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Product
Flying Prober Test System
QTOUCH1404C
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Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
6TL08 Benchtop Test Platform
H710008
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
NI Vehicle Radar Test System
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VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
1553 to Ethernet Converter
eNet-1553
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eNet is a small, rugged 1553 to Ethernet appliance/converter (~200 grams and about the size of a 4 stub coupler) and offers the same advanced BC, mRT and BM functions as our cards. In addition, eNet can provide an additional independent BM mode to auto bridge (transmit) 1553 messages on user defined IP/UDP packet header. The appliance can also auto-load setup images for fast auto start-up, which would be ideal for simple RT applications that wouldn’t even need an API interface (just a standard UDP interface – usually through simple socket programming).
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
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Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Dielectric Material Test Fixture
16453A
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The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
Liquid Test Fixture
16452A
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The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
6GE Port Gigabit Unmanaged Industrial PoE Ethernet Switch
EKI-2706G-2GPI
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6 Gigabit RJ-45 Ethernet ports. Support 4 x IEEE 802.3at/af PoE ports for PD demands, Up to 30W output per PoE port. Supports jumbo frame transmission up to 9k bytes, 12 ~ 48 VDC redundant dual power input and 1 relay output, Wide operating temperature range of -40 ~ 75°C.
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
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The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
3U CompactPCI 5-Port Serial Ethernet, Optional POE Card
cPCI-A3ETH
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- Follow PICMG® CompactPCI® Serial design guide- CompactPCI® Serial, 3U 4HP/8HP- 5x RJ-45 ports support up to 2.5G via Intel® i226IT Ethernet controllers- Optional PoE supported- Operating temperature: -40°C to +85°C- Designed to meet EN50155 standards
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Product
Rack based antenna test system
R&S®ATS800R CATR
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Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
HV Test System up to 20000 Volt
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Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
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The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
PXI Integration Platform
ATS-3100
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The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
Ethernet to CAN Bus Gateway
YAV90090
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• High-performance Arm Cortex-M3 MCU with 512 Kbytes Flash, 120 MHz CPU, ART Accelerator, Ethernet P/N STM32F207IEH6• USB 2.0 connector for serial data transfer (reserved for factory use)• Connections for CAN, and power supply via 4-pole Weidmüller connector• Reboot and reset of the device to factory defaults with a reset button• Plastic casing for benchtop operation• LEDs for device status and power supply• Voltage supply from 8 to 30 V
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Product
5GE Unmanaged Ethernet Switch
EKI-2725
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Provides 5 Gigabit Ethernet ports with Auto MDI/MDI-X, Supports 10/100/1000Mbps Auto Negotiation, Supports jumbo frame transmission up to 9kbytes, Provides Slim size, DIN-rail with IP30 metal mechanism.
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Product
8-Ports Gigabit Ethernet ITA Interface
YAV90058A
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8 RJ45 LAN connectors to VPC ITA 192 pins module
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
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The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Automotive Ethernet Interface Device
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The Automotive Ethernet Interface Device converts unshielded twisted pair (UTP) Automotive Ethernet to standard Ethernet. This device is ideal for developing applications that require Automotive Ethernet to test and validate automotive electronic control units (ECUs). It includes ports for Automotive Ethernet connections and ports for 100BASE-TX Ethernet connections. You can use switches on the front panel to configure each 100BASE-T1 port as master or slave. The device also provides LED on the front panel so that you can monitor the linkage and activity on the various ports.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Conformance Test System
TS8980
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The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
8 Ports Entry-Level Managed Switch
EKI-5728I-MB
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Entry-level managed switch, Provides wide operating voltage 8.4~52.8 VDC, C1D2 and ATEX certified for horizontal area. IXM function enables fast deployment, Modbus/TCP enabled by default, Supports X-Ring for ultra high-speed recovery time less than 20m.
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Product
In-line High-Density ICT System Series 7i
E9988GL
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The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
8GE+2G SFP Unmanaged Ethernet Switch, ATEX/C1D2, -40~75℃
EKI-5729FI
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Communicates with SCADA software via Modbus/TCPCommunicates with NMS (Networking management system) via SNMPPort-based QoS for deterministic data transmission-40~75°C operating temperature range (EKI-5729FI only)12V~48 V DC (8.4 V to 52.8 V DC ) wide-range power inputEMS level 3 protection for extreme outdoor environmentsIEEE 802.3az Energy Efficient Ethernet (EEE)Supports redundant 12~48V DC power input and P-Fail relayLoop detection
