Showing results: 1 - 3 of 3 items found.
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ATE Systems
ATE Systems has developed a wide variety of custom test systems that integrate commercial test instruments and custom hardware, tied together with a test executive. Examples of the types of tests that have been incorporated include: S-parameters (gain, return loss, VSWR, etc), Noise figure, Power, Spectral response, Linearity, Voltage, Current, Switching speed and so on
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ATE Systems
There are no good measurements without good test fixtures. Ideally the test fixture needs to make the electrical connection between the test instrument and the device-under-test (DUT) and be electrically transparent. ATE has developed fixtures for SMT components, leadless packages, and miniature coaxial interfaces, in such a way that the fixture effects can be removed, and the measurement reference plane can be brought right down to the DUT.
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ATE Systems
ATE has developed a revolutionary calibration and error correction methodology that can completely eliminate the need for operator intervention. This technology: Eliminates the need to attached calibration artifacts to the instruments. Allows the system to be automatically calibrated at any time without operator intervention. Permits calibration with or without the DUT connected.
