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Transportation Bounce Test System
KRD51 series
Bounce testing simulates the constant loose cargo state during truck transport. Often times, containers carrying military and civilian hardware (such as: medical supplies, electronics, weaponry, communication devices) travel for extended periods of time and must be transported off-road. All of these items must maintain functionality upon arrival at their destinations.
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Switch Box for Fully Automatic Testing
CP SB1
The switchbox CP SB1 reduces wiring work at power transformers. Thereby, the time needed for testing can be reduced and, at the same time, safety can be significantly increased.
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Instrument Systems General Accessories
Konica Minolta Sensing Americas, Inc
Instrument Systems General Accessories current range of optical probes and measurement adapters using fiber optics as a means to transport light in the spectrometer was a primary goal sought by Instrument Systems from the beginning of their product development.
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Telecom Test Systems
4301 Series
The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2E-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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EMI Test System
EMI-9KA
EMI-9KA is an automatic EMI receiver. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KA is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KA fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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IFEC Embedded System Hardware
State-of-the-art system components serve as building blocks for you to create the ideal IFEC system.
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6GHz Dual Channel Signal Generator
LS6082B
The LS6082B is a 6GHz Dual Channel RF Analog Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Software-based Electroacoustic Test System
SoundCheck
The SoundCheck®system from Listen includes everything you need to perform audio measurements on a wide range of devices – the software, the audio interface, other test interfaces and accessories, and test sequences. The system is centered around the SoundCheck software. This powerful package controls and communicates with the measurement hardware, and includes all the stimuli, algorithms and analysis functionality needed to develop and run virtually any electroacoustic or audio electronic test. It is paired with hardware ranging from a simple, all-in one audio test box to sophisticated discrete components for a complete test system. In addition to Listen hardware, a range of 3rd party products and test accessories are fully supported within SoundCheck.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Full Vehicle Test Systems
MB Dynamics delivers effective, low-cost, and quiet excitation technology to root source S&Rs in vehicles, trimmed bodies, subsystems and components, including 4 poster test rigs. MB’s patented Direct Body Excitation (DBE) Road Simulator and Dynamic Vehicle Torquer (DVT) are advanced vehicle road simulation technologies which help detect vehicle S&Rs during development, launch, and production.
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 24 Channels
DN6.653-24
The generatorNETBOX DN6.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either up to 48 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Automatic Battery Testers
T100BT is an innovative, modular battery testing equipment able to combine, on a single test platform, all the tests required to detect any possible defect on battery cells and modules: from defective cell wiring, to geometrical or surface irregularities, to out-of-specs performances.The battery tester is designed for the high-volume production test of battery modules composed by prismatic, cylindrical, or pouch cells, as well in a Lab/NPI version for engineering, prototypes and low-volume battery testing. The complete configurability allows you to equip the tester with the modules and tools you need to test your products, reaching the desired throughput.
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Automatic Relay Tester
DYR-II
Model ‘DYR-II’ is an ideal, newly developed multifunction relay tester adopting monolithic computer technology. It is composed of auto synchronized digital millisecond timer, logic controlling unit, multifunction digital display, high precision digit collection and processing unit, current-voltage output unit, overload and over range protection unit. Test process is automatic for improved efficiency. The tester has a built in printer for printing the results.
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Automatic Slag dDetection
Non-contact slag detection with infrared thermographyClear visual representation of tapping and deslagging processes through excellent image resolutionPrecise distinction between steel and slagFunction for automated detection of the tapping endComprehensively adjustable data reposting on system PC or data serverDifferent variants of interfaces for the integration into process control system
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Generators
Amplitude-Modulated Signal Generator
The Software Signal generator allows to produce amplitude-modulated signals at the DAC output.
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Dynamic Component Test Systems
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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180/400 MS/s Dual Channel PXI Express Arbitrary Waveform Generator
PXIe-1802
The Astronics Test Systems PXIe-1802 is a 2-channel Arbitrary Waveform Generator (AWG). Occupying just one PXI Express periphal slot or hybrid slot, this AWG offers the best speed and performance available for output frequencies up to 125 MHz
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Generic test automation framework for acceptance testing and ATDD
ROBOT FRAMEWORK
Robot Framework is a generic test automation framework for acceptance testing and acceptance test-driven development (ATDD). It has easy-to-use tabular test data syntax and it utilizes the keyword-driven testing approach. Its testing capabilities can be extended by test libraries implemented either with Python or Java, and users can create new higher-level keywords from existing ones using the same syntax that is used for creating test cases.
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TSC157 Solar Panel Probe
TSC157
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 25Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,114Overall Length (mm): 28.30
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Three-phase Fully Automatic Test System
TS33
Calmet Smart Calibration Devices
The Calmet TS33 portable test system consists of a three-phase reference meter of accuracy class 0.02%, 0.04% or 0.1% and an integrated three-phase current and voltage source up to 3x120A/600V. The TS33 is designed for analysis of complete metering installations and local mains conditions.
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Electrodynamic Shock Test System
FS SERIES
The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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High-Speed Transformer Test System
DU-7211
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Automatic Transformer Test System
TH2840AX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
