TEAM EDS Analysis System for TEM
TEAM EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series for Transmission Electron Microscope (TEM) provides the ultimate analytical solution for TEM. The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, analysis, and reporting are easy because the TEAM EDS software automates each task. It is the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user. Now you have the intelligence of an EDS expert every step of the way.
