Showing results: 61 - 75 of 158 items found.
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Appointech, Inc.
light-emitting diode (LED) is a two-lead semiconductor light source. It is a pn junction diode, which emits light when activated. When a suitable voltage is applied to the leads, electrons are able to recombine with electron holes within the device, releasing energy in the form of photons.
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MR-3 -
Stefan Mayer Instruments
3-axis magnetic field cancelling system for electron microscopes (SEM and TEM), electron and ion beam experiments, nanotechnology, biomagnetic investigations, etc. High reliability through rugged analog design. No tedious programming, no chrashs. More than 1000 MR-3 systems sold worldwide.
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VS-SKP -
Ametek Scientific Instruments
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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ZEISS Correlative Cryo Workflow -
Carl Zeiss AG
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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ProCon X-Ray GmbH
The CT-NANO is a fully operating scanning electron microscope with capabilities of Nano-CT measurements on specimen like light-metal-alloys and fiber composites.
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EDAX
EDAX EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM.
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Hiden Analytical Ltd.
The quadrupole analyser is a precision assembled triple mass filter with unique, independently driven RF only secondary filter stages preceding and following the primary mass filter. A UHV low profile electron impact ioniser with twin oxide coated iridium filaments and a pulse ion counting single channel electron multiplier detector are included as standard. A Faraday detector option extends the dynamic range to 5 x 1010.
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Advanced Energy
Maximize image quality and repeatability. Designed for scanning electron microscope tools, Advanced Energy’s precision e-beam technologies deliver impressive performance, accuracy, and reliability.
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Allalin -
Attolight AG
The Allalin is a nanometer resolution spectroscopy instrument, based on a disruptive technology known as quantitative cathodoluminescence that integrates a light microscope and a scanning electron microscope (SEM) into one tool.
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MRC ltd.
A fluorometer measures the light or radiation emitted by fluorescent objects. Fluorescence occurs when light of a specific wavelength strikes and electrons in the sample.MRC provides a wide range of Fluorometers for Laboratories.
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FIB -
JEOL Ltd.
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Evans Analytical Group®
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Auger -
JEOL Ltd.
It is a high specification Auger electron spectrometer with a hemispherical analyzer to provide high throughput analysis of the chemical bonding state at nano to micro areas, and a field emission electron gun also used for EPMA, because it can deliver a large, stable electric current The highly precise eucentric specimen stage makes it possible to perform the previously-impossible analysis of insulators. This in combination with the floating type ion gun offers the versatility to handle any specimen, such as metals and insulation materials, to obtain composition information to and chemical information.
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Alpes Lasers sa
are operating in the range from 1 to 5 THz. Coherent polarized THz radiation is generated as a result of direct stimulated optical transitions of electrons within the conduction band of a semiconductor heterostructure.
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HORIBA, Ltd.
HORIBA Scientific holographic lamellar gratings exhibit ultra-low grooves roughness and unique efficiency uniformity making them ideal for Synchrotron, Free Electron Laser (FEL), EUV or Soft X-ray light sources.