Showing results: 121 - 135 of 158 items found.
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MODEL VES-3000 -
TEK-VAC INDUSTRIES Inc.
TEK-VAC's VES-3000 coater station model offers a modular concept for thin film deposition. Common PVD techniques which can be employed in this compact unit include thermal and electron beam evaporation. A 2KVA SCR controlled filament evaporation power supply is provided. Optional ion deposition and magnetron sputtering devices can be incorporated in the system.
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CMS196 -
Linkham Scientific Instruments
Electron microscopy (EM) provides structural information at very high resolution. However, it can give only restricted insight into biological and chemical processes due to limitations in staining and sample preparation processes. Fluorescence microscopy on the other hand is a very sensitive method to detect biological, chemical and genetic processes and events inside living cells. Cryo-CLEM brings it all together: it is a new and emerging technique to combine the individual advantages from both Fluorescence and EM by imaging the same sample location with both techniques and superimposing the complementing information.
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Symmetry -
Oxford Instruments plc
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Digisim -
inotiv
Cyclic voltammetry can readily provide qualitative information about the stability of the oxidation states and the electron transfer kinetics of a redox system. However, quantitative studies using cyclic voltammetry (e.g., mechanistic investigations) are more difficult and typically require the use of simulation software. A number of methods have been developed for the simulation of cyclic voltammograms. Of these methods, the fast implicit finite difference method has been shown to be the most efficient, stable, and accurate, and this method is used for the DigiSim simulation software from BASi®.
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National Technical Systems
Contamination Analysis, which begins with a set of basic evaluations that on most occasions will answer the “What is this?” question. The protocol contains four parts:*Visual Examination*Organic Analytical Testing by Fourier Transform Infrared (FTIR) Spectroscopy*Elemental Analytical Testing by Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS)*Ionic Analytical Testing by Ion Chromatography (IC)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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A101 -
Amptek Inc.
Model A101 is a hybrid charge sensitive preamplifier, discriminator, and pulse shaper developed especially for instrumentation employing photomultiplier tubes, channel electron multipliers and other low capacitance charge producing detectors in the pulse counting mode. The A101 is widely used in laboratory and commercial applications for mass spectrometers, laboratory and research experiments, aerospace instrumentation, medical electronics, and electro-optical systems.
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TCS -
RARA Electronics Corporation
These components are four-terminal. bus-bar, metal strip current shunts. Assembled using electron beam welding. These units can handle 15W of continuous power and a maximum current of 350A 90.1mohm). Also they can absorb a high pulse power rating and have very low inductance. They also feature excellent long term stability, less than 100ppm/C TCR, and have excellent frequency characteristics.
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Inolytix
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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NMR -
JEOL Ltd.
NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Stefan Mayer Instruments
Instrument for easy measurement of the relative magnetic permeability µr of feebly magnetic materials and workpieces with a permeability between 1.001 and 1.999. The permeability is measured by touching the workpiece with the probe tip and reading the result from the display. Typical applications are: non-destructive testing of materials, e. g. quality control of stainless steel, material selection for electron-/ion-beam equipment, detection of material defects induced by mechanical or thermal stress.
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EDAX
TEAM EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series for Transmission Electron Microscope (TEM) provides the ultimate analytical solution for TEM. The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, analysis, and reporting are easy because the TEAM EDS software automates each task. It is the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user. Now you have the intelligence of an EDS expert every step of the way.
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Teledyne e2v
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates such as adaptive optics and lucky imaging™.The combination of Teledyne e2v’s back-thinning technology and anti-reflection coatings enables industry leading quantum efficiency that can be optimised for applications in the visible, UV or NIR wavelength ranges.
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ZEISS Atlas 5 -
Carl Zeiss AG
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Electron Probe X-Ray Analyzer (EPXA) -
Amptek Inc.
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
