Showing results: 421 - 435 of 439 items found.
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M9451A -
Keysight Technologies
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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782856-01 -
NI
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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783760-01 -
NI
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Model 155 -
Lake Shore Cryotronics, Inc.
To reliably characterize developing semiconductor materials and devices, you need high quality current or voltage sources to excite samples. A cleaner (i.e., lower noise) excitation signal enables better measurement of the sample’s response. The MeasureReady™ Model 155 precision I/V sources are ideal for electronic material characterization and other demanding scientific applications requiring a precise, low-noise supply of current or voltage. Supplying 1 W maximum from DC to 100 kHz over a broad output range, these sources provide a solid foundation for I/V curve, Hall effect, and other fundamental measurements. With online software updates, your instrument will always have the most current capabilities. As Lake Shore introduces new options in the future, you can purchase and download them to your instrument. This allows the Model 155 to grow as your measurement needs evolve.
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783762-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783761-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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783761-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Duma Optronics LTD
The M2 factor wil define the beam propagation characteristics compared to ideal Gaussian beam propagation. According to ISO Standard 11146 rightfully offers the laser beam characterization as "M2 times diffraction limited beam", as such, a perfect beam will have an M2 of 1. 1 will be the best achievable value and no beam could have an M2 less than 1. Our conceptual design is based on sub-assemblies allowing to change the sensing head in the M2 device, offering multiple wavelengths heads up to 2.7 microns from deep UV (knife-edge technology) and camera based technology with built-in automatic filter wheel for adjustment. For focused beams, the same measuring head could be attached to a device for meauring highly divergent or highly convergent beams - FocusGage-BA, wherein the Laser Analyzing Electronic Autocollimator offers the capability of divergence measurement with Coming Soon M2 definition. M2Beam is the cornerstone of those measuring devices.
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LDA-602EH -
Vaunix Technology Corporation
The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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NplusT -
Saniffer
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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FTB-4 Pro -
EXFO Inc.
The FTB-4 Pro is the latest addition to EXFO’s test orchestration portfolio which transforms business as usual into smarter, scalable network testing that significantly increases operational efficiency and provides vital insights into field operations, network performance and service delivery. The 4 slot modular FTB-4 Pro platform enables a unique combination for 100G commissioning, turn-up and troubleshooting which includes the FTBx-88200NGE 100G Multiservice tester (with iOptics transceiver validation software) and the FTB-5240S-P optical spectrum analyzer. There is no need to carry additional platforms or swap modules for unmatched transport and spectral testing on a single platform that no one in the industry can offer. The versatile FTB-4 Pro platform supports a wide range of modules for field testing, data center interconnect, submarine testing, and lab applications for maximum flexibility and ROI across all phases of the service delivery chain: development, deployment, maintenance and troubleshooting. Module combinations on the FTB-4 Pro can also include iOLM/OTDRs, market leading OLTS for fiber characterization, dispersion solutions and other transport modules all with compatibility with EXFO’s market leading fiber inspection probes.
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Enlitech
From the review of the scientific development history, reliable and stable artificial light sources have played a very important role in the past century. For example, the artificial solar simulator is an important part of simulating sunlight to ensure accurate performance of PV characterization. With the growth of light sensor applications, more and more requirement of light simulators (or artificial light sources) explored. One of the core technologies of Enlitech is the artificial light sources. We can manipulate different lamp types (short arc lamps, LEDs, filament lamps et. al.) to generate different spectrum-form in different light intensity levels, beam sizes, and wavelength ranges. We have launched different artificial light source products for different applications fields. For instance, SS-X series solar simulators and ILS-30 ambient light simulator are for the PV field, HAAS is highly accurate star light simulator for the space field, and ALS-300 is a general-purpose light source in science research field. These products can not only meet the needs of your application, but also speed up the process of your research or mass-production.
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Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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EXFO-100 -
Hangzhou Softel Optic Co., Ltd.
* Top user-friendliness: one-button testing, combined with EXFO’s proprietary FTTx software package (macrobend/fault finder, pass/fail indicators)*Multiple options, including power meter, visual fault locator (VFL), fiber inspection probe, printer and IP testing*Fault Finder mode, for quick identification/location of a fiber break*Complete connectivity flexibility: USB stick compatibility and USB cable data download via ActiveSync**Advanced TFT transflective color display, for assured legibility under direct sunlight or in other demanding outside conditions*Handheld, small, lightweight unit: 1 kg (2.2 lb)*Built-in ruggedness for outside-plant usage*Troubleshooting option, enabling in-service, out-of-band network testing *EXFO’s AXS-100 Access OTDR combines the industry’s leading OTDR technology with power meter functiona lities in one powerful handheld unit.Optimized for testing passive optical networks (PON) within FTTx architectures, it offers several wavelength configurations and a wide range of options, for first-class flexibility. Use it at the optical network terminal(ONT), drop terminal or fiber distribution hub (FDH) for FTTH distribution(F2) fiber characterization, troubleshooting and fault locating.
