Showing results: 166 - 180 of 439 items found.
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TL2000 -
ficonTEC Service GmbH
ficonTEC’s series of testing machines is focused on automated electro-optical characterization ofsemiconductor chips. The ficonTEC TL2000 is a fully automated test and inspection system for unmountedlaser diode bars, single chips and chips on submounts.
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M937xA Series -
Keysight Technologies
The Keysight M937xA vector network analyzer (VNA) performs fast, accurate, measurements and reduces your cost-of-test by giving you simultaneous characterizations for two-port or multiport devices with a single PXI chassis.
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HORIBA, Ltd.
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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UVISEL Plus -
HORIBA, Ltd.
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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FilmTek CD -
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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NS MiniTracer -
Applied NanoFluorescence, LLC
The NS MiniTracer is the latest addition to the innovative line of NanoSpectralyzer instruments from Applied NanoFluorescence, LLC. Its design is optimized for fast, easy, and highly sensitive analytical measurements on a variety of samples containing single-walled carbon nanotubes. The MiniTracer is ideal for quantitating SWCNTs in environmental and biological specimens and is also perfect for routine sample characterization in any SWCNT research lab.
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Ametek Scientific Instruments
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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IQgig-IF -
LitePoint Corporation
When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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FocusTest, Inc.
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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OSAPXIe -
Quantifi Photonics Inc.
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
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Elementar Analysensysteme GmbH
The elemental composition of a material determines its properties. Elemental analysis is therefore essential for the characterization and quality control of materials that need to meet certain requirements.Elementar's user-friendly inductar® series for inorganic elmental analysis uses the high-temperature combustion method to determine elemental concentrations of carbon, sulfur, oxygen, nitrogen, and hydrogen and is the ideal solution for R&D, routine, and high-throughput laboratories.
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Duma Optronics LTD
The concept of autocollimation as an optical instrument was conceived about a century ago for accurate, non-contact measurements of angles. Recent novel photonics upgrades have created a new breed of Autocollimators, offering intricate measurement capabilities for optics, laser profiling, AR/VR/XR goggles alignment, cameras for auto-driving, VCSEL characterization and many more applications with a single instrument packed with multi-tech technologies.
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multiLane
Optical clock-recovery modules are required when a clock signal is not present to trigger the oscilloscope or when it is better to use the embedded clock present in the data stream, such as for 100G Lambda optical signals.Clock-recovery modules are essential for transmitter signal characterization.
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FTB-740C-CWDM -
EXFO Inc.
Single OTDR unit that covers all 18 CWDM ITU channels for testing through MUX/DEMUX channels, providing a complete end-to-end link characterization or troubleshooting for commercial services, C-RAN networks and metro Ethernet deployments.
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Keysight Technologies
Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
