Showing results: 1291 - 1305 of 1725 items found.
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Alta Data Technologies LLC
Please review 1553 Bus Accessories to the right. You can also use the Login-Download link above (login required) to access all the Hardware Manuals with specific cable and connector information. Most 1553 Cards and ENET devices have optional 1553 Jack and AUX I/O DB cable assemblies. Please see the respective product pages part numbers tab. Most ARINC products include flying-lead cable assemblies.Please use the Contact link to email/phone sales for a login as needed.
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HSL-DI16DO16-M-NN -
ADLINK Technology Inc.
- Input voltage: ±40 V (Max)- Output switching capacity: Single channel 500 mA; all channels 60 mA at 24 VDC- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ±10 mA (Max) , ±12.5 mA (Peak)- 16-CH digital input and 16-CH digital output. "NN" type for NPN sinking type sensor input or dry contact and NPN sinking type output- Slave ID consumption: 1
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e-CAM80_MI8865_MOD -
e-con Systems Inc.
e-CAM80_MI8865_MOD is a 8 MP Autofocus MIPI RAW camera module based on Ominivision's OV8865 CMOS image sensor. The 1/3.2-inch OV8865 is a low-power high-performance color CMOS Image Sensor featuring an improved 1.4-micron with BSI technology. OV8865 is already a proven sensor in the market with dynamic range and reduced dark current that enables superior high and low light image capture. Note: You would require an external ISP to process the data. Contact us to purchase the ISP.
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DENKEN Co., Ltd.
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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KRÜSS GmbH
ADVANCE is an example of how even the most complex measuring tasks, such as determining the surface free energy (SFE) of a solid, can be represented on a clear and easy to use interface. With just a few intuitive editing steps you can prepare software-controlled contact angle measurements utilizing every degree of automation up to complete SFE measurement, position mapping, or tilting experiments. Using our Liquid Needle dosing technique, ADVANCE even accesses the SFE of a surface within just one second.
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Smiths Interconnect
A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.
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Virginia Diodes, Inc.
Virginia Diodes offers compact converters (CCs) for frequency up and down-conversion. These converters are easy to use and well suited for high performance up and down conversion of wide band modulated millimeter-wave signals. VDI CCs offer full waveguide band coverage and are available from WR28 (22.5-40 GHz) to WR2.2 (330-500 GHz) with additional CCs under development. Compact converters can typically be delivered within 9-11 weeks ARO or less. Contact VDI for more information.
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Lumetrics Inc.
Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.
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AOSense
Atomic oven with collimated output for ultra-high vacuum systems, loaded with Sr, Yb or Ca. The oven provides superior heat isolation while achieving high atomic flux. Its low power consumption results in exceptionally low pressures during normal operation for temperatures up to 650 °C. The chamber is shipped in an ultra-high vacuum storage chamber supplied by AOSense. Customers can provide AOSense with a previously purchased storage chamber for repeat orders. Please contact us for more information.
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Exact Metrology
The 3D measurement data from our scanners and PCMMs offers a comprehensive definition of a physical object that is used for measurement, inspection, comparison and reporting. When a part is defined by millions of points, you can see subtle deviations, slight variations and fine details, which gives you the confidence that a part (or mold) meets your specifications. To deliver the best of both worlds, we combine 3D scanning with our contact, touch-probe measurement tools to deliver precise dimensions on geometric shapes.
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Extech 461995 -
Extech Instruments Corporation
This Tachometer provides both contact (0. 5 to 19,999 RPM) and non-contact (10 to 99,999 RPM) RPM measurement functions for use in virtually all applications. Laser guided non-contact measurements up to 6.5 ft. (2 meter) away for added safety and convenience. Comes with wheels for linear surface speed (0.2 to 6560 ft. /minute; 0.05 to 1999.9 m/minute) or RPM measurements, 4 AA batteries, 23 in. (0.6 m) reflective tape, carrying case, and user manual.
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Koehler Instrument Company, Inc.
A complete source for your testing solutions, Koehler offers a wide range of in-house testing services based on selected standard test methods. Our staff is comprised of technical experts and the best instrumentation for fast, accurate and reliable results. We specialize in all tests for which we offer instrumentation as well as additional test methods. You are invited to send us samples for testing and evaluation at any time. Please contact your Koehler representative for additional information.
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TLP -
Impulse Semiconductor Inc.
The Impulse transmission line pulser (TLP) discharge networks are easily integrated with other instruments for a custom system matched for your device and process applications. Specifications include 1-10 nanosecond rise times, up to 40 amps peak, for 10-500 nanosecond pulse widths. It is a proven design incorporating 15 years of hardware and device development experience. Reliable performance over hundreds of processes, and thousands of products. All TLP systems are built by special request, contact us with your specifications or application.
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Lumetronics
Endevco accelerometers are used in the most demanding shock and vibration test environments. Whether your application requires measuring DC response or high frequency bandwidth, surviving cryogenic temperatures or up to 1400˚F, sensing low frequency vibration or high-g shock, Meggitt offers a high reliability accelerometer in a variety of packages. If you need assistance selecting the right sensor for your application, please contact us and we will help you select the best accelerometer for your test.
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Meritec
Meritec's 1MM Slot Test Connector was developed to eliminate many of the common problems associated with using a standard connector in a test application. When testing, the PCB is plugged in and out of the connector many times. The wiping action that occurs between the contacts and the board starts to wear down the plating on the contacts and the plastic housing itself.At some point in time the connector becomes a liability and can no longer be considered reliable. The standard connectors being used today for test applications have a life cycle of 250 to 500 (the number of insertion and withdrawals applied to the connector). Meritec's Slot Test Connector has a life cycle greater than 100,000!
