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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Diode Submounts
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Ultra-precise patterning of thin film metals on dielectrics with high thermal conductivity are used for diode submount applications. Via the acquisition of Ion Beam Milling, Inc., SemiGen is the industry leader for laser diode submount fabrication. As each application is different, we work with customers to develop a custom design that perfectly fits their requirements. We have experience producing circuits utilizing substrates of varying thicknesses with high thermal conductivity such as alumina (Al), aluminum nitride (AlN), and beryllium oxide (BeO). SemiGen can deliver laser diode submounts with or without Au/Sn pads depending on your needs.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Planar-Doped Barrier Diode Detector, 0.01 to 18 GHz
8474B
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The Keysight 8474B is a high-performance detector using a gallium arsenide, planar-doped barrier detecting element. It features extremely flat frequency response over its entire band of operation and very good frequency response stability versus temperature. The Keysight 8474B is also very rugged with high resistance to ESD damage. The Keysight 8474B detectors are available with 0.01 to 18 GHz and a type-N connector. This detector offers options for optimal square-law loads (Option 102) and for positive polarity output (Option 103). Because the unit-to-unit frequency response tracking of these devices is typically better than plus or minus 0.3 dB, no matched response option is offered.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Laser Diode Drivers (LDD)
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LDD technology has evolved from driving DVD/CD/Blue-ray optical drives to include laser projection in smartphones, automotive head-up displays (HUDs) and pico projectors. Renesas has developed new LDDs for RGB scanning laser projection systems and laser-based pico projectors. Automotive HUDs are benefiting from big innovations in MEMS projection systems and are now central to advanced driver assistance systems (ADAS) and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost.
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Diode Tester
FEC VF40CM
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Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
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Product
Pump Laser Diode Driver
S-110
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•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
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The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Diode Module Scanners
Scan500
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Frothingham Electronics Corporation
The Scan500 scanners are add-on scanners for diode modules, to be used with a tester such as the FEC200.
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Laser Optics
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A substrate is developed into a laser optic when it is refined with a dielectric coating. Due to the wide range of possible combinations between the substrate and the coating, one optic seldom resembles another. Contact us directly and together we can design a product to adequately suit your needs.
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Product
High-power Laser Diode Assembly
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The laser diode is one of the most common devices used throughout photonics. The micro-assembly process calls for the placement and bonding (align-&-attach) of single emitters, or multiple laser diodes (stacked or complete bars), the placement, active alignment and bonding of necessary micro-optical elements, subsequent device testing, and ultimately packaging and quality control. ficonTEC’s machine systems are capable of all the steps necessary for assembling laser diodes, even high-power devices. Multiple in-line systems can be configured to address entire process segments.
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Product
Modules - Modules, Diode
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Diode modules from Vishay feature a range of technologies including FRED Pt®, HEXFRED®, and high performance Schottky, with reverse voltage ratings up to 2500 V and forward current ratings up to 600 A.
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Product
Laser
BDS-MM Series
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*Pulse Width Down to 60 ps*Repetition Rate 20 MHz / 50 MHz*Free Beam or Fiber Output*Optical Power Up to 40 mW*All Electronics Integrated*No External Driver Unit*Simple +12 V Supply*40 mm x 70 mm x 120 mm
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Product
Parametric Test Fixture
U2941A
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The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Ultrastable Lasers
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Menlo Systems offers ultrastable, frequency stabilized lasers at basically any wavelength. We supply fully characterized systems with linewidths <1Hz and Allan deviations of 2 x 10-15 (in 1 s) as well as modules and components allowing for state-of-the-art systems tailored to customers' needs.
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Product
Automotive-grade Diodes
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ST's portfolio of automotive diodes is qualified to the AEC-Q101 standard and is intended for DC-DC converters used in numerous automotive functions. Most of these dedicated diodes are guaranteed in operation at junction temperatures as low as -40 °C and as high as +175 °C. The automotive-grade diodes belong to our STPOWER family.
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Product
THz Diodes
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Macom Technology Solutions Holdings Inc.
The intrinsic cutoff frequencies of these Schottky junction devices exceed 1 THz, making them well-suited for use in mixers and detectors operating in the frequency bands from 60 GHz into the hundreds of GHz bands.
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Product
Functional Test Fixtures
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Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
