Showing results: 31 - 45 of 228 items found.
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Martin Testing Laboratories
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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RF ITS -
Sterner Automation Limited
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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N4002A -
Keysight Technologies
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
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MT7553 Series -
Maury Microwave Corporation
Noise Parameters are the non-50Ω extensions of Noise Figure, and are an important modeling and model validation tool to understand how a device-undertest’s performance changes as a function of source impedance. Noise Parameter measurements are typically performedusing a Vector Network Analyzer (VNA) to measure the S-Parameters of the DUT, and a Noise Analyzer (either Noise Figure Analyzer NFA or Spectrum Analyzer SA) to measure the noise power of the DUT. Noise parameters are calculated from a combination of knownsource impedances, S-parameters and noise powers.
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ATE Systems
ATE has developed a revolutionary calibration and error correction methodology that can completely eliminate the need for operator intervention. This technology: Eliminates the need to attached calibration artifacts to the instruments. Allows the system to be automatically calibrated at any time without operator intervention. Permits calibration with or without the DUT connected.
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Teradyne, Inc.
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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AXC76xx -
VX Instruments GmbH
Generate very short, fully regulated current pulses from 2 ms to DC with up to 2000 A. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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7000 Series -
Reltech Limited
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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bsw TestSystems & Consulting AG
The simplest way to measure the phase noise is to compare the Device-Under-Test (DUT) to the source of a spectrum analyzer. With the SA set at the same frequency as the OUT, you see the sum of the SA's and DUT's sideband-power spectrum on the SA display. It is a simple and straight forward method well suited for free running VCO's where the SA is easily an order better.You can improve on this method by establishing a Phase Lock (PLL) between the DUT and the Local Oscillator and create a zero-IF or base-band spectrum analyzer system.
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PXI-501 ACS-001 -
Konrad Technologies GmbH
The PXI-501 ACS-001 is an extension for the PXI-501. It provides 4mm sockets do directly connect a DUT to the PXI-501 source and measurement functionallity. It’s especially recommended for laboratory environments and debugging purpose.
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INCAL Technology, Inc.
No. of Tahoe Drivers: 1 (1:1 Driver/BIB ratio)No. of Voltages available per BIB Slot: (16 (PS1…PS16)Same Dynamic Stimuli, DUT Monitoring and Sierra™ Software as the system.
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Test Insight Ltd.
Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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S94601B -
Keysight Technologies
Device Measurement eXpert (DMX) is a measurement configuration assistant that aides users in setting up and optimizing complex measurements for various types of devices. The customizable wizard guides users through DUT connection, measurement setup, and display. DMX provides repeatability across the workflow by automatically setting up measurements in a consistent and optimal manner.
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AXC85xx -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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S94570B -
Keysight Technologies
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.