IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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Breakthrough compressors for the GDSII and MEBES formats
GDZip + MEZip
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Recognizing the challenge to transfer, manipulate, and store the exponentially-increasing size of IC design files, Solution-Soft has developed gdzip and mezip, breakthrough compressors for the GDSII and MEBES formats used by the industry. The MEBES format is the most commonly used format for electron beam lithography and photomask production. The GDSII stream is the standard exchange format between the design world and the mask shops.
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UDIMM DDR3L 1600
SQR-UD3N
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Micron Original memory IC, FIXED BOM. 3yrs longevity & lifetime warranty, Undergo strict test program. Support Smart Monitoring (SQR Manager)Select Product.
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GHz Elastomer Sockets
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Ironwood’s GHz BGA & QFN/MLF sockets are ideal for prototyping and testing almost any BGA or QFN device application. These ZIF sockets provide excellent signal integrity yet remain cost effective. Innovative elastomer interconnect technology that delivers low signal loss up to >40GHz and supports BGA or QFN/MLF pitches down to 0.3mm was utilized in these sockets. GHz BGA sockets are mechanically mounted over a target system’s BGA lands using mounting and alignment holes at proper locations (page 2 of the individual socket drawing shows recommended PCB layout information). These low-profile sockets are only 2.5 mm per side larger than actual IC packages (industry’s smallest footprint). They support IC devices with body sizes ranging from 55mm down to 1mm. Larger body sizes may require a backing plate. If the backside of the target PCB contains capacitors and resistors, a custom insulation plate with cavities cut for those components can be designed. This insulation plate sandwiches between the backing plate and target PCB.
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4 Digit Temperature Meter (5 Channels)
CM1-TX5
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RS-485 Modbus RTU protocol (with communication LED indicator)RS-485 address 1~255Communication Baudrate 9600, 19200, 38400, 57600, 115.2KParity check N81, N82, E81, O81Input 5 channels of signal selectable：thermocouple/PT100.5 channels of input can be set to play 1~10 seconds loop display.1~5 channels of display value limits can be set, and the number of channels of carousel display screens can be set by yourself.5 channels of input signals with LED unit cycle display.Standard 2 groups of alarms Hi, LO with communication LED indicators to ensure the normal operation of the field system.Suitable for HVAC refrigeration and air conditioning PLC, DDC, PC brands to achieve remote real-time monitoringCan be used in solar panels, medical control, clean room, ice water host, boiler, motor, chemical plant, power plant, school energy-saving control, remote control of power monitoring panel
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Isolation Amplifier Analog Output
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This coupler is an optically coupled isolation amplifier that uses an IC with a high-accuracy sigma-delta A/D converter and a GaAIAs light-emitting diode with high-speed response and high luminance efficiency on the input side, and an IC with a high-accuracy D/A converter on the output side. This coupler is designed specifically for high common mode transient immunity (CMTI) and high linearity (nonlinearity) applications, making it ideal for current sensing in motor drives.
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PMC to PCI Express Adapter w/ TSI384
6083
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The Technobox, Inc 6083 4-lane and 8638 1-lane carrier card allows use of a PMC in a PCI Express edge card slot. The product features an IDT TSI384 bridge IC used in transparent mode with a PCI express primary side and a PCI/PCI-X secondary side.
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K-type Thermocouple to Digital Converter
THERMO K click
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THERMO K click carries the MCP9600 IC from Microchip. Depending on the type of probe it uses the click can measure temperatures from −200 °C to +1372 °C.
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Microelectronics Test & Engineering Services
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EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Near Field Probes
MFA Family
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The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Kelvin Test Contactor
cCruiser
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cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.
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LOAD BOARD
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The semiconductor manufacturing process is divided into a front process (WAFER) and a post process (PACKAGE). The LOAD BOARD is an INTERFACE device for inspecting the function and performance of a package state IC, which is a post process, It is an INTERFACE key device for inspection. In particular, LOAD BOARD is widely used in non-memory semiconductor inspection equipment.
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CoreCommander
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While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
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Semiconductors
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Multiphysics Analysis Solutions for Chips and 3D IC Systems. Ansys cloud-native solutions provide unparalleled capacity to speed up completion times for even the largest finFET integrated circuits (IC) and 3D/2.5D multi-die systems. These powerful multiphysics analysis and verification tools reduce power consumption, improve performance and reliability, and lower project risk with foundry-certified golden signoff verification.
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JTAG 3rd Party Controller Support
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Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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Communications ICs
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Renesas' broad portfolio of communication ICs includes subscriber line interface circuits (SLICs), DSL line drivers, general purpose ringing SLICs, isolated PWM controllers, line card access switches, PABX short-loop SLICs, PLC line drivers, and serializer/deserializer (SerDes) ICs.
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Open/Short Tester for Reverse Engineering Applications
Panther 2K-CT
Tester
Qmax Test Technologies Pvt. Ltd.
Panther 2K-CT is a versatile open\Short tester designed especially for reverse engineering application of tracing circuits of undocumented PCBA’s.Its innovative measurement technology helps tracing PCB tracks between components in a given circuit board. It can accommodate various types of clips\grabbers and connectors to access the device pins to trace the connectivity. Its user friendly software guides the user to place and move cluster of IC clips and probes to learn the connectivity and to generate netlist.
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24-Pin SOWIC-to-22-Pin 0.400" CRT DIP Adaptor for 75ALS162 and Others
1111903
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24Pin SOWIC IC to 22Pin .4 CTR DIP Adapter for 75ALS162 and other IC?s. A cost effective means of upgrading to SOIC without changing your PCB layout.
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
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The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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40-Pin DIP-to-Socketable PLCC Adaptor
1111163
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40 Pin DIP to Socketable PLCC Adapter. Can be used with Intel 80/83C652 and 80C251 microprocessors and any IC that follows standard DIP to PLCC pinout conventions. Allows user to switch package styles and avoid shortage problems. Designed to plug directly into your 44 pin PLCC socket.
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SparkFun LED Driver Breakout
TLC5940 (16 Channel)
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The TLC5940 is a 16 channel PWM unit with 12-bit duty cycle control (0-4095), 6 bit current limit control (0-63), and a daisy chainable serial interface. This breakout board is a good way to take full advantage of this useful IC. All 16 PWM channels are broken out to standard 0.1" headers, which run alongside convenient voltage and ground rails. Also, because the TLC5940 can be daisy-chained, the breakout is designed to support that feature. On the left-hand side of the board all serial inputs are broken out to 0.1" headers and likewise with output on the right-hand side.
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Digital Integrated FET Regulators
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Renesas' digital power conversion and management ICs combine an integrated synchronous step-down DC/DC converter with key power management functions in a small package, resulting in a flexible and integrated solution.
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Boundry Scan Testers
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Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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IC Measurement Technology
Emission
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is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins.
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Power Management ICs
PMICs
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Renesas' power management ICs (PMICs) are integrated circuits that perform various functions related to power requirements of a host system. A PMIC may have a combination of the following functions: DC to DC conversion, battery charging, linear regulation, power sequencing and other miscellaneous system power functions.
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Full Range Active Thermal Control Handler
3110-FT
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Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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Wireless Data Logger
EVA100
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The new highly integrated measurement system "EVA100" is supporting Power Supplies, SMU( 4 quadrant DC Signal Measurement Units ), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed-signal / sensor / digital IC devices and Modules including Electronic Control Unit (ECU) for automotive evaluation and measurement.This new measurement system allows engineers quickly to build their own measurement environment without combining several standalone instruments.
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Wide Temperature Server DIMM
SQR-RD4M
Dual In-Line Memory Module (DIMM)
Original Hynix IC chip adopted, Wide operating temperature support -25~85oC, Data transfer rate up to 3200 MT/s.
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Passive Probe, 10:1, 1.5 GHz, 1.3 M
N2874A
Oscilloscope Probe
A compact 2.5-mm probe head diameter, low input capacitance, and fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Next Generation_UDIMM DDR5
SQR-UD5N
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Data Transfer Rate: 4800 MT/s, Capacity : 16GB/32GB. Original Micron/Samsung IC adopted, On-Die ECC function support.
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Test Socket Based Elastomeric Matrix Connectors
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Z-Axis offers a wide range of high performance test sockets, which are based on our elastomeric matrix connectors, for wide range of IC packages (BGA sockets, LGA sockets, etc.), coaxical, and wafer level; and for testing high speed, digital, analog, and RF signals etc.
