IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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Product
PLCC-to-DIP Adaptor
Series 352000/353000
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PLCC to DIP Adapter. Converts PLCC packaged ICs to DIP footprints. Available with PLCC sockets or PLCC pads on top side. Consult factory for panelized form or for mounting of consigned ICs.
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Product
Detection And Navigation System
Ice Navigator™
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sigma S6 Ice Navigator™ is a radar-based system that provides enhanced ice detection, tracking and analysis. The system can identify open water leads, ice bergs and ridges in ice fields. Ice Drift Analysis (IDA) is now an optional feature of Ice Navigator that gives operators unprecedented visibility and information on the movement of ice floes within X-band radar coverage. Capital expenditure and costs typically associated with activities in ice-threatened areas, can be dramatically offset.
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Product
Demonstration Boards
SAMPULSE50GHz and SAMPULSE70GHzANT
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The SAMPULSE50GHz and SAMPULSE70GHzANT are demonstration boards for Furaxa InP single channel sampler/pulser ICs. The SAMPULSE50GHz model contains a 2.4mm combined TDR input/output connector to the common sampler/pulser node in the IC. The SAMPULSE70GHzANT is similar, except that instead of a single-ended 2.4mm connector, the sampler IC's differential inputs are fed from a bowtie antenna. In both models, the IC's differential sampler output is converted, using an AD8009 op amp, into a single-ended ground-referenced output that is sent to an SMA jack labeled SAMPLER OUTPUT.
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Product
2-Axis High-Resolution Laser Axis Board for VME
10898D
Laser Board
The 10898D 2-axis high-resolution laser axis board provides the same resolution as the Keysight 10897D high-resolution laser axis board with increased slew rates and reduced noise. The increased stage velocity limits and low noise compared to previous laser systems offer premium positioning repeatability and accuracy for advanced applications such as IC fabrication equipment.
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Product
Compact Semiconductor ATE
QST286
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Product
ESD & Latch-Up Test Service
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MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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Product
Energy Metering ICs
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Analog Devices’ ADE energy measurement ICs address the challenges of next-generation smart meter architectures and are ideal for measuring active energy (kWh), apparent energy (kVA), reactive energy (kVAR), rms, and power quality with the highest accuracy in single phase and polyphase revenue meters, industrial instruments, and energy monitoring applications. ADI’s ADE energy measurement ICs combine analog-to-digital converters with fixed-function digital signal processors to perform critical measurements, while providing unparalleled functionality and ease of use.
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Product
SparkFun Opto-isolator Breakout
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This is a board designed for opto-isolation. This board is helpful for connecting digital systems (like a 5V microcontroller) to a high-voltage or noisy system. This board electrically isolates a controller from the high-power system by use of an opto-isolator IC. This IC has two LEDs and two photodiodes built-in. This allows the low-voltage side to control a high voltage side.
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Product
Portable Digital Ultrasonic Flaw Detector
MFD350B
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Your product description goes here.MFD350B Portable Digital Ultrasonic Flaw Detector is a economical and practical model improved on MFD500B. Except for the differences of its measuring range, working frequency and transmitted pulse parameter, the other performances are the same as MFD500B.Based on ultrasonic pulse reflection testing principle, MFD350B controls all testing process by the mini-processor. And it has low power design and can do charge with two models such as online chargeing and offline charging. And it can work continuously about 8 hours.With large capacity, digital multi-color TFT LCD, original imported stable IC, small size, light weight, stable performance and favorable price, MFD350B is one of our company’s high promoted super cost performance and economically ultrasonic flaw detector.
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Product
IC-3173, 2.20 GHz Intel Core i7 Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784965-01
Controller
The IC‑3173 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3173 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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Product
Universal Programmer Superpro 6100N
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Until now,Support 401 IC manufacturer, 103004 pcs devices and keeps growing.Features:Supports 87454 types of devices from 305 IC manufacturers (by 3/15/2013) and keeps growing.Supports EPROM、Paged EPROM、Parallel and Serial EEPROM、FPGA、PROM、FLASH(NOR & NAND)、BPROM、NVRAM、SPLD、CPLD、EPLD、Firmware HUB、Microcontroller、MCU；Supports devices with Vcc as low as 1.2V. Socket Adaptors available for DIP、SDIP、PLCC、JLCC、PGA、LGA、SOIC、SOJ、SOT、QFP、TQFP、PQFP、VQFP、MQFP、LQFP、TSOP、SOP、TSOPII、PSOP、SSOP、TSSOP、SON、EBGA、FBGA、FTBGA、VFBGA、μBGA、CSP、SCSP、QFN、HVQFN etc.High programming speed.Built with 144 universal pin-drivers. Universal adaptors are available for varies packages up to 144 pins. Quick new device support. Popular NAND FLASH Platform supported including Samsung (XSR1.0/1.6), QualComm, HYNIX（HIFFS）, MTK(Solution V1.1), ICERA (v1.0/2.0), ST （7162、7141等）, AMLOGIC(IF2/0), REALTEK, PICOCHIP, DataLight ( Flash FX Pro), Marvell(310/303/920/935…), BroadCom, ZTE, Intel (CE4100)，UBI, LEADCORE(L1809OG), MSATR etc. Customer-specific NAND solution available.PC hosted mode and stand-alone dual modes. Under PC hosted mode the programmer is controlled by a PC via USB2.0 (high speed) to program a chip. Under stand-alone mode the programmer is controlled via a 6-KEY keypad and a 20 character by 4 line LCD display. A CF card is used to store the project files.User can operate multiple units to construct a concurrent multiprogramming system thank for the stand-alone mode. IC manufacturer approved programming algorithms are used for high reliability.Testing functions for logic devices.Advanced and powerful software functions.Production mode starts chip operation at the moment the chip is inserted in the socket properly.Project function simplifies processes such as device selection, file loading, device configuration setting, program option, and batch file setting into one touch step.Password can be set for project files and production volume controlBatch command combines device operations like program, verify, security into a single command at any sequence.Dynamic buffer makes it possible that each chip is programmed with different data file. Applications including serial number, MAC address etc.Log file is useful for quality tracking.Many safety mechanisms are built including self-diagnosis, wrong chip placement detection, poor-pin-contacting detection, ID checking, over-current and over-voltage protection etc.Windows XP/Vista/Win7/ Win8/Win10 compatibility.
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Product
Amplifiers & Buffers
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Renesas amplifiers are among the industry's highest-performance, highest-value amplifier ICs on the market. Our broad operational amplifier (op amp) portfolio provides for a wide range of next-gen precision instrumentation, medical, communication and industrial process control applications where innovation, reliability and dependability is central to the analog designs.
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
IC Tester
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The Peritec adopted the NI products, to build in 1/10 the cost of the commercial product functions of the IC tester. It offers original brand as "ECOIC".IC tester on the market, yet very expensive that several tens of million, part of its function could only really used. Therefore, it possible to continue to build the only really necessary function in Peritec, we have created a mechanism to be completed at a lower cost and development, high-performance, short-term.
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Product
ESD & Latch-Up Test System
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Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Product
Near Field Probes 1GHz - 10 GHz
SX set
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The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Product
IC Test Clips
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Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Product
Transceivers
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ST offers monolithic ICs containing standard ISO 9141 compatible interface functions and bidirectional transceivers for signal conditioning that operate with a CAN controller and meet ISO/DIS 11898 up to 1 Mbaud.
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Product
AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
ICT Tester
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Adapter design, assembly and validation for Agilent, Keysight, HP, Checksum, Spea. Preparing and debugging ICT scripts. ISP Programming Integration. Integration of edge scan testing, Jest testing, digital testing, semi-functional testing, IC programming, FINN probes, and more
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Product
MAX31855 T-Type Thermocouple Sensor Breakout
SEN-30001-T
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Breakout board for the MAX31855T digital thermocouple interface IC. Measured temperature range is -270C-400C with known thermal characteristics and output resolution of 0.25C. This sensor supports a larger operating range (specifically in the negative range) than its predecessors, the MAX6674 and MAX6675, though it is not pin-pin compatible. This board is interfaced with a 0.1" 1x5 pin header, has a vertical mini thermocouple connector and four mounting holes for standoffs and 4-40 screws.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Environmental Testing
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D.L.S. Electronic Systems, Inc
D.L.S. Conformity Assessment provides testing services for environmental tests under its accredited ANAB/ACLASS ISO 17025 program. This globally accepted accreditation covers environmental and mechanical testing that include vibration and shock, temperature extremes , sand and dust, fluid and chemical resistance, altitude, humidity, salt spray, ingress protection, icing, flammability and other related testing services.
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Product
Wideband Transceiver IC
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Analog Devices wideband transceiver ICs offer a complete, high performance RF and mixed-signal system on a chip. ADI’s ISM transceivers for short range wireless systems and wideband transceivers for wireless applications such as UMTS, LTE, and 3G/4G are highly integrated and deliver best-in-class performance and significant BOM savings.
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Product
Thermocouple Interface Amplifiers
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Analog Devices offers specialized precision thermocouple interface amplifiers that provide a simple and effective solution for measuring thermocouple temperatures. With features such as integrated cold junction compensation and a high gain precision instrumentation amplifier, these thermocouple amplifiers provide a complete signal conditioning system in one IC package. ADI’s thermocouple amplifiers are suitable for use in diverse environments to measure a wide range of temperatures. These products will save you in cost, space, and unnecessary circuit design across a broad range of applications and industries.
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Product
Module Sockets
Ardent Optical Engine
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The scalability of SP connector technology is enabling the next generation of optical device IC manufactures to allow for solder-less high speed optical Electrical Module replace-ability. These connectors offer high speed input data rates in cost effective and real-estate friendly form factors.
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Product
Socket with Collet Contacts
Correct-A-Chip
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Correct-A-Chip with Collet Contacts. Correct-A-Chip technology solves problems associated with the use of alternate ICs (due to availability, obsolescence, need for better performance, etc.) by eliminating the need for new PCBs.
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Product
Ice Profiler
IPS
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Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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Product
FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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Product
Passive Probe, 10:1, 350 MHz, 1.3 M
N2872A
Oscilloscope Probe
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
