Showing results: 61 - 75 of 439 items found.
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Bruker microCT
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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BIRD -
HGH Infrared Systems
The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
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Scribner Associates Inc.
Designed for membrane and separator characterization in a liquid environment. Measure resistance, conductivity, permeability, cross-over, and selectivity.
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Electrical Char -
Frontier Semiconductor, Inc,
Full line of front end electrical characterization tools: Sheet Resistance, leakage, and CV-IV measurements.
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WS500 -
PFO
The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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T3Ster® -
Mentor Graphics Corp.
T3Ster (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
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ASAP 2020 Plus -
Micromeritis
The ASAP 2020 Plus permits one instrument to accommodate almost any surface characterization need in your lab.
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T40™ Series -
Celadon
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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IQfact5G -
LitePoint Corporation
IQfact5G ensures quality device characterization and facilitates easy customization of test flow, thus significantly reducing engineering effort.
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HTF-1100. -
BioLogic
A laboratory furnace used specifically for the electrical characterization of materials and also for heat treatment between ambient temperature and 1100 °C.
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aixACCT Systems GmbH
In combination with the PES measuring system, sample holders from aixACCT Systems are now practically standard for the characterization of piezoelectric materials.
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DL10-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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DL07-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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DL03-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.