Showing results: 31 - 45 of 344 items found.
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ProcessGuard -
Microtronic, Inc.
Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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LIGHTsEE -
Unity Semiconductor SAS
High throughputNanometer range vertical sensitivitySimultaneous double side inspectionNanotopography and Topography measurementDetection of Slip lines, particles, Hairline cracks, SOI voids, Comets, EPI defects…Compliant with thin or thick wafers, taiko wafers, highly warped wafers
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National Technical Systems
From cheap toys and smartphones to sophisticated computers and radar detector systems, printed circuit boards (PCB) are critical components for today’s electronic and industrial technology. Almost every electronic device has one of these self-contained modules of complex interconnected electronic components, which include resistors, capacitors, transistors, diodes and fuses.
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Faultstation -
Ucamco N.V.
Centralize all error review for your different testers in a single seat! To capture PCB layout information, FaultStation offers the choice of DPF or IPC input. In combination with a Ucamco data-prep seat, DPF is the obvious choice, while industry standard IPC provides a doorway to all other data-prep systems in today’s marketplace. Once the layout data is available, you combine it with the error information from a variety of different models and makes of testers.
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7212-HS -
Chroma ATE Inc.
Chroma 7212-HS is a linescan AOI inspector used to provide superior PV cells defect inspection. As the fine grid printing process goes even faster than before, a reliable printing quality inspector is inevitable to reduce the cost during the PV cells metallization.
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130MM ROTOFLUX® AC -
Magnetic Analysis Corp
Highly sensitive AC flux leakage is especially well suited to test hot rolled black steel bars and rods that have surface conditions which used to make finding shallow defects very difficult, if not impossible.
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ROTOFLUX® Multichannel MFL -
Magnetic Analysis Corp
MAC’s Rotoflux® Multiplex Electronics—Magnetic Flux Leakage testing that provides superior technology, performance and versatility.
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MicroINSPECT -
Microtronic, Inc.
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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RV-3000 -
Toray Engineering Co., Ltd.
Reduces surface inspection device review time and contributes to greater inspection efficiency! This system uses address information for defects detected by surface inspection equipment to acquire images of defects with a high level of magnification, and categorizes defect types.
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LRS-2400 -
Korima, Inc.
LRS-2400 reads the defect data and navigates to the exact location of the defect. With a high power microscope the user can perform tasks as described below.
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Angara-form -
ViTec Co. Ltd
The automated visual inspection system is designed to identify and reject covers that have defects that have arisen during industrial production, as well as visible defects in the form of black dots or dirt on the surface of the cover.
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Micrometrics® -
Accu-Scope Inc.
Designed for use in brightfield microscopy applications and defect analysis.
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OmniPix-OL1000 -
InZiv
Unprecedented optical, spectral, and structural OLED data.All at high-resolution, all correlated. Measure optical, spectral, and topographical properties of OLED pixels and defects. Maplarge scale panels for defective areas. Inspect pixels features and a variety of defects.
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Trans-Imager -
Microtronic, Inc.
Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capability is called ProcessGuard Xtensis (PGX) because it extends the power of ProcessGuard software to fab tools that previously had no way to detect defects. This provides an important new stream of defect data.
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Gardien S.C.A.
Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.