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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
Production Line Test System
1740
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The fully programmable Model 1740 facilitates high speed, production line testing in both automated and manual applications. Standard tests include AC Hipot, DC Hipot, Resistance, patented Tang-Weld Resistance and Surge. Robust software offers automatic setup of all test parameters, complete result storage, Go/No-Go testing requiring no operator judgment, and online statistics for all tests.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
LIDAR & Direct Time of Flight
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LIDAR (Light Detection and Ranging) is a sensor technology for remote object detection and ranging, using a light source and receiver. Emitted light pulses hit objects, reflect, and return to the LiDAR sensor system where the receiver detects the returning light pulse.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
500 Watt AC/DC Power Line Conditioner, 3U VPX, Holdup Time
VPX56-3HU
Power Line Conditioner
NAI's VPX56-3HU is a rugged, high-performance 500-Watt Output +28 VDC Input 3U VPX AC/DC Power Line Conditioner designed for aerospace, defense, and industrial markets. This off-the-shelf power supply plugs directly into a standard VPX conduction cooled chassis and protects downstream DC-DC converters from MIL-STD-704 transients, low-voltage conditions and power interruptions, providing up to 50 milliseconds of holdup time at up to 500-Watts. Continuous Background Built-In-Test (BIT) and I2C communication are included.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Magnetic Material Test Fixture
16454A
Test Fixture
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
End of Line Noise Test System
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End of Line Noise Test Systems from VIacoustics are designed to support end of line product noise testing on factory floors and quality assurance environments. Using the Limit Analysis features of the Nelson Acoustic Trident software, users can set noise emission maximum, minimum or control range criteria based on Awtd and/or 1/N octave band criteria. Criteria can be customized for most any type of product based on the noise emissions of known good and bad units. The large front panel Pass/Fail indicator allows operators to quickly determine if units meet the criteria. Data on units that fail can be exported for further analysis.
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Product
Flight Test Instrumentation Software
TTCWare
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Curtiss-Wright Defense Solutions
TTCWare is a data acquisition system configuration and programming application. Using TTCWare, you can customize the behavior of your hardware and create parameters to sample data. Parameters can be inserted into the PCM format at user specified locations in order to achieve desired sampling rates. After creating a PCM format, you can program your hardware with your customized configuration.
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Product
Line Input Test
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Measure the dB level and frequency of the iAudioInterface2 line input or line output (also works with any dock input audio source).
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Product
Quadrupole Time-of-Flight Mass Spectrometry
Xevo G2-XS QTof
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For the scientist who needs to identify, quantify and confirm the broadest range of compounds in the most complex and challenging samples. *Maximum robustness with no compromise in performance *Class-leading real-world quantitative sensitivity *Highest quality, most comprehensive qualitative information *Flexibility to adapt to changing needs *Accessible to experts and non-experts alike
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Product
Telephone Line Testers for POTS / Analog Line
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*This analog line tester is suitable for all instalers installing telephone equepement on POTS line.*Led indications signaling the status of analog line.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Analyzer for Safety Agency Production Line Testing
HypotULTRAIII
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Ethernet Communication CardUSB/RS-232, GPIB & Printer InterfacesData Storage CardInterconnection to Modular Scanning MatrixOptional 10 Volt Analog InterfaceStorage of up to 50 setups with 30 steps per setupPatented SmartGFI® functionPatented prompt and hold functionPatented CAL-ALERT® functionPatented VERI-CHEK® functionReal Current measurementDual Continuity test modesBuilt-in security settingsLine and Load regulation
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Time-of-Flight Camera
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The Basler Time-of-Flight (ToF) Camera provides high resolution 3D images at a very attractive price/performance ratio. It delivers 20 frames per second with VGA resolution and has a working range of 0 to 13 meters.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Line Injector
J2120A
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While the injection transformer is a very wideband adapter, it is not useful for measuring ripple rejection (PSRR) of a power supply or even an opamp. This is because the attributes that make the injection transformer perform so well also result in a transformer that is intolerant of DC current. Even very small DC currents (5mA or less) can greatly reduce the signal capacity or even totally saturate the transformer. For this reason, the Picotest line injector (J2120A) is another essential test adapter.
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Product
Load-to-Line Jumpers
200
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TESCO’s Load-to-Line Jumpers (Catalog No. 200) allows the utility to perform meter maintenance without interruption of service to the downstream occupant. TESCO bypass jumpers are rated for 200 amps continuous duty and are made from a durable 1/8″ thick tin-plated copper with a durable insulating material covering everything except the blades.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Line Scan Camera
Linea SWIR
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Teledyne DALSA’s short-wave infrared (SWIR) GigE line scan camera features a cutting-edge InGaAs sensor in a compact package for a wide variety of machine vision applications.This high speed, high resolution camera is the first product in DALSA’s SWIR family. Linea SWIR features a cutting-edge InGaAs sensor in a compact package that is suitable for a wide variety of applications. With exceptional responsivity and low noise, this camera allows customers to see their products like never before. Linea SWIR is available as a 1k resolution camera with highly responsive 12.5 µm pixels, or a 512 resolution camera with larger 25 µm pixels
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Laser Distance Sensors (Time-of-Flight)
optoNCDT
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Laser distance sensors are designed for non-contact distance measurements: laser gauges for measuring ranges up to 10m, laser distance sensors for up to 3,000m. These sensors are used for positioning and type classification in machine building and handling equipment.
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Product
Eagle Test Systems
ETS-200T
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Test Fixture (SMD Components)
16034E
Test Fixture
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
