Interconnect Stress Test
accelerated test of PCB pads, lines and thru-holes.
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Parallel Electrode SMD Test Fixture
16192A
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Creep and Stress Rupture Tester
QualiCreep Series
Qualitest Creep and Stress Rupture Tester - QualiCreep Series is mainly designed to perform Creep and Stress Rupture testing of a wide variety of materials to both standard and customized specifications such as ASTM E139, ISO 204, ISO/R 206 and similar international standards. These machines are capable of covering the determination of the amount of deformation as a function of time (creep test) and the measurement of the time for fracture to occur when sufficient force is present (rupture test) for materials when under constant tensile forces at constant temperature. Qualitest offers three models electronic high temperature creep-testing machine with full closed-loop servo-control in capacities from 10kN to 500kN.
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Stress Testing System
Load Dynamix
LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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Digital Interconnect Test System, Reference Solution
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Mass Interconnect Solution
SCOUT
SCOUT is an innovative pull-through Mass Interconnect solution specifically designed to deliver the full performance potential of the PXI platform at the ATE interface. SCOUT, featuring DAK (Direct Access Kit) connectivity, enables system designers to limit or eliminate traditional instrument cables by replacing them with DAK connection modules that utilise PCB, flex-circuit or short wire connections.
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Interconnect Test Leads
142-1
This 64 inch pair of test leads connects with many different testing accessories and probes. Especially those found in typical test lead kits and assortments. The ends terminate in universal size 4mm banana plugs.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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VITA 62, 3U Test Fixture
TF-3U-7B041-1
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Interconnect Adapters
Interconnect Adapters funnel wiring from modules to a VXI card. The adapter has removable side, top and bottom plates. Connector cover plates and cable clamps are ordered separately.VPC VXI adapters have been re-engineered to eliminate the need for punching holes in certain manufacturers cards. This design uses a clip that clamps down on the card's existing ejector tabs which firmly fastens the adapter to the card.
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Compact Functional Test System
E2230C / TS-5040
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Combinational Base Test Platform
6TL24
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid-volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Optical Receiver Stress Testers
Developing next-generation optical receiver technology requires world-class stress testing. Use Keysight's automated calibration solution and get optical stressed eye results in one-tenth the time compared to a manual setup.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Interconnect Products
Typical industrial applications for Oxley Interconnect products include high voltage power supplies, critical computer hard drives, fire safety control equipment, medical and pharmaceutical equipment, oil and gas control systems, power generation and distribution equipment, rail and telecommunications infrastructure. Within aerospace and military markets Oxley products are typically found in aircraft, military vehicles, ground base stations, surface ships and submarines and air and ground communications equipment.
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Optical Receiver Stress Test Solution
N4917B
The N4917B software provides an automated standard compliant stressed receiver sensitivity test according to 100GBASE-LR4, ER4 and SR4 test specification. In order to do this kind of test, several test instruments such as a bit error ratio tester, digital sampling oscilloscope, optical reference transmitter and tunable laser source are required to operate together to achieve a compliant, repeatable optical stressed eye. This stressed eye is then fed to the receiver under test, where bit error ratio is measured under the stress conditions as defined in the standard.
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System-Level Interconnect Solution For ScanExpress Boundary-Scan Tools
ScanExpress Merge
Combine Multiple Assembly Test Files Corelis ScanExpress Merge, a member of the ScanExpress suite of boundaryscan test tools, is a software application designed to import and join test files for multiple independent assemblies and assist in configuration of a combined test procedure.Using completed ScanExpress TPG test files and module interconnection data, ScanExpress Merge quickly combines combined test plan files for system testing with minimal user effort.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Environmental Stress Screening
ESS
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
