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Product
Mechanical Bench-top Test Jigs
CGF Series
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Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
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Product
Bench-top Test Jigs
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Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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Product
Precision Metal Clad Shunt Resistor
IRHF
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Precision Metal Clad Resistors designed in four- terminal technique, are distinguished by high load capacity as well as excellent accuracy. Isolated voltage and current connections making them suitable for very precise current measurements. Easy current measurement is performed by attaching to current bus directly and connecting to voltage (ampere) metal through flexible wires. The ULH models are UL approved versions. Units have a low inductance, heavy copper terminals. The main application is battery manufacturing test jig.
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Product
Engine Simulator
MS 1118
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Test Set-A calibration unit is a test jig is used to simulate parameters of Adour 804E and 811 engines of Jaguar aircrafts. It simulates current, voltage, speed, and turbine gas temperature. It performs NL Check, NH Check, TGT1 (Non T2 Compensated), TGT2 (T2 Compensated), Amp (Non T2 Compensated), Amp (T2 Compensated), Solenoid Volt, TGT Inject, NL Inject, and NL/TGT Redatum.
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Product
Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Product
Test Extension Boards
XJIO
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The XJIO boards are expansion units that enable you to improve the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections. They will integrate with your XJTAG test system to provide access to otherwise inaccessible areas of your circuit. With a range of digital and analogue I/O pins on the board, you can improve fault isolation, verify power rail levels, and dispense with costly custom test jigs - even for non-JTAG boards.
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Product
Printed Circuit Board Bending Test Jig
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Evaluation of Bending Strength of Electronic Components and Substrates
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Product
Ceramics Bending Test Jig
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These test jigs enable 3- and 4-point bending tests in accordance with various JIS, ISO and ASTM standards.
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Product
Customized Material Testing Machines
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Globally growing innovations result besides fulfillment of new testing standards in an ever increasing demand for customer-specific solutions regarding the testing technologies, jigs, measuring systems, software and the automation level of the testing machines.The core competencies of TIRA are customer-specific solutions.TIRA is able to realize individual customized solutions according to customer´s request and the simplest derivations like longer, wider, narrower, shorter material testing machines.
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Product
Automatic Dielectric Constant Tan Delta And Resistivity
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No Balancing and Calculation required to calculate Volume / Surface Resistivityand Dielectric Constant.Complies IEC 60250, IS 4487, Test jig Conform to ASTMD 257Built in Thermal PrinterSerial port RS232 for data downloading.Can be used to check liquid sample with Three Terminal oil cell.Storage 100 Test reports
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Product
MCB Thermal Verification Test Bench
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The test system is a special version of the thermal test test system in the sense that the test jig is primarily designed to hold and connect multi pole MCBs for thermal verification so that each pole can be verified to trip within the IEC time band after the MCB has been riveted. This test ensures the trip verification of MCB so as to trip all the 4 poles at once when overload is detected in one single pole. In short, this is a verification-only bench.
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Product
Compression Test Jig For Foam Rubber Specimens
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JIS-based compression testing of foam rubber used in seats can be performed. This machine comprises exclusive accessories added onto an Autograph precision universal testing machine.
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Product
ESI Test Jig
MS 1543
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This Test System designed to test the analog, discrete, Ethernet, RS232, RS422, Synchro /Resolver and SPI Signals. It is standalone test equipment and has GUI ATP Software interface with laptop/PC through RS232/Ethernet Interface.
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Product
Energy Saving System
ECO-Vibe neo
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ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.
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Product
Material Test Machines
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood Universal Test Machines, UTM, are widely use for different material testing, like semi-product & finished product made of rubber, plastic, metal, nylon, non-woven fabrics, textile, tape, polyfoam, waterproof materials, wire, cable, etc. With different test jigs or fixtures, the UTM can run the tensile, compression, shearing foce, adhesion, peeling force, tear strength, fatigue, etc test according to GB, CNS, ASTM, ISO, DIN, JIS, EN test standards.
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Product
SRJ (for IBP sensors)
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The MEDTEQ SRJ is a test jig to measuring the step response of IBP sensors, which can assist in testing compliance with IEC 60601-2-34 frequency response. It is also suitable for manufacturers or test labs wanting to access the raw pressure waveforms via an oscilloscope.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Component Test Systems
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These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
OLED Lifetime Test System
58131
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The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Test Platforms
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Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Benchtop Automated Functional Test
midUTS
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Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
