Showing results: 106 - 120 of 439 items found.
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CARY-LS300B -
UC Instruments, Corp.
The CARY-LS300B optical light source provide 1310/1490/1550 nm three outputwavelengths to meet specific application requirements. It is a idea solution for the fiberoptic network characterization, out-door network construction inspection and lab application.
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M-2000 -
J.A. Woollam Co., Inc.
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.
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VTC 4000 -
Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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LIGHTsPEED -
Unity Semiconductor SAS
High throughput• Nanometer scale sensitivity• Autofocus• Full haze characterization• Multisize capability• Pits / Particle distinction• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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IQgig-RF Model B -
LitePoint Corporation
When used in conjunction with IQgig-IF, an optimized test solution for conducted testing of WiGig chipsets and baseband modules, the IQgig family products provide a total test solution for R&D characterization and high volume manufacturing.
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k-Space Associates, Inc.
kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
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Teradyne, Inc.
From design through production, whether developing and debugging code or performing characterization, Teradyne offers an array of seamless solutions that extend beyond our core software to reduce your engineering efforts and speed development.
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M9816AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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M9817AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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M9818AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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OPTOWARE-S300 (FOTS-ORL Meter Systyem) -
Notice
The Optical Return Loss(ORL) Meter is an efficient system for the characterization and test of optical components and systems to be performed in high quality.
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Keysight Technologies
Modern lightwave transmission systems require accurate and repeatable characterization of their optoelectronic, optical and electrical components to guarantee high-speed performance.
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S93300B -
Keysight Technologies
Configure a 170 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs.
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S93301B -
Keysight Technologies
Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
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B1500A Series -
Keysight Technologies
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.