deviation maps or individual point readings *Adjusts the projection automatically to the position of the part. *Uses measurement data from conventional optical and tactile measurement devices. Is therefore an instrument for effectively communicating quality.
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Product
Resistivity and IP Imaging System
ARES
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ARES represents a well equipped resistivity and IP imaging system. Groundwater explorations, geotechnical investigations, monitoring of dams and dikes, environmental studies, pollution plumes mapping, geological surveys, mineral prospecting, archaeology, detecting of cavities, underwater, marine, borehole and cross-hole measurements.
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Product
Measurement Services
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API offers on-site dimensional inspection, 3D scanning, machine tool and robot error mapping and calibration, laser tracker calibration/verification.
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Product
Pressure Mapping
TIRESCAN
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Complete pressure imaging system for conducting tire tread analysis.
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Product
Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
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*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Product
High Voltage Isolator for Logic Analyzers
LX-08
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The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.
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Product
IP and Port Monitoring Software
CallerIP
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IP and Port monitoring. See all incoming and outgoing connections made to your computer. Including process names, remote and internal port numbers and much more. Automated alerts bring your attention to illegal connections. Automated Alerting. Set up alerts to warn you of intruders and hack attempts. CallerIP can send an email, display a warning dialog and/or append a log file. CallerIP Server. CallerIP server allows you to view all incoming and outgoing connections to your computer from any browser in the world. CallerIP plots all connecting IP locations on a world map. IP origin shown on world map. All connecting IP address locations are shown on a world map.
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Product
High Speed VNIR/SWIR Hyperspectral Imager
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Compact VNIR/SWIR HSI sensor compatible with small rotary wing UAS operation with application to disturbed earth detection and vegetation/mineral mapping
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Product
Turnkey NDT Corrosion Inspection Services
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Robot-enabled ultrasonic inspection that produces thickness grid maps to identify areas where corrosion and other damage mechanisms have caused wall-thinning.
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Product
USB Reusable Temperature and Humidity Data Logger
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This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Product
Encoder & Trigger
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High performance counter and multifunction I/O cards and trigger boards provide a variety of mapping functions between comparator and trigger output.
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Product
ElcoMaster Oven Profiling Software
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*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
