Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Burn-in System
Sonoma
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High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Polarity & Burn in Test Systems
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Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Environment And Burn-in Temperature Chambers
9000 Series
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Delta 9000 Series Temperature Chambers offer a wide choice of temperature ranges and capacities in addition to smart electronics. Field proven by satisfied customers for over four decades, Delta chambers are quality instruments that provide service longevity and integrity unique in their field. Over the years, Cohu has added advanced features to the proven basic chamber design and has refined system components and programming capability to deliver outstanding quality and value.
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Laser Diode Burn-In Testing
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Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Product
Electric Burn-in Board Carts
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Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
Burn-In Tester
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Universal test bench system. Provides basic electrical measurements at a low cost. Designed for a wide range of electronic products with a dedicated wiring harness. Allows you to expand the scope of functionality. Work in automatic or manual mode. Tailored to the needs of low- and high-volume production
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Burn-in and Stress Screening Chambers
KDR
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Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Product
Burn-in Board Continuity Tester
CT-1
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Burn-in Board Coninuity Tester. Verifies burn-in board continuity and component tolerances. 768 I/O channels, can be forced to the constant current source or grounded independently. Highly accurate measurement of resistance, voltage, and capacitance using a pair of precision instrumentation amplifiers.
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
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High power logic individual temperature control
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Sensirion SHT31-DIS-B Humidity and Temperature Sensor Breakout Board
SEN-37002-H
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Breakout board for the Sensirion SHT31-DIS-B. This sensor is an extremely accurate digital (I2C interface) temperature and humidity sensing device, with +/-0.2C temperature and +/-2% humidity accuracy typical. These specs far exceed the accuracy of ICs that came before it, including the HTU2x and SHT1x series, and improves upon the success of the SHT2x that came before it. In addition, the SHT31-DIS-B has a wide input voltage range of 2.4V-5.5V and includes temperature isolation and airflow cutouts as recommended for the optimal operation. Finally, in the case of environmental changes that could cause light condensation, the SHT31-DIS-B has a built-in heater to burn off any condensate.
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Product
Radiant-Heat Protective Performance Tester (RPP)
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Sataton Instruments Technology CO., Ltd
Radiant-heat protective performance tester which is normally called as RPP tester is to determine the radiant-heat protective performance of single or multi-layer textiles or other materials intended for heat protective clothes or assembly against radiant heat. The tester is a limited suitable tool for evaluating the potential of textiles for second degree skin burns.
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Product
Fully Filtered and Stabilized Battery Eliminators
Series TBC
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Kepco's TBC are designed as battery chargers, for float-equalize service to maintain battery arrays such as are found in many telecommunication installations. The TBC are fully filtered and stabilized battery eliminators that also find application as burn-in power supplies. Nine models are available.
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Corrosion Test
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The purpose of this test is to determine the resistance of materials and protective coatings to corrosive atmospheres when a more corrosive environment than the salt fog/spray test is required. The test is used when material is stored or operated in areas, for example, where acidic atmospheres exist, such as in industrial areas or near the exhausts of any fuel-burning device. Gases such as sulfur dioxide are used to replicate the exhausts of fuel burning devices.
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Burn-In Systems
OPTIMUM Series
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Advanced Microtechnology, Inc.
The OPTIMUM product line of burn-in systems has a model to meet your individual testing requirements. Please select one of the models below for more specific information
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Product
Analyze RTL
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ASICs and FPGA routinely have millions of gates with memories, transceivers, third party IP and processor cores. Problems can be time consuming and complex to debug in the lab and through simulations. Designers need verification tools that can identify problems quickly to reduce their verification and debug time before simulation, before synthesis, and definitely before burning chips in the lab.
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Product
Flame Burning Tester
DRK3024A
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Shandong Drick Instruments Co., Ltd.
It is used to detect high temperature resistance, combustibility and combustion performance of materials.
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Product
Thermal Protective Performance Tester (TPP)
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Sataton Instruments Technology CO., Ltd
Thermal protective performance tester (TPP) is to determine the heat transmission of protective clothing or textiles exposed to flame and radiant heat resources. The tester which can provide thermal protection index (TPI) calculated by software is the recommended tool for evaluation the potential of second degree burn of the materials to block convective and radiant heat penetration. Analysis software can display real-time temperature curve and automatically detect heat time curve to show Stoll curve for rating the thermal protective performance of tested textiles.
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Product
Analog Multimeters -VOM
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Triplett Test Equipment & Tools
Analog Multimeter is a multi-range instrument for electrical and electronic troubleshooting and measurement. It can stand up under rigorous hard usage of the industrial and maintenance environment. Using a unique design and selection of materials, it can withstand the normal accidents of dropping (up to 5 ft.) and rough handling which occur in hard day to day use. Engineered for significant reduction in the need for maintenance by virtual elimination of parts burn out (other than fuses), and parts damage from severe mechanical abuse.
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Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
